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Eliminate Potential Measurement Errors and Achieve the Greatest Accuracy in Digital Multimeters
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors. For an overview of ac voltage measurement errors, see application note, literature number 5988-5512EN.. For a discussion of resistance, dc current, ac current and frequency and period measurement errors,see application note, literature number 5988-5513EN.

Notes d’application 2018-12-05

Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Notes d’application 2018-12-05

UWB Antenna Measurements with the 20 GHz E5071C ENA Network Analyzer
This app note discusses the benefits of using 20 GHz ENA network analyzers for UWB antenna measurements, and presents a measurement example using the ENA's gating function.

Notes d’application 2018-12-05

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Notes d’application 2018-12-05

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

Notes d’application 2018-12-01

Wavelength and Polarization Dependence of 100G-LR4 Components - Application Note
This application note describes our solution based on the new 81606A or 81608A tunable lasers, for measuring the wavelength and polarization dependence of components for 100G optical links that multiplex multiple wavelengths. Both passive fiber optic components and receiver optical subassemblies are addressed.

Notes d’application 2018-11-13

Using SystemVue to Integrate a Flexible R&D Testbed for LTE
Explore how to build an integrated SystemVue model for testing LTE base station receiver measurements.

Notes d’application 2018-07-31

LTE-Advanced Signal Generation and Measurement Using SystemVue
Learn how to use Keysight SystemVue to generate various downlink and upload signals, use different MIMO models, and measure closed-loop throughput.

Notes d’application 2018-07-31

Understanding LTE-Advanced Base Station Transmitter RF Conformance Testing
Learn how to characterize LTE-A base station transmitters using the 3GPP RF conformance tests with carrier aggregation.

Notes d’application 2018-07-19

Overcoming Interference is Critical to Success in a Wireless IoT World - White Paper
This white paper highlights the importance of co-existence testing and step-by-step guide on how it can be done in the lab.

Notes d’application 2018-07-17

Reducing the “Cost of Confidence” in Testing for NewSpace - Application Note
In this app note, we outline a cost model that applies to each stage of that lifecycle to help you reduce the “cost of confidence” in the testing of NewSpace systems and payloads

Notes d’application 2018-07-12

First Steps in 5G: Overcoming New Radio Device Design Challenges Series - Part 3 - White Paper
MIMO, beam steering, and beamforming are the most talked about technologies in 5G. They are essential to deliver 100x the data rates and 1000x the capacity goals specified in IMT-2020 vision.

Notes d’application 2018-07-10

De-Risking 5G Product Development - White Paper
Part 1 of this white paper series explores the challenges facing developers of 5G chipsets, devices, network equipment, and carrier networks.

Notes d’application 2018-07-09

First Steps in 5G: Overcoming New Radio Device Design Challenges Series - Part 4 - White Paper
Over-the-air (OTA) testing is one of the most challenging aspects of 5G device development. In this series, we’ve looked at many aspects of 5G for device designers, including the new 5G NR standard, flexible numerology, millimeter-wave (mmWave) design considerations, MIMO, and beamforming challenges. The combination of these technologies introduces substantial new test challenges that can only be validated with OTA testing.

Notes d’application 2018-07-06

Using Noise Floor Extension in the PXA Signal Analyzer - Application Note
With sufficient processing and other technical innovations, the noise power in a signal analyzer can be modeled and subtracted from measurement results to reduce the effective noise level.

Notes d’application 2018-07-03

Probing a Midpoint of a Transmission Line that is Not Load Terminated - White Paper
With the advent of variable on die termination (i.e. ODT) many systems like low power double data rate memory (LPDDR) have the ability to either terminate a line in its characteristic impedance for high speed operation or terminate it with an open for lower speed operation. Many times there is a desire to probe the transmission line to monitor the signals on the line. When the transmission line is terminated in close to its characteristic impedance, the signals can be readily observed. However, if the line is terminated in an impedance that is not close to the characteristic impedance then it may not be possible to accurately measure the signals.

Notes d’application 2018-07-03

LIV Test of VCSEL for 3D Sensing - Application Note
This application note explains what the challenges on an LIV characterization is, how the Keysight B2900A SMU can overcome them, and show examples to make LIV measurements using the B2900A Series.

Notes d’application 2018-07-02

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Notes d’application 2018-06-29

A Framework for Understanding: Deriving the Radar Range Equation - Application Note
Radar scans three-dimensional space to gather information about detected objects such as location, shape and speed. This entire process is described in this app note by the radar range equation.

Notes d’application 2018-06-28

On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Notes d’application 2018-06-12

On-Wafer Testing of Opto-Electronic Components
Learn how to achieve accurate on-wafer opto-electronic device measurements and have absolute confidence in your results.

Notes d’application 2018-06-11

Simulation for 5G New Radio System Design and Verification
There are many challenges for design and verification engineers to develop their commercial 5G devices. Finding effective solutions is one of the greatest challenges for wireless technology experts.

Notes d’application 2018-06-06

Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.

Notes d’application 2018-06-06

Measuring Insulating Material Resistivity Using the B2985A/87A - Application Note
This application note explains how easy it is to make an resistivity measurement using the B2980A Series.

Notes d’application 2018-06-05

CX3300 Series Device Current Waveform Analyzer, 7 Hints for Precise Current Measurements
This application note explains 7 hints that can be undertaken in order to obtain more favorable current measurement with the CX3300.

Notes d’application 2018-06-04

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