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What's New in WaferPro Express 2019 Update 1.0
Overview of what's new in WaferPro Express 2019 Update 1.0.

Materiais de treinamento 2019-06-18

PDF PDF 2.22 MB
Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

eSeminar - Ao vivo

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

Materiais de treinamento 2019-04-06

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Materiais de seminário 2017-08-14

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Materiais de seminário 2016-12-21

PDF PDF 2.35 MB
WaferPro Express 2016.04 Key Features and What's New
Overview of what's new in WaferPro Express 2016.04.

Materiais de treinamento 2016-07-12

PDF PDF 1.79 MB
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

eSeminar - Gravado

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

eSeminar - Gravado

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

eSeminar - Gravado

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

eSeminar - Gravado

Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Materiais de seminário 2013-10-22

MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Materiais de seminário 2013-10-22

PDF PDF 1.48 MB
Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Materiais de seminário 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Materiais de seminário 2011-06-22

PDF PDF 3.07 MB
Automating On-Wafer Measurements with the New Agilent IC-CAP WaferPro
Webcast slides describing on-wafer semiconductor device measurement challenges and WaferPro

Materiais de seminário 2011-01-27

PDF PDF 1.05 MB
Agilent Wireless Test & Design World 2009 in Seoul, Korea
Agilent EEsof EDA related materials presented at the Agilent Wireless Test & Design World 2009

Materiais de seminário 2009-07-01