Here’s the page we think you wanted. See search results instead:


Contact an Expert

Technical Support

Impedance Analyzers [Discontinued]

Support by Product Model Number:

1-25 of 60

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2018-02-22

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-12-13

Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-11-02

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2016-06-12

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer
This application note describes the benefits of using Keysight impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

MEMS On-wafer Evaluation in Mass Production - Application Note
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Application Note 2015-08-27

Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A - Application Note
This application brief describes the benefits of using the Keysight 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.

Application Note 2015-08-26

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4)
The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument.

Application Note 2012-04-27

Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

MEMS/NEMS Device Measurement Solution
Keysight helps you characterize MEMS/NEMS device.

Application Note 2010-09-19

Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

Application Note 2009-10-28

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

Application Note 2008-11-20

Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Application Note 2008-08-21

Dielectric Constant Evaluation of Rough Surfaced Materials (PN 4291-5)
This product note describes the technologies and features in the 4291B RF Impedance/Material Analyzer to extend accurate impedance measurements to 1.8 GHz. Advantage of the new V-I impedance technique for direct impedance measurement, cable...

Application Note 2008-06-02

ADSL Copper Loop Measurements (PN 4395-1)
This product note provides a practical guidance for the copper loop measurement for ADSL by using the 4395A.

Application Note 2008-04-15

Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

Application Note 2008-04-10

Temperature Characteristic Evaluations of RF Components and Materials (AN 1464)
This application note introduces an efficient and highly reliable measurement system for evaluating temperature characteristics of components and materials using a combination of the E4991A-007.

Application Note 2004-10-14

How To Accurately Evaluate Low ESR/High Q RF Chip Devices (AN 1369-6)
This application note discusses the requirements for proper measurement techniques, the right test instrument, and fixtures that can accommodate the minute size of todays RF chip devices.

Application Note 2004-01-24

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

How to Characterize CATV Amplifiers Effectively (AN 1288-4)
This application note shows you how to effectively evaluate CATV amplifier performance using the 4396B Network/ Spectrum/Impedance Analyzer.

Application Note 2002-12-12

Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Keysight 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

Highly Accurate Evaluation of Chip Capacitors using the 4291B (AN 1300-1)
The evaluation of chip capacitors is particularly important because they are used in a wide range of applications (including oscillation circuits and LC filters).

Application Note 2001-11-09

Configuring the Keysight 4396B for O/E Testing (AN 1288-2)
The recent trend in cable television (CATV) is the need for more selections, or channels, and the possibility of having interactive TV services such as On-Line-Banking and Movies-0n-Demand. These requirements are pushing the limits of the copper...

Application Note 2001-09-07

1 2 3 Next