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Materials Measurement: Magnetic Materials - Application Brief
This application brief provides the solutions for measuring magnetic materials.

应用说明 2014-07-17

PDF PDF 1.08 MB
E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

应用说明 2014-06-15

XLS XLS 40 KB
Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

应用说明 2012-10-30

Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4)
The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument.

应用说明 2012-04-27

PDF PDF 51 KB
是德成功测量阻抗的 8 点提示 应用指南 346-4
是德成功测量阻抗的 8 点提示 应用指南 346-4。测量阻抗有几种不同的技术和方法,应该根据测量的频率范围、要测量的阻抗参数以及想要显示的测量结果来选择一个具体的测试技术。

应用说明 2011-12-31

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

应用说明 2011-11-29

PDF PDF 1016 KB
MEMS/NEMS Device Measurement Solution
Keysight helps you characterize MEMS/NEMS device.

应用说明 2010-09-19

Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

应用说明 2009-10-28

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

应用说明 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

应用说明 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

应用说明 2008-11-20

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

应用说明 2008-08-21

Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

应用说明 2008-08-21

Dielectric Constant Evaluation of Rough Surfaced Materials (PN 4291-5)
This product note describes the technologies and features in the 4291B RF Impedance/Material Analyzer to extend accurate impedance measurements to 1.8 GHz. Advantage of the new V-I impedance technique for direct impedance measurement, cable...

应用说明 2008-06-02

PDF PDF 111 KB
ADSL Copper Loop Measurements (PN 4395-1)
This product note provides a practical guidance for the copper loop measurement for ADSL by using the 4395A.

应用说明 2008-04-15

PDF PDF 123 KB
Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

应用说明 2008-04-10

PDF PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

应用说明 2008-04-03

PDF PDF 119 KB
Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

应用说明 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

应用说明 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

应用说明 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

应用说明 2007-04-04

16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures
This Product Note explains that the ability to verify the correlation of impedance measurement results is dependent on the variety of factors.

应用说明 2007-03-06

频谱分析基础 (AN 150)
本书编译自是德著名的应用指南Application Note 150: Spectrum Analysis Basics (频谱分析基础)。 它详细描述了频谱分析的基本原理以及性能指标。希望这本指南能帮助你更加深入地了解你所使用的频谱分析仪,充分利用它的功能特征以发挥它的最大潜能。

应用说明 2006-08-02

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

应用说明 2006-06-26

Temperature Characteristic Evaluations of RF Components and Materials (AN 1464)
This application note introduces an efficient and highly reliable measurement system for evaluating temperature characteristics of components and materials using a combination of the E4991A-007.

应用说明 2004-10-14

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