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Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2019-06-04

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2019-04-04

Power Handling Capability of Electromechanical Switches
This application note discusses the power handling of the hot switching and cold switching of EM switches.

Application Note 2019-02-13

Probe soldering guidelines for Keysight InfiniiMax probes - Application Note
There are various ways to connect test instrumentation probes to devices under test(DUTs). One such method is soldering, which provides a reliable connection and minimizes parasitic probing effects by keeping wire lengths and connections as short as possible. Many of Keysight's high performance oscilloscopes probes utilize soldered connections.

Application Note 2018-10-07

Bandwidth Boosting Techniques for the Infiniimax Probe Amp and Probe Head - Application Note
Keysight InfiniiMax differential probes are DSP corrected to have a flat magnitude and phase response to provide the highest possible accuracy. The bandwidth chosen to correct to is typically around 3dB non-corrected bandwidth. Usually, extending the bandwidth much beyond that point will increase the noise floor, and if pushed even further, can cause unrealistic noise artifacts. However, the N5381A/B solder-in probe head in combination with the InfiniiMax 1169A/B probe amp is an excellent candidate for extending the bandwidth beyond the 3dB point because the N5381A/B is peaked past the normal 12 GHz bandwidth, and the peaking of the probe head can help compensate for the roll-off of the probe amp bandwidth.

Application Note 2018-06-21

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2018-02-22

Demystifying RCRC and RC probes - Application Note
An ideal probe would provide an exact replica of a signal being probed. However, the probe becomes a part of the circuit under test, because the probe introduces probe loading to the circuit.

Application Note 2017-12-01

InfiniiMax Probes Impact on Lead-Free (ROHS) Compliance - Application Note
Some Keysight InfiniiMax oscilloscope probe heads are intended for soldering to the device under test.

Application Note 2017-12-01

8 Hints for Better Scope Probings - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2017-11-23

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Application Note 2016-06-03

How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors- Application Note
Integrating USB Type-C into products, while ensuring interoperability and compliance, is challenging. This measurement brief covers USB Type-C cable and connector design and test solutions.

Application Note 2016-02-29

Multiport and Multi-site Test Optimization Techniques - Application Note
This app note gives an overview of multiport and multi-site test capabilities, how different multiport test solutions compare, and what should be considered when configuring a multi-site test station.

Application Note 2015-07-14

Solid State Switches - Application Note
This application note describes basic switch technology and the different types of Keysight switches. It summarizes the typical performance data of solid-state versus electro-mechanical switches – the two mainstream switch technologies in use today. A basic solid state switch overview which illustrates the theory of operation will give you the in-depth information you need to select the right switch technology for your application.

Application Note 2015-03-17

Understanding and Using Offset in InfiniiMax Active Probes - Application Note
This application note explains how offset is applied in the Keysight InfiniiMax Active Probes and how to use offset for various applications

Application Note 2014-07-31

Time Domain Analysis With a Network Analyzer Application Note (AN 1287-12)
This document focuses on time domain analysis (displays) generated from vector network analyzers (VNA). The intent is to provide engineers with frequency domain background, an in-depth view of how a time domain display is created from frequency domain data (S-parameters) and how to apply the time domain display to common problems in RF systems.

Application Note 2012-05-02

How Offset, Dynamic Range and Compression Affect Measurements - Application Note
This application note will clearly present how signal offset and oscilloscope/probe offset interact with regards to the dynamic range of the probe amps.

Application Note 2011-11-02

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

Application Note 2010-12-20

PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Application Note 2009-11-24

High frequency probing solutions for time and frequency domain
This application note discusses high-frequency probing using U1818A/B active differential probes with a network, spectrum, and signal source analyzer.

Application Note 2009-09-23

Extending the Range of Keysight InfiniiMax Probes
This application note describes how to extend the operating range of Keysight InfiniiMax probes in voltage, temperature, and distance (reach between probe amplifiers and heads

Application Note 2009-06-26

Comprehensive Multiport Solution for the ENA Network Analyzer
This application note discusses the benefits of using a comprehensive multiport solution such as the E5071C ENA network analyzer with the E5092A configurable multiport test set.

Application Note 2008-10-29

Measurement Wizard Assistant software for ENA
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

Application Note 2008-09-30

Oscilloscope probing for high-speed signals
The probe is the dominant factor in determining the noise floor and response of your measurement system. Probe loading effects on the circuit under test are also a critical consideration.

Application Note 2008-09-03

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