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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...

Application Note 2008-11-20

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

Application Note 2008-11-20

Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

Large-Signal LDMOS Model Simulation Using Keysight Genesys
This application note guides the user through simulation of DC IV, S-parameters and swept power data of an LDMOS transistor (NEC NE5511279A) using Keysight Genesys software.

Application Note 2008-08-21

Data Mining 12-Port S-Parameters

Application Note 2008-08-11

PDF PDF 830 KB
New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

PDF PDF 801 KB
10 Hints for Getting the Most from your Frequency Counter
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.

Application Note 2008-04-18

Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

Application Note 2008-04-10

PDF PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Application Note 2008-04-03

PDF PDF 119 KB
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)

Application Note 2007-11-28

External waveguide mixing and millimeter wave measurements with PSA Spectrum Analyzers (AN 1485)

Application Note 2007-10-25

Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver

Application Note 2007-08-15

PDF PDF 1.58 MB
Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Application Note 2007-05-09

PDF PDF 769 KB
Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

Application Note 2006-11-29

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

Application Note 2006-06-26

Polyharmonic Distortion Modeling - Article Reprint

Application Note 2006-06-01

PDF PDF 2.67 MB
4 Steps for Making Better Power Measurements (AN 64-4D) - Application Note
Before selecting a power meter and associated sensors, make sure that you have taken the 4 steps detailed in this note, which influence the accuracy, economy and technical match to your application.

Application Note 2006-04-26

Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis

Application Note 2006-04-05

Introduction to the Fixture Simulator Function of the ENA Series RF Network Analyzers
This product note describes what the fixture simulator of the ENA Series is, and how it helps customers in various network measurement applications. The fixture simulator function includes de-embedding, embedding, and balanced measurements.

Application Note 2006-03-13

Calibrating Standards for In-Fixture Device Characterization

Application Note 2005-06-17

PDF PDF 237 KB
8 Hints for Making and Interpreting EVM Measurements Application Note
This document provides tips on error vector magnitude (EVM) measurements. EVM provides insight into the performance of digital communications transmitters and receivers. EVM can pinpoint signal degradations.

Application Note 2005-05-20

PDF PDF 391 KB
ESA-E Series Spectrum Analyzer Performance Guide Using 89600 VSA Software
This application note characterizes the performance of the ESA-E series spectrum analyzers and the 89600 vector signal analysis software.

Application Note 2005-05-09

Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems

Application Note 2005-04-05

PDF PDF 1.37 MB

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