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Pulse, Pattern, Function, and Arbitrary Waveform Generators - Application Note
This Keysight family of pulse, pattern, function and arbitrary waveform generators can help you verify and characterize digital or analog systems, products, and components.

Application Note 2018-09-17

PDF PDF 2.06 MB
Everything You Need to Know About Coherent Optical Modulation
This is an introduction to the fundamentals of coherent optical modulation techniques.

Application Note 2018-09-10

PDF PDF 14.34 MB
Error Analysis of PAM4 Signals - Application Brief
Increasing demands for a connected world with instant data access continues to drive Ethernet, 64G fiber channel, CEI-56G and other next generation data center networking links.

Application Note 2018-08-17

PDF PDF 1.68 MB
Wafer and Chip-Level Optical Test - Application Note
Optical testing of wafer and chips for photonic integrated circuits requires attention to the polarization of the input light. This is supported by the N7700A application software.

Application Note 2018-08-16

PDF PDF 798 KB
EMI Troubleshooting: The Need for Close Field Probes - Application Note
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2018-08-07

How 5G Will Influence Autonomous Driving Systems - White Paper
5G Will Dramatically Strengthen Autonomous Driving Systems. ADAS and autonomous driving improve safety and save lives.

Application Note 2018-07-26

PDF PDF 4.89 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2018-07-25

Wavelength and Polarization Dependence of 100G-LR4 Components - Application Note
This application note describes our solution based on the new 81606A or 81608A tunable lasers, for measuring the wavelength and polarization dependence of components for 100G optical links that multiplex multiple wavelengths. Both passive fiber optic components and receiver optical subassemblies are addressed.

Application Note 2018-07-13

Probing a Midpoint of a Transmission Line that is Not Load Terminated - White Paper
With the advent of variable on die termination (i.e. ODT) many systems like low power double data rate memory (LPDDR) have the ability to either terminate a line in its characteristic impedance for high speed operation or terminate it with an open for lower speed operation. Many times there is a desire to probe the transmission line to monitor the signals on the line. When the transmission line is terminated in close to its characteristic impedance, the signals can be readily observed. However, if the line is terminated in an impedance that is not close to the characteristic impedance then it may not be possible to accurately measure the signals.

Application Note 2018-07-03

PDF PDF 1.98 MB
On-Wafer Testing of Opto-Electronic Components Using the Lightwave Component Analyzers - Rev.2
This document describes the principles of on-wafer measurements of opto-electronic components using a Lightwave Component Analyzer and provides step-by-step instructions needed to set up a calibration kit prior to the on-wafer calibration, to perform the electronic calibration and to deembed the wafer probes.

Application Note 2018-07-03

PDF PDF 6.91 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2018-06-29

Bandwidth Boosting Techniques for the Infiniimax Probe Amp and Probe Head - Application Note
Keysight InfiniiMax differential probes are DSP corrected to have a flat magnitude and phase response to provide the highest possible accuracy. The bandwidth chosen to correct to is typically around 3dB non-corrected bandwidth. Usually, extending the bandwidth much beyond that point will increase the noise floor, and if pushed even further, can cause unrealistic noise artifacts. However, the N5381A/B solder-in probe head in combination with the InfiniiMax 1169A/B probe amp is an excellent candidate for extending the bandwidth beyond the 3dB point because the N5381A/B is peaked past the normal 12 GHz bandwidth, and the peaking of the probe head can help compensate for the roll-off of the probe amp bandwidth.

Application Note 2018-06-21

PDF PDF 4.96 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2018-06-12

Advanced Driver Assistance Systems (ADAS) and Autonomous Driving - White Paper
How Millimeter Wave Automotive Radar Enhances Advanced Driver Assistance Systems (ADAS) and Autonomous Driving

Application Note 2018-05-29

PDF PDF 5.70 MB
Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer - Application Note
This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

Application Note 2018-05-25

PDF PDF 2.07 MB
Integrate Collaborative Robot (Cobot) with i3070 ICT Test Platform - Application Note
Improve quality and efficiency of daily works on production line and reduce dependency on human operators by integrating Cobot (collaborative robot) with i3070 ICT test platform.

Application Note 2018-05-15

PDF PDF 3.18 MB
5 New Features and Test Challenges for 802.11ax - White Paper
This white paper introduces the new 802.11ax standard which provides better spectral efficiency, capacity, and coverage in dense deployment scenarios as well as outdoor environments.

Application Note 2018-05-03

PDF PDF 4.31 MB
Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

Application Note 2018-04-12

PDF PDF 781 KB
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Application Note 2018-03-20

Understanding GSM/EDGE Transmitter and Receiver Measurements for Base Transceiver Stations (AN 1312)
This 36-page application note presents the fundamental RF parametric measurements necessary to characterize GSM/EDGE base transceiver stations and their components.

Application Note 2018-03-12

Optimizing Dynamic Range for Distortion Measurements - Application Note
This application note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2018-03-12

PDF PDF 2.11 MB
AFM-Based Characterization of Electric Properties of Soft Materials - Application Note
Local electric and dielectric properties of materials in a broad frequency range (up to several GHz) and effects of vapor condensation have been studied with environmental AFM in this note.

Application Note 2018-03-09

PDF PDF 3.12 MB
FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Application Note 2018-03-08

PDF PDF 519 KB
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

Application Note 2018-03-08

PDF PDF 1.60 MB
Integrating x1149 Boundary Scan Analyzer and Mini In-Circuit Test System for Better Test Coverage
Improve test coverage with the integration of the x1149 and Mini ICT into a single test station and extend the usage and flexibility of both platforms.

Application Note 2018-03-07

PDF PDF 1.64 MB

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