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Laser Diode Characterization and Its Challenges
This white paper discusses the laser diode characterization and the challenges the test engineer faces.

Application Note 2018-07-27

PDF PDF 910 KB
LIV Test of VCSEL for 3D Sensing - Application Note
This application note explains what the challenges on an LIV characterization is, how the Keysight B2900A SMU can overcome them, and show examples to make LIV measurements using the B2900A Series.

Application Note 2018-07-02

PDF PDF 2.31 MB
Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.

Application Note 2018-06-06

Energy Ecosystem – Technologies driving the future of e-Mobility - White Paper
One of the hottest markets fueling e-mobile applications is the electric car market which is seeing expotential growth worldwide. Keysight is confident of providing both the depth and breadth of test

Application Note 2018-05-23

Accelerate the development of Next Generation Non-Volatile Memory - Application Brief
You can accelerate the development of next generation non voltile memory; CX3300 series for visualizing the fast switching characteristics, B1500A for basic IV,CV,pulsed IV and reliability testing.

Application Note 2018-04-09

PDF PDF 774 KB
A Source/Measurement Unit Based Teaching Lab Solution Package for MEMS Technologies
This 2-page introduces the Keysight B2902A/12A Source/Measure Unit based Teaching Lab Solution Package for MEMS Technologies.

Application Note 2018-03-15

PDF PDF 598 KB
Diode Production Test Using the B2900A Series of SMUs - Application Note
This application note shows how to use the Keysight B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test.

Application Note 2018-03-08

Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2017-12-05

Resistance Measurements Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU enables you to accurately and easily measure the resistance with a variety of features to address the issues on resistance measurements.

Application Note 2017-06-05

Electrochemistry 3-Electrode Measurement Workflows for Li-ion Cells and Sensors Using the B2900 SMU
This application note shows the B2900A is well suited for electrochemical measurements with its capability to source and measure both voltage and current very accurately at 10 fA and 100 nV resolution.

Application Note 2017-02-08

Customizing the B2900A SMU’s Default Boot-Up Settings - Application Brief
This application brief explains the "Power-On State" function and shows how to use it to make the instrument boot-up in current source mode and 4-wire connection scheme as an example.

Application Note 2016-12-13

PDF PDF 2.13 MB
Characterizing Random Noise in CMOS Image Sensors - Application Note
This application note how to characterize random noise in CMOS image sensor, and RTS noise measurement using the B1500A's WGFMU module.

Application Note 2016-11-09

Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

Improve Characterization Efficiency with B2900’s Easy File Access Function - Application Brief
This application brief introduces convenient function to manage files on the B2900 precision instrument family via Windows Explorer called Easy File Access.

Application Note 2016-10-25

PDF PDF 1.38 MB
Improve the Accuracy and Efficiency for Organic-Thin Film Transistor (Organic-TFT) Characterization
This application note provides the technical information for the organic thin film transistor (OTFT) measurement using the B1500A Semiconductor Device Analyzer.

Application Note 2016-03-08

PDF PDF 2.96 MB
Sheet Resistance/Resistivity Measurement Using a Source/Measurement Unit (SMU) - Application Note
This application note provides the technical information for the sheet resistance measurement using the precision current-voltage analyzer series.

Application Note 2016-01-14

PDF PDF 1.62 MB
LED IV Measurements Using the Keysight B2900A Series of SMUs - Application Note
This application note describes the use of LED IV measurements using the B2900 Series Precision source/measure unit.

Application Note 2016-01-04

Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2015-12-17

PDF PDF 970 KB
Bipolar Transistor Characterization Using the B2900A Series of SMUs - Application Note
This application note describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2015-12-17

Quick DC and Transient Evaluation of Switching Mode DC-DC Converter - Application Brief
This 3-page application brief introduces the example to make DC and Transient Evaluation of Switching Mode DC-DC Converter effectively using the Agilent B2900A Series of Precision Source/Measure Units.

Application Note 2015-12-17

PDF PDF 1.28 MB
FET Characterization Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software.

Application Note 2015-12-15

IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2015-12-14

LIV Test of Laser Diode Using the B2900A Series of SMUs-Application Note
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

Application Note 2015-12-03

Diode Evaluation Using the B2900A Series of SMUs - Application Note
This application note shows how the Keysight B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.

Application Note 2015-12-02

Optoelectronic IC/Component Evaluation - Application Brief
This 2-page application brief describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.

Application Note 2015-11-24

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