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创造测试与验证工作流程的未来
创造测试与验证工作流程的未来

专访 2019-04-30

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Realize the Future of Testing and Validation Workflows Today
Keysight survey reveals software interoperability and product verification as biggest challenges facing test engineers.

专访 2019-03-22

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Accelerate your workflow with Keysight PathWave
Keysight PathWave is a new design and test software platform that accelerates your product development workflow from through manufacturing and deployment.

专访 2018-03-30

Rehost Service for Keysight ICT, AXI and AOI systems
Rehost service is included as part of Keysight support agreement for hardware support or software subscription service.

专访 2016-11-10

Integrating Multiple Technology Devices onto Laminate-Based MCMs Using an Integrated Design Flow
An overview of a fully-integrated design flow is used to demonstrate a viable solution for the assembly and design optimization of multiple RF MCM products.

专访 2016-10-24

E Pluribus Unum: An Integrated Design Flow for Phased Arrays
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

专访 2016-07-20

Using Automatic Synthesis of RF, Microwave & Analog Circuits to Increase Design Productivity by 10x
Microwave Product Digest's October 2015 Featured Article written by How-Siang Yap of Keysight Technologies.

专访 2015-10-28

Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

专访 2014-07-31

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PCBA 测试领域获奖里程碑

专访 2013-10-09

安捷伦教育领域新闻
安捷伦教育领域新闻

专访 2012-12-10

Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification
With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection.

专访 2012-12-06

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安捷伦仪器为世界级电气工程教学实验室提供动力

专访 2012-07-16

爆米花和示波器!

专访 2012-07-16

NASA Tech Brief Article: Software Defined Instruments Address Mixed-Signal Test Challenges of Today
Software Defined Instruments Address Mixed-Signal Test Challenges of Today.

专访 2012-07-13

实验室使我的工作变得简单

专访 2012-07-11

Agilent PCBA Test Award-winning Milestones

专访 2012-03-26

High-Speed Data Throughput Test
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

专访 2011-11-29

Ultra-wideband radar system design article in EE Times

专访 2011-07-27

Wideband Radar + SATCOM Measurements
Growing trends in SATCOM and radar systems in the A/D market.

专访 2011-01-12

8PSK Modulation Accuracy Measurement Graphics

专访 2010-10-12

Defining a New Methodology for Radar System Design
Article from Microwave Product Digest, October 2010, discussing the use of analysis suites for the design of advanced digital signal processing techniques.

专访 2010-10-01

Real-World Battery Drain Analysis
Go beyond Talk Time Test! Test the battery life of your data device using realistic user scenarios to ensure real-world operation meets user expectations with the 8960, 14565B and IFT software.

专访 2010-08-30

教育新闻
教育新闻

专访 2010-07-08

Boundary Scan / JTAG
This article explains what boundary scan is and the role of the Joint Test Action Group, more commonly known as JTAG.

专访 2010-04-21

Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3

专访 2010-03-09

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