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Keysight Technologies to Show New Test and Measurement Solutions at ECOC 2015
Keysight's new solutions are intended to enable the development of next-generation networks used for the generation and analysis of coherent optical modulated signals. These solutions will address new modulations techniques such as PAM-4, the characterization of electrical and optical transceivers, and component test.

プレス資料 2015-09-15

Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication Applications

プレス資料 2015-03-24

J-BERT offers adjustable and integrated inter-symbol interference
J-BERT offers adjustable and integrated inter-symbol interference

プレス資料 2015-01-22

Introduces Industry's Most Accurate Test Solution for USB 3.1 Receivers
Achieve accurate receiver characterization with the J-BERT high-performance BERT

プレス資料 2014-07-09

Press Releases for M8000 Series
New M8000 Series of BER Test Solutions

プレス資料 2014-03-18

Press Releases for 81134A

プレス資料 2010-04-29

Press Releases for 81150A

プレス資料 2010-04-29

New Pattern Generator Tests Analog, Digital, Mixed Signal Devices - Press Material
New Pattern Generator Tests Analog, Digital and Mixed Signal Devices

プレス資料 2009-05-11