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Introduction to Wafer-level Measurement Solutions (WMS) – WMS Series Part 1 of 6
In this video we present an overview of the hardware and software used for making wafer level measurements up to 110 GHz.This is part of a 6 part video series on wafer level measurements.

Demo 2018-05-09

Automated on-wafer millimeter wave measurements demo – WMS Series Part 2 of 6
In this demo, we measure S-parameters on a GaAs MESFET and capacitor structure in an automated fashion across the wafer. This leverages a lot of pieces together that will be explained in later videos: • configuring the WaferPro Express software to drive other instruments and wafer prober software • wafer alignment • RF S-parameter calibration • WaferPro Express project set up

Demo 2018-05-09

Configure WaferPro Express for measurements and probing – WMS Series Part 3 of 6
In this video, we will show you how to connect WaferPro Express to the instruments and then to the Velox prober control software.

Demo 2018-05-09

Align wafer probes and create a wafer map – WMS Series Part 4 of 6
In this video, we demonstrate how to align a wafer to the reference plane of our probing system using the auto align feature in Velox. We will then generate a wafer map.

Demo 2018-05-09

Set up a measurement project with WaferPro Express – WMS Series Part 6 of 6
In this video, we will set up a new project in WaferPro Express, defining our measurements on our desired devices.

Demo 2018-05-09

Perform on-wafer RF calibration – WMS Series Part 5 of 6
In this video, we demonstrate an on wafer network analyzer calibration to 50 GHz.

Demo 2018-05-09

How to Simplify Device Model Extraction using an Open Source User Interface
This video shows an example of an IC-CAP custom user interface (UI) for device modeling. In the selected modeling application, the DC modeling of a Zener diode is intentionally kept simple in order to demonstrate the features of the UI.

How-To Video 2017-06-26

Static Random Access Memory (SRAM) Cell Modeling in MBP 2017
This video introduces a new turnkey solution for SRAM modeling now available in Keysight’s Model Builder Program 2017. The video describes the concept of SRAM cell modeling and highlights the major challenges of that process.

Demo 2017-06-12

How to Extract a BSIM4 DC Model
This video introduces a general DC modeling and characterization flow for the BSIM4 model, which is one of the most popular models used by the industry today for bulk CMOS.

How-To Video 2017-05-24