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Enhancing Manufacturing Agility to Keep Pace with Accelerating Change - Case Study
Demand for advanced automotive systems is driving change in electronic design and requires agility in manufacturing. Keysight helped a major PCBA manufacturer get ready for their automotive future.

案例研究 2019-09-20

PDF PDF 3.27 MB
Keysight Translator for QDART Test
Keysight Translator software for QDART

專文 2019-09-03

Powering E-Bikes and Battery Energy Storage Systems with Cell-Formation Solution - Case Study
E-Mobility manufacturer saves time and money with new cell formation solution to meet growing orders and stricter test criteria.

案例研究 2019-08-15

PDF PDF 2.89 MB
Automaker Gets a 360 View of Radar Design and Test Validation with 50% Less Manpower - Case Study
A car maker saved 50% manpower by automating their tracking and fine-tuning systems for autonomous driving radio frequency (RF) tests with the Keysight PathWave laboratory management software.

案例研究 2019-06-19

PDF PDF 2.22 MB
Global EMS Manufacturer Reduces Time to Market Using PathWave Manufacturing Analytics - Case Study
The real time automated result analysis and anomaly detection in Keysight’s PathWave Manufacturing Analytics reduce engineering time and effort significantly, empowering the EMS company to release the product into the market sooner.

案例研究 2019-06-04

PDF PDF 2.09 MB
Quadruples throughput with i3070 4-Module In-Circuit Inline in Automotive Electronics Manufacturing
An Automotive Electronics Manufacturing increases the test throughput more than 50% by using i3070 4-Module Inline In-Circuit System with Dual Board Staging and Throughput Multiplier feature.

案例研究 2019-05-22

PDF PDF 4.96 MB
汽車製造商可減少 50% 的人力,並以 360º 的視野,有效率地完成雷達設計與測試驗證
汽車製造商對使用自動化 PathWave 實驗室管理軟體所省下的資源和成本,感到十分驚訝。部署全新的自動化互連工作流程後,該公司節省了 50% 的人力。

案例研究 2019-04-20

PDF PDF 2.44 MB
Successful Deployment of eCall Live Crash Test - Case Study
Car maker successfully emulates over-the-air environments in live crash test for their emergency call in-vehicle systems, with the eCall/ERA-GLONASS conformance test solution from Keysight.

案例研究 2018-12-13

PDF PDF 5.10 MB
Coherent Optical Component Test Enables 1.2 Terabit Applications - Case Study
Using Keysight’s state-of-the-art test equipment, NeoPhotonics successfully validated the performance of its 64 GBaud components, including its new 400ZR COSA, almost one year before the availability of DSP silicon for the transceivers. Without Keysight equipment, NeoPhotonics had no way of testing and assessing the performance of their components.

案例研究 2018-12-11

PDF PDF 2.06 MB
Electronics OEM Taps Keysight Automotive Radar Solution to Support Autonomous Driving R&D
Electronics manufacturer jumpstarts automotive radar application design and test efforts with Keysight solution, saving test development time and improving initial test coverage by over 50 percent.

案例研究 2018-11-26

PDF PDF 2.97 MB
Putting the Future in Motion with Automotive Ethernet
Continental adopts Keysight's automotive Ethernet test solution for 100BASE-T1, 1000BASE-T1, DDR memory, and USB connectivity compliance testing.

案例研究 2018-11-16

PDF PDF 3.30 MB
直流對直流轉換器測試 - 案例研究
汽車直流對直流轉換器製造商大幅縮短 95% 的測試時間。

案例研究 2018-09-25

PDF PDF 37.92 MB
A Pilot Program in Internet-of-things with University and Industry Collaboration
University of New Haven in collaboration with Keysight Technologies have embarked on offering a sequence of two IoT courses to teach the concepts and functionalities of the IoT technologies.

專文 2018-09-04

PDF PDF 2.10 MB
Completing Li-Ion Cell Self-Discharge Testing in Just Two Hour - Case Study
Leading Lithium-Ion cell manufacturer dramatically reduces overall battery test time and improves product quality assurance with innovative self-discharge tests from design to manufacturing.

案例研究 2018-07-04

PDF PDF 3.61 MB
Head-to-Head Comparison - Vectorless Test: NanoVTEP vs VTEP - Case Study
This case study summarizes some of the results of early tests conducted at customer sites, and includes results of controlled tests conducted in Keysight’s R&D lab.

案例研究 2018-06-05

PDF PDF 3.39 MB
Vectorless Test EP (VTEP) Goes Head-to-Head with Keysight TestJet - Case Study
VTEP has proven its abilities to improve in-circuit test coverage by over 80 percent compared to the older TestJet technology, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

案例研究 2017-12-01

PDF PDF 1.64 MB
Mini ICT with VTEP Accurately Detects Solder Failure on SMT Connector - Case Study
Find out how one customer reported reduction in bone pile and significant savings on scrap cost after using the Mini ICT systems with VTEP

案例研究 2017-07-24

PDF PDF 779 KB
i3070 Inline ICT Improves Functional Test Yield of SSDs - Case Study
Find out how one customer reported first pass yield results of more than 95% with less than 0.5% false failures, after installing the i3070 Series 5 Inline ICT systems.

案例研究 2017-07-10

PDF PDF 610 KB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

專文 2017-05-08

PDF PDF 624 KB
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

專文 2017-04-01

PDF PDF 860 KB
HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

專文 2016-12-05

Accurate Spectrum Analysis Up to THz with Your Vector Network Analyzer - White Paper
This white paper will focus on the addition of the new PNA spectrum analyzer capability into the MMW and sub-MMW VNA solution including the technology that made it possible and how it is accomplished.

專文 2016-07-26

PDF PDF 4.12 MB
Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

專文 2016-03-03

Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

專文 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

專文 2016-02-16

PDF PDF 190 KB

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