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Six Reasons Your New IoT Device Will Fail - Application Note
You’ve carefully tested your new IoT wireless device. What did you forget that could cause your device to work perfectly in the lab but fail in the real world?

Application Note 2017-11-13

PDF PDF 1.06 MB
How to Select the Right Current Probe - Application Note
Oscilloscope current probes enable oscilloscopes to measure current, extending their use beyond just measuring voltage. Basically, current probes sense the current flowing through a conductor and convert it to a voltage that can be viewed and measured on an oscilloscope. There are many different types of current probes you can choose from and each probe has an area where it performs best. This application note will introduce you to the common types of current probe solutions, the fundamental principles, the advantages and limitations between each current probe type, and the practical consideration for using current probes for oscilloscope applications to make the most out of them.

Application Note 2017-11-09

PDF PDF 1.41 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Application Note 2017-11-08

PDF PDF 8.01 MB
Oscilloscope in Medical Imaging Applications - Measuring Power Integrity and Current Measurement
This application brief explores how Keysight oscilloscopes help designers validate the medical instrument’s IO interface for data processing in image reconstruction.

Application Note 2017-11-06

PDF PDF 553 KB
How to Test USB Power Delivery (PD) Over Type-C - Application Note
USB Type-C power delivery creates possibilities for USB connected devices with higher, bi-directional power and power for non-USB devices with ALT mode. Learn more about verification/compliance.

Application Note 2017-11-01

Temperature Measurement Solution for Solar Cell and Module Testing - Application Note
This application note discuss a test solution for hearable. This application note may help you if you are R&D engineers, test engineers or test lab personnel who responsible for testing Hearables.

Application Note 2017-10-25

Automated Configuration of Scan Path Linkers Using x1149 - Application Note
The automated scan path linker configuration feature introduced with the release of software version 1.6.0.0 simplifies scan path linker configuration for five scan path linker devices commonly used in the industry.

Application Note 2017-10-10

PDF PDF 2.64 MB
Testing 5G: Data Throughput - Application Note
This application note describes the new challenges of testing high data rates and provides a solution to these challenges using Keysight’s Protocol R&D Toolset.

Application Note 2017-09-30

PDF PDF 2.76 MB
Precision Jitter Transmitter - DesignCon 2005
Precision Jitter Transmitter whitepaper

Application Note 2017-09-28

PDF PDF 1.10 MB
Effect of Indenter Tip Heating in High-Temperature Nanoindentation Measurements - Application Note
Independently heating and monitoring the temperature of both indenter tip and sample helps determine high-temperature mechanical properties of materials using static/dynamic measurement methods.

Application Note 2017-09-27

PDF PDF 1.11 MB
Evaluate Lithium Ion Self-Discharge of Cells in a Fraction of the Time Traditionally Required
This new way to determine a cell’s self-discharge by measuring its self-discharge current allows cells with excessively high self-discharge to be identified and isolated much quicker vs traditional open-circuit voltage approaches.

Application Note 2017-09-18

PDF PDF 1.67 MB
Eight Hints for Better Scope Probings - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2017-09-15

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2017-09-07

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Coherent Optical Communications Test Challenges - Application Note
This Application Note focuses on the test and troubleshooting of next-generation fiber-based communication systems tasked with supporting 100 Gb/s, 400 Gb/s data rates and higher.

Application Note 2017-08-31

PDF PDF 1.70 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
Brittle-to-Ductile Plasticity Transition Behavior Study of Si by High-Temperature Nanoindentation
Nanomechanical response of single crystal silicon at various temperatures were studied using elevated temperature nanoindentation with Keysight G200 laser heater system.

Application Note 2017-08-21

PDF PDF 657 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

Application Note 2017-08-18

PDF PDF 4.22 MB
Narrowband IoT (NB-IoT): Cellular Technology for the Hyperconnected IoT - Application Note
This paper explains the underlying reasons why this technology is shaped as it is today and explore the challenges in adopting this new application and explains the new ways of securely roll out NB-IoT application quickly to market.

Application Note 2017-08-08

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2017-07-31

PDF PDF 1.38 MB
High-Temperature Nanoindentation on Pure Titanium (Ti) - Application Note
High-temperature mechanical properties of Pure Titanium was successfully tested by G200 Nano Indenter Laser Heater over a range of temperature from ambient to 500°C.

Application Note 2017-07-31

PDF PDF 524 KB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-07-13

Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2017-07-05

PDF PDF 2.47 MB
Optical Signal Measurements Using A Real-Time Oscilloscope - Application Note
If your application includes a repetitive waveform that requires lower noise, jitter and a higher dynamic range, a sampling oscilloscope is a good choice.

Application Note 2017-06-27

PDF PDF 907 KB

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