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Automated Test / Board Test User Groups

Training Materials 2008-10-10

Save design time using Agilent 332X0 Function Generator with Agilent VEE

Training Materials 2008-09-08

PDF PDF 244 KB
Advances in Millimeter Wave Measurements

Training Materials 2008-09-01

PPS PPS 4.03 MB
Agilent VEE Tips #2 : Improve measurement time using Agilent P-series power meters with Agilent VEE

Training Materials 2008-08-27

PDF PDF 99 KB
Agilent VEE Challenge 2008 Rules and Regulations

Training Materials 2008-08-01

PDF PDF 47 KB
Discover the powerful performance of MXA Spectrum Analyzer with Agilent VEE sample program

Training Materials 2008-08-01

PDF PDF 75 KB
Making High Speed Measurements Through Triggering

Training Materials 2008-06-04

Automated Test / Board Test User Groups

Training Materials 2008-05-14

N5183A MXG Microwave Signal Generator Support and Troubleshooting Training (downloadable)
Downloadable support and troubleshooting training.

Training Materials 2008-04-30

ZIP ZIP 18.06 MB
Automated Stimulus & Current Drain Analysis for Validating/Optimizing Mobile Device Run Time
customer viewable presentation

Training Materials 2008-04-15

PDF PDF 773 KB
New noise technology and its applications
New noise technology and its applications – Life webcast on April, 17. Register now.

Training Materials 2008-04-08

How to Solve DDR Signal Integrity Validation Challenges
How to Solve DDR Signal Integrity Validation Challenges

Training Materials 2008-02-13

Six hints for better scope probing
Proper probing is critical to making quality oscilloscope measurements. Selecting the correct probe for your application and using the probe correctly means the difference between accurate representation of your signal and distorted or misleading results.

Training Materials 2007-12-12

Automated Test / Board Test User Groups

Training Materials 2007-12-10

Agilent Medalist Bead Probe Technology Webcast (recorded)

Training Materials 2007-01-24

Presentation on Trends in Signal Integrity Tests
A joint Presentation presented by Michael Reser and Rainer Plitschka (Agilent Technologies) on parametric tests for high-speed serial technologies focusing on latest trends in Signal Integrity tests.

Training Materials 2006-09-01

PDF PDF 2.13 MB
PNA - Millimeter-Wave Connector Care
Provides information on connector structure, how to avoid mating incompatible connector types, and making good connections. Also discusses inspecting, cleaning, and gauging millimeter-wave connectors.

Training Materials 2005-09-30

FILE FILE 428 Bytes
Making high speed measurements when downloading waveforms
Waveforms are often used in test programs to simulate a sensor input to a device under test. Creating unique waveforms for an application can be done quickly through a number of sources including the 34980A’s DAC module. ..

Training Materials 2005-09-12

Adjusting NPLC and Aperture to make high speed measurements
To a great extent, a multimeter's reading speed is determined by the amount of time needed by the A/D converter.

Training Materials 2005-07-25

Understanding the Autozero Function
This tutorial applies to the 34401A, 34970A, and 34980A products.

Training Materials 2005-06-21

BMP Windows bitmap
Some of the more recent instruments let you retrieve the screen image as a bitmap. This makes getting the image into a PictureBox reasonably simple...

Training Materials 2005-03-29

Polling for SRQ
If you do not have an Agilent GPIB card, you can still use the SCPI Status System. Instead of an SRQ Event, you periodically poll for the instrument status.

Training Materials 2005-02-28

Using SRQ Events
When controlling instruments via GPIB an SRQ interrupt can be configured. So, the instrument can signal the program when it needs to be serviced.

Training Materials 2005-02-28

Using *OPC?
Adding a *OPC? to your program wil ensure the instrument has executed all the commands that have been sent.

Training Materials 2005-02-28

Advances in Pulsed-RF S-Parameter Measurements

Training Materials 2005-02-27

PDF PDF 2 MB

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