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Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

Application Note 2018-10-30

Laser Diode Characterization and Its Challenges
This white paper discusses the laser diode characterization and the challenges the test engineer faces.

Application Note 2018-10-29

Why Autonomous Driving Systems Will Require Automotive Ethernet - White Paper
Automotive Ethernet provides the new backbone for faster automotive networks to serve autonomous vehicles and advanced driver assistance systems (ADAS) which need higher bandwidth and lower latency.

Application Note 2018-10-25

IEEE 1687 – Silicon Test to Board Test - Application Note
This application note is to provide an overview to the audience on the use case of IEEE 1687 in their test environment and how it benefits their testing.

Application Note 2018-10-24

PDF PDF 968 KB
Digital Multimeter Safety Tips - White Paper
Learn how to safely use digital multimeters. Consider the advice from this article before you start making measurements with a DMM.

Application Note 2018-10-23

Understanding and Testing Multi-Channel RF Systems with Signal Generators Part 2
Generating and analyzing multiple synchronized RF signals are potentially challenging. This white paper discusses test signal requirements for the evaluation of multi-channel RF systems and how to configure instruments for these test requirements.

Application Note 2018-10-22

Understanding and Testing Multi-Channel RF Systems with Signal Generators Part 1
Generating and analyzing multiple synchronized RF signals are potentially challenging. This white paper discusses test signal requirements for the evaluation of multi-channel RF systems and how to configure instruments for these test requirements.

Application Note 2018-10-22

9 Best Practices for Optimizing Your Signal Generator - Part 2
Discuss the best practices for optimizing measurement speed and phase noise profile.

Application Note 2018-10-19

PDF PDF
9 Best Practices for Optimizing Your Signal Generator – Part 2 - Application Note
Knowing the capabilities and performance of your signal generators is the first step to make accurate and consistent measurements. In this two-part Application Note, we discuss the best practices to optimize your signal generator.

Application Note 2018-10-19

9 Best Practices for Optimizing Your Signal Generator – Part 1 - Application Note
Knowing the capabilities and performance of your signal generators is the first step to make accurate and consistent measurements. In this two-part Application Note, we discuss the best practices to optimize your signal generator.

Application Note 2018-10-18

9 Best Practices for Optimizing Your Signal Generator - Part 1
Discuss the best practices for improving measurement accuracy, including flatness correction, external leveling, and internal channel corrections.

Application Note 2018-10-18

PDF PDF
Gain Compression Measurement with Lightwave Component Analyzer
This application note is intended to assist Gain Compression Measurement using the N437xD/E Lightwave Component Analyzer.

Application Note 2018-10-17

PDF PDF 2.38 MB
Characterize, Validate, and Debug Advanced Devices with Precision Dynamic Current Measurements
This application note describes the measurement challenges in the precision dynamic current measurement in the various conditions, and Keysight’s new solution for them.

Application Note 2018-10-11

PDF PDF 1.76 MB
Avoid Power Related Damage Using Overcurrent Protection with a Multiple Output Power Supply
When multiple voltages power a device, it is often desirable to turn off all the power supply outputs when a fault occurs. If using more than one power supply, daisy chain the digital IO ports such that all outputs, even across mainframes, will be shut down on an overcurrent event. Provide additional protection for a device by using these three functions together - OCP, fault-out and the inhibit function - to shut down all the outputs.

Application Note 2018-10-10

PDF PDF 1.65 MB
Calibrating Optical Paths in Spectral Test Station Using N7700A IL/PDL SW Engine - Application Note
Optical IL and PDL of a device relate the signal output from the device with the input signal, previously recorded or calibrated as reference measurement. For best results, the reference is repeated periodically and made with the same settings to be used on the device. By using IL de-embedding, the reference data can be applied to multiple optical paths without repeating at each port.

Application Note 2018-10-10

PDF PDF 213 KB
Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2018-10-10

Probe soldering guidelines for Keysight InfiniiMax probes - Application Note
There are various ways to connect test instrumentation probes to devices under test(DUTs). One such method is soldering, which provides a reliable connection and minimizes parasitic probing effects by keeping wire lengths and connections as short as possible. Many of Keysight's high performance oscilloscopes probes utilize soldered connections.

Application Note 2018-10-07

PDF PDF 7.73 MB
Tactics for Improving Distortion Measurements - White Paper
Learn about the different types of distortion and why they matter to your RF measurements.

Application Note 2018-10-05

Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2018-10-05

Measuring Low Current Consumption with a Digital Multimeter
Learn how the Truevolt 34465A and 34470A digital multimeters have expanded current ranges, allowing you to make more accurate low-current measurements.

Application Note 2018-09-27

PDF PDF
Digital Multimeter Damage Prevention - White Paper
Learn 4 tips to avoid damaging your digital multimeter.

Application Note 2018-09-27

Fast Thermal Characterization and Testing Your Electronic Devices - White Paper
Fast thermal characterization and testing gives you the advantage of quick and qualitative insight into your products’ characteristics, the ability to troubleshoot and fine-tune the performance, and the capability to perform additional iterative testing. Learn how to predict and preview operating temperature performance of your product. Learn how to use a DAQ data acquisition system as a data logger to make temperature measurements on your product.

Application Note 2018-09-21

Specifying and Buying a Bench Power Supply
Read about fundimental considerations for specifying and buying a DC power supply - addresses questions such as “Which power supply will suit my application needs?

Application Note 2018-09-21

PDF PDF
Achieving Fast and Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range for Wireless
This application note explains how to obtain a wide power measurement range on the lower power level. This is important for chipsets designed to handle a wider power range to support higher data throughput and wider coverage area

Application Note 2018-09-20

Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications
Using the N6705A for bench-top test and debug of power transient issues for automotive and aerospace/defense

Application Note 2018-09-19

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