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Enabling Breakthroughs in Terabit Research
This application note explores new measurement capabilities that enable breakthroughs in terabit research. It outlines four groundbreaking applications: coherent optical, 802.11ay WLAN, high-speed digital buses, and 5G MIMO.

Application Note 2019-01-14

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Analysis of Test Time in Electronics Development Workflows - White Paper
In this paper, we explore three tasks that distract test engineers from their primary job function and discuss how to handle them more quickly and efficiently.

Application Note 2019-01-07

PDF PDF 2.46 MB
Test Orientation of Polarized Capacitor in i3070 ICT Test Platform - Application Note
Reversing the voltage on the polarized capacitor could be hazardous, resulting in explosion or fire. It is crucial to detect wrongly oriented polarized capacitor and get it fixed as early as possible.

Application Note 2019-01-03

PDF PDF 310 KB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Application Note 2019-01-01

Metrology-Grade Measurement Challenges - Application Note
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

Application Note 2018-12-20

PDF PDF 819 KB
Metrology Grade Measurement Challenges
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

Application Note 2018-12-20

PDF PDF
Connector Pin Recession and its Effect on Network Analyzer Accuracy
This article outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.

Application Note 2018-12-19

PDF PDF
Calculating Uncertainty using Digital Multimeter Ratio Measurement Techniques
Learn three digital multimeter ratio measurement techniques for determining the traceable value and measurement uncertainty of an unknown input.

Application Note 2018-12-18

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Defining Your Calibration Requirement
These are the steps that can be taken when actually placing an order to ensure you get a "proper" calibration.

Application Note 2018-12-14

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Selecting a Calibration Vendor
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?

Application Note 2018-12-14

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Instrument Design Validation and Recommended Calibration Policy
Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures.

Application Note 2018-12-13

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The Metrological and Financial Implications of a Clogged Fan Filter
This article discussed the implications of having a clogged air filter and addresses solutions to helping in the prevention of clogged air filters.

Application Note 2018-12-13

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Using Calibration to Optimize Performance in Crucial Measurements
This application covers two goals: help you ensure that you get the calibration you expect (and deserve), and help you improve effective measurement performance through innovative use of calibration.

Application Note 2018-12-12

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Understanding Measurement Risk
This paper explains probability density functions, drawing on Monte Carlo simulation to demonstrate the relationship between a device’s true value and the corresponding measured value.

Application Note 2018-12-04

PDF PDF
Measuring Group Delay of Frequency Converters with Embedded Local Oscillators
This application note describes how to make measurements using a technique to test the frequency converter with an embedded LO source, and without direct access to a common reference signal.

Application Note 2018-12-02

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提高振幅準確度,就用下一代信號產生器
如果您須使用信號產生器執行量測,本白皮書可協助您提高振幅準確度。

Application Note 2018-12-02

Precision Validation, Maintenance and Repair of Satellite Earth Stations
This application note describes breakthrough technologies that have transformed the way systems can be tested in the field while providing higher performance, improved accuracy, capability and frequency coverage to 50 GHz

Application Note 2018-12-01

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DDR5 - Full Speed Ahead to 400GE - White Paper
As data center operators migrate their networks to 400GE, they also need to plan for the next generation of high-speed computing interfaces. Peripheral Component Interconnect Express (PCI Express® or PCIe®) expansion bus will move from PCIe 4.0 to PCIe 5.0, and double date rate (DDR) memory will move from DDR4 to DDR5.

Application Note 2018-11-28

PDF PDF 1.44 MB
Testing is Critical for Adoption of Autonomous Vehicles - White Paper
The autonomous vehicle combines various connected car technologies such as sensors, computers, and software which need rigorous testing to ensure conformance to safety and performance standards.

Application Note 2018-11-28

Got Python? Unlock the Future of Test Automation Quickly- White Paper
Test engineers can accelerate their workflow by automating their test plans. Python, integrated with other programming languages, helps test engineers began to automate their tests more quickly.

Application Note 2018-11-27

When Homegrown Test Software Slows Product - White Paper
Homegrown test software can no longer keep pace with rapid product development cycles. This paper discusses the ways homegrown software slows down hardware testing, and how modern test software environments can help.

Application Note 2018-11-27

High Attenuation Measurement of Step Attenuators
This paper introduces a solution for high attenuation measurement of step attenuators, based on the cascaded 2-port network and S-parameter theory.

Application Note 2018-11-26

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Bit Error Rate or Bit Error Ratio? - White Paper
The bit error ratio is the number of bit errors divided by the total number of bits transferred during a specific time interval. Bit error rate is the number of bit errors per unit time. The bit error rate gives you an indication of your system’s performance relative to bits transferred vs bits received.

Application Note 2018-11-26

Accelerate debug and evaluation of IoT devices by current profile analysis - Application Note
You can solve the IoT device development challenges and dramatically improve the development efficiency and quality with current profile measurement with a Device Current Waveform Analyzer.

Application Note 2018-11-22

AWG Functional Building Blocks - White Paper
Use these arbitrary waveform generator functional building blocks to help you understand exactly what is happening in your AWG and reach the full range of your AWGs’ capabilities.

Application Note 2018-11-12

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