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Addressing FEC Challenges on Your 400G Device
Forward error correction (FEC) is a necessity in the 400G world but introduces new test challenges. In this webcast, you will discover tools for debugging and solving your FEC test challenges.

Webcast 2019-03-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Addressing FEC Challenges on Your 400G Device
Forward error correction (FEC) is a necessity in the 400G world but introduces new test challenges. In this webcast, you will discover tools for debugging and solving your FEC test challenges.

Webcast 2019-03-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
9 Best Practices for Optimizing Your Signal Generator
Watch “9 Best Practices for Optimizing Your Signal Generator” to learn how to make accurate and consistent measurements to optimize your signal generator’s performance for a variety of test applications.

Webcast 2019-03-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013074&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013074&CC=US&LC=ENG
Addressing Interoperable Coherent Transceiver Test Challenges
As coherent optical data transmission expands from low-volume niche applications to high-volume applications, this webinar explores interoperability as part of the solution.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Addressing Interoperable Coherent Transceiver Test Challenges
As coherent optical data transmission expands from low-volume niche applications to high-volume applications, this webinar explores interoperability as part of the solution.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Optimize Signal Integrity on Hyperscale Network Interconnects
Learn more about tools and methods to manage challenging signal integrity issues such as crosstalk, mode conversion, eye closure, insertion loss, and multiple reflections inside the copper channel.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Power Converter Test Challenges in HEV/EV
Learn about interoperability as part of the solution as coherent optical data transmission expands from low-volume niche applications to high-volume applications.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG
Optimize Signal Integrity on Hyperscale Network Interconnects
Learn more about tools and methods to manage challenging signal integrity issues such as crosstalk, mode conversion, eye closure, insertion loss, and multiple reflections inside the copper channel.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Test Challenges of DSRC and DSRC CoC Certification Test Solution for V2X Era
Review measurement requirements and test challenges to comply with Dedicated Short-Range Communications of V2X technology and the latest updates in DSRC certification test.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG
Capture Elusive Glitches
Learn what it takes to capture and analyze elusive glitches as well as measurement techniques to help ensure a successful design.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013076&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013076&CC=US&LC=ENG
Understanding X-Parameters
This three-day, hands-on course presents the fundamentals of X-parameters, their application for non-linear amplifiers and advantanges over other behavioral modeling techniques.

Classroom Training

Power Converter Test Challenges in HEV/EV
Learn about interoperability as part of the solution as coherent optical data transmission expands from low-volume niche applications to high-volume applications.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG
Capture Elusive Glitches
Learn what it takes to capture and analyze elusive glitches as well as measurement techniques to help ensure a successful design.

Webcast 2019-03-01

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013076&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013076&CC=US&LC=ENG
Designing an Award-Winning mmWave RFIC- Experiences and Insights
Learn from, Erik Ojefors, one of the designers of a transceiver for 802.11ad-based fixed wireless access and backhaul.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013072&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013072&CC=US&LC=ENG
Designing for DDR4 and Beyond
During this webinar learn how best to approach a practical design and analysis workflow for DDR4 and DDR5.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
The Road to the Autonomous Vehicle — Automotive Ethernet Testing
Learn about high-speed digital characterization, challenges of implementing and testing the automotive Ethernet, and solutions for testing Tx link segment, Rx, and higher layer protocol functions.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG
Designing an Award-Winning mmWave RFIC- Experiences and Insights
Learn from, Erik Ojefors, one of the designers of a transceiver for 802.11ad-based fixed wireless access and backhaul.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013072&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013072&CC=US&LC=ENG
DDR 5.0 — Understanding the Test Ramifications of DDR5
Learn about new features in DDR5 versus DDR4 and find out why DDR5 is required to support cutting-edge technologies such as 5G.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Designing for DDR4 and Beyond
During this webinar learn how best to approach a practical design and analysis workflow for DDR4 and DDR5.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Gen5 Revolution of High-Speed Digital Bus Standards
Learn the latest updates in the high-speed digital world, and the implications that you can expect in your testing environment.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Optimize Your Product’s Battery Management System through Temperature Profiling
Attend this webinar to learn smart choices to optimize battery performance, increase reliability, and avoid safety issues.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3015789&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3015789&CC=US&LC=ENG
Gen5 Revolution of High-Speed Digital Bus Standards
Learn the latest updates in the high-speed digital world, and the implications that you can expect in your testing environment.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
The Road to the Autonomous Vehicle — Automotive Ethernet Testing
Learn about high-speed digital characterization, challenges of implementing and testing the automotive Ethernet, and solutions for testing Tx link segment, Rx, and higher layer protocol functions.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013092&CC=US&LC=ENG
DDR 5.0 — Understanding the Test Ramifications of DDR5
Learn about new features in DDR5 versus DDR4 and find out why DDR5 is required to support cutting-edge technologies such as 5G.

Webcast 2019-02-28

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
ADS Fundamentals
This medium-paced, 3-day course provides detailed training for the application of Advanced Design System for Circuit and System Simulation, including some EM and Layout. Each day can also be taken separately.

Classroom Training

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