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Surviving State Disruptions Caused by Test: the "Lobotomy Problem”
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

Учебные материалы 2010-12-21

Keysight Technologist, Moray Rumney, wins LTE award
The Informa LTE North America 2010 award

Учебные материалы 2010-11-18

Automated Test / Board Test User Groups

Учебные материалы 2010-09-19

Digital Webcast Series - Master the high-speed digital test challenge

Учебные материалы 2010-08-27

Metrology of Advanced Optical Modulation Formats for 40/100G and Beyond

Учебные материалы 2010-06-30

QT QT
EMPro Getting Started Video Tutorials
This comprehensive set of EMPro Video Tutorials will enable you to start applying EMPro quickly (Knowledge Center login required).

Учебные материалы 2010-06-14

ADS 2009 Update 1 Momentum e-Learning
The ADS 2009 Update 1 Momentum Quick Start course contains the information you need to get started applying Momentum (requires a Knowledge Center login).

Учебные материалы 2010-06-04

Keysight Assurance Customer Education and Services
Keysight Assurance Customer Education tailors training to your needs. Our training courses are designed to make your system operators and administrators effective immediately—and then keep their skills sharp and up-to-date—building expertise over time.

Учебные материалы 2010-03-11

Boundary Scan Online Training
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!

Учебные материалы 2010-01-28

View the recorded webcast -Quality Rating of Optical Signals Using the Optical Constellation Diagram

Учебные материалы 2009-12-07

How to test DisplayPort sink devices – Register here to view the recorded session.
How to test DisplayPort sink devices – Register here to view the recorded session.

Учебные материалы 2009-11-22

JEDEC

Учебные материалы 2009-05-22

Serial ATA (SATA) Revision 3.0 PHY Testing Challenges: Verify your 6Gbps design to the spec [5122]

Учебные материалы 2009-05-13

Debugging and Characterization of Embedded PCI Express® Applications

Учебные материалы 2009-04-16

Ensuring Interoperability And Performance Of Your DDR Memory Subsystem

Учебные материалы 2009-04-07

Johns Hopkins University MMIC Design - Course #EE787
MMIC Design graduate Electrical Engineering course taught by Craig Moore and John Penn.

Учебные материалы 2009-01-22

Solving High-Speed DDR SI and Probing Challenges

Учебные материалы 2009-01-13

MMIC - Design of Experiments (DOE) Tutorial
A practical example that walks you through the basic ideas behind DOE.

Учебные материалы 2009-01-13

PDF PDF 325 KB
ADS Invitation English Version

Учебные материалы 2009-01-13

DOC DOC 281 KB
Tips to Debugging DDR 1, 2 and 3 Physical and Protocol Layer Issues webcast

Учебные материалы 2009-01-06

Capture an image from an instrument's screen and transfer it to a PC
Instruments that use a screen for displaying results often include a method for transferring the image to a printer or plotter. A print or plot button is included on the front panel of many oscilloscopes, spectrum analyzers and network analyzers...

Учебные материалы 2008-11-25

Solve Ultra-fast Measurement Challenges with Keysight's New WGFMU Module-20081001 0102
Solve Ultra-fast Measurement Challenges with Keysight's New WGFMU Module-20081001 0102

Учебные материалы 2008-10-16

Recorded presentation on the new WGFMU module and its applications
Recorded presentation on the new WGFMU module and its applications

Учебные материалы 2008-10-15

WMF WMF 82.67 MB
Automated Test / Board Test User Groups

Учебные материалы 2008-10-10

Save design time using Keysight 332X0 Function Generator with Keysight VEE

Учебные материалы 2008-09-08

PDF PDF 244 KB

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