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Utilizing Commercial Best Practices for Success in NewSpace - Application Note
NewSpace is driving disruption that we haven’t seen since the original space race in the 1960’s. This paper describes the challenges that the new and unique business models put on electronic design and test strategies and processes. We will present ways to enable much higher volume with much lower cost while maintaining high quality.

文章 2015-03-31

PDF PDF 451 KB
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

文章 2015-03-24

A Nonlinear Model Complier for RF/MICROWAVE Engineers
This Article presents Genesys latest release which includes a powerful Verilog-A compiler technology and hence enhancing the accuracy of simulation.

文章 2015-03-18

PDF PDF 545 KB
AWG M8195A won Lightwave award 2015
The 2015 Lightwave Innovation Award Elite Scores

文章 2015-03-17

University of Leeds Showcases Two Engineering Research Labs

文章 2015-02-11

Signal-Generation Advances Support Electronic Warfare’s Evolution

文章 2015-01-28

University of Utah Goes to Extremes to Investigate the Characteristics of Polar Ice
Read how Professors Ken Golden and Cynthia Furse and colleagues from the University of Utah used Keysight’s FieldFox handheld analyzer to measure the electromagnetic properties of polar ice

文章 2015-01-07

Signal-Generation Advances Support Electronic Warfare’s Evolution

文章 2014-12-31

PDF PDF 564 KB
5G 毫米波 MIMO 信道探测:技术挑战和原型系统
在本文中,我们重点讨论了如何使用商用仪器建立毫米波 MIMO 信道探测系统,破解主要技术挑战。

文章 2014-12-18

Frost & Sullivan 2014 Global Instrumentation Software Market Leadership Award – Article Reprint

文章 2014-11-14

PDF PDF 1.97 MB
Design of an 8×8 MIMO Broadband RF Subsystem for Future WLAN
Microwave Journal, November 13, 2014 article by Southeast University describes a broadband 8×8 MIMO RF subsystem with large area coverage for next generation WLAN in the 5 GHz band.

期刊 2014-11-13

Engineering Students in Brazil Learn with Hands-on Projects
Engineering Students in Brazil Learn with Hands-on Projects

文章 2014-10-28

IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research
IRCICA Creates a Telecommunications Test Platform for Industrial and Academic Research

文章 2014-10-16

AWG article - MWJ product feature
AWG article - MWJ product feature

文章 2014-10-14

MIT Lives Up to its Motto: Mind and Hand
MIT Lives Up to its Motto: Mind and Hand

文章 2014-09-21

HeatWave Case Studies
HeatWave Electro-Thermal simulation case studies.

案例分析 2014-09-18

HeatWave 技术文章
与 HeatWave 电热分析软件有关的技术文章链接。

文章 2014-08-27

Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

文章 2014-08-04

PDF PDF 715 KB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

文章 2014-08-04

PDF PDF 1.18 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

文章 2014-08-04

PDF PDF 1.88 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

文章 2014-08-04

PDF PDF 8.20 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

文章 2014-08-04

PDF PDF 2.84 MB
FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna.

文章 2014-08-03

PDF PDF 816 KB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

文章 2014-08-01

PDF PDF 201 KB
Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.

文章 2014-08-01

PDF PDF 3.07 MB

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