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451-475 of 914

X-parameters: Commercial implementations of the latest technology enable mainstream applications
This blog article from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

Article 2011-01-06

Find hints and tips, industry trends, and new product announcements pertaining to the top five most commonly used test and measurement instruments.

Article 2010-12-16

Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

Article 2010-12-10

Limited Access Tools Improve Test Coverage - Article Reprint
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

A New Equilibrium - Article Reprint
The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

Article 2010-10-20

The Proposed IEEE Test Standards - Article Reprint
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

AMI models: What, why and how?
EE Times Design Article written by Sanjeev Gupta, Jose Luis Pino and Amolak Badesha of Agilent EEsof EDA.

Article 2010-10-18

8PSK Modulation Accuracy Measurement Graphics

Feature Story 2010-10-12

Defining a New Methodology for Radar System Design
Article from Microwave Product Digest, October 2010, discussing the use of analysis suites for the design of advanced digital signal processing techniques.

Feature Story 2010-10-01

Agilent Announces University Grants

Newsletter 2010-09-27

Caution: MIMO Test Challenges Ahead
Article published by Wireless Design & Development on MIMO testing challenges and methods to achieve higher data rates such as two0 and four-channel MIMO.

Article 2010-09-20

Education Program Newsletter - Vol 1. March 2008
Education Program Newsletter - Vol 1. March 2008

Newsletter 2010-09-19

Access Secured Information on our Customer Website
In this issue, we would like to start by providing information for you to access the reserved resources we have on the Agilent Customer website, which is accessible only to our support agreement customers.

Newsletter 2010-09-19

What every engineer needs to know about MIMO operation and measurement
Utilizing MIMO to its fullest potential requires the engineer to have basic knowledge of its operation and measurement. This EP&T article by Agilent boils this knowledge down into 9 fundamental facts.

Article 2010-09-15

Network System DesignLine
Network System DesignLine has published an article in 2 parts in their How-to section of Enterprise Networking: Extend SAN over WDM, SONET/SDH, or IP

Article 2010-09-08

Article in Wireless Design & Development talks about how SIGINT systems adapt to changing threats
Basic performance characteristics needed to detect and collect the most difficult RF signals in the environment.

Article 2010-08-31

Real-World Battery Drain Analysis
Go beyond Talk Time Test! Test the battery life of your data device using realistic user scenarios to ensure real-world operation meets user expectations with the 8960, 14565B and IFT software.

Feature Story 2010-08-30

The MIMO Antenna: Unseen, Unloved, Untested!
Microwave Journal (August 2010) article (.pdf) written by Agilent’s Moray Rumney. With the shift of MIMO from theory to real world this article focuses on performance testing in real world conditions.

Article 2010-08-20

Measuring MIMO In LTE Tx And Rx Tests
Find the right combination of LTE test instruments and techniques to evaluate the performance of Long Term Evolution (LTE) components and systems under real-world conditions. A link to the MWJ article by Agilent.

Article 2010-08-18

Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

Solving the RFIC Design for Yield and Verification Dilemma
Microave Journal article on the role and evolution of simulation-based performance verification and yield for today’s highly integrated RFICs for digital wireless communications.

Journal 2010-07-15

Education News
Learn how Agilent works with Universities and Academia around the world.

Article 2010-07-08

Flash Programming - Keysight Utility Card versus Deep Serial Memory Case Study
This case study compares flash programming performances of the Keysight Medalist i3070 Series 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne ICT solution.

Case Study 2010-07-07


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