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Electronic Warfare Signal Generation: Technologies and Methods - Application Note
This application note summarizes the available technological approaches for EW signal and environment simulation, and the latest progress in flexible, high-fidelity solutions.

Application Note 2019-01-18

Electronic Warfare Signal Generation: Technologies and Methods
Study the technological approaches for EW signal and environment simulation.

Application Note 2019-01-18

PDF PDF
Measuring Radar Signals with Vector Signal Analyzers and Wideband Instruments - Application Note
This application note provides insights into measuring radar signals with vector signal analyzers and wideband instruments and is part 4 in a series of radar application notes.

Application Note 2019-01-17

PDF PDF 3.53 MB
Transitioning to a PXI Test System - Application note
This application note reviews potential hardware and software issues to consider when transitioning from a benchtop to a PXI test system.

Application Note 2019-01-17

AVI AVI 1.57 MB
RF Streaming for Aerospace & Defense Applications - Application Note
This application note will examine some of the challenges and considerations a system engineer should consider when developing an RF streaming and recording solution.

Application Note 2019-01-16

The Journey of a Signal - Optimize your Signal Analysis Measurements - White Paper
This paper explains the high-level design of a signal analyzer and how to use that knowledge to avoid mistakes and make optimum measurements.

Application Note 2019-01-15

PDF PDF 1.40 MB
Enabling Breakthroughs in Terabit Research - Application Note
This application note explores new measurement capabilities that enable breakthroughs in terabit research. It outlines four groundbreaking applications: coherent optical, 802.11ay WLAN, high-speed digital buses, and 5G MIMO.

Application Note 2019-01-14

PDF PDF 3.12 MB
Analysis of Test Time in Electronics Development Workflows - White Paper
In this paper, we explore three tasks that distract test engineers from their primary job function and discuss how to handle them more quickly and efficiently.

Application Note 2019-01-07

PDF PDF 2.46 MB
Test Orientation of Polarized Capacitor in i3070 ICT Test Platform - Application Note
Reversing the voltage on the polarized capacitor could be hazardous, resulting in explosion or fire. It is crucial to detect wrongly oriented polarized capacitor and get it fixed as early as possible.

Application Note 2019-01-03

PDF PDF 310 KB
Metrology Grade Measurement Challenges
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

Application Note 2018-12-20

PDF PDF
Metrology-Grade Measurement Challenges - Application Note
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

Application Note 2018-12-20

PDF PDF 819 KB
Connector Pin Recession and its Effect on Network Analyzer Accuracy
This article outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.

Application Note 2018-12-19

PDF PDF
Calculating Real Time S-Parameter and Power Uncertainty - Application Note
This application note shows how to use Keysight’s innovative real time uncertainty VNA software option (S93015B) to determine the uncertainty of your S-parameter and power measurements.

Application Note 2018-12-19

PDF PDF 1.39 MB
Understanding Measurement Risk
This paper explains probability density functions, drawing on Monte Carlo simulation to demonstrate the relationship between a device’s true value and the corresponding measured value.

Application Note 2018-12-04

PDF PDF
Precision Validation, Maintenance and Repair of Satellite Earth Stations
This application note describes breakthrough technologies that have transformed the way systems can be tested in the field while providing higher performance, improved accuracy, capability and frequency coverage to 50 GHz

Application Note 2018-12-01

PDF PDF
Testing is Critical for Adoption of Autonomous Vehicles - White Paper
The autonomous vehicle combines various connected car technologies such as sensors, computers, and software which need rigorous testing to ensure conformance to safety and performance standards.

Application Note 2018-11-28

PDF PDF 5.47 MB
DDR5 - Full Speed Ahead to 400GE - White Paper
As data center operators migrate their networks to 400GE, they also need to plan for the next generation of high-speed computing interfaces. Peripheral Component Interconnect Express (PCI Express® or PCIe®) expansion bus will move from PCIe 4.0 to PCIe 5.0, and double date rate (DDR) memory will move from DDR4 to DDR5.

Application Note 2018-11-28

PDF PDF 1.44 MB
Got Python? Unlock the Future of Test Automation Quickly- White Paper
Test engineers can accelerate their workflow by automating their test plans. Python, integrated with other programming languages, helps test engineers began to automate their tests more quickly.

Application Note 2018-11-27

PDF PDF 4.34 MB
When Homegrown Test Software Slows Product - White Paper
Homegrown test software can no longer keep pace with rapid product development cycles. This paper discusses the ways homegrown software slows down hardware testing, and how modern test software environments can help.

Application Note 2018-11-27

PDF PDF 4.74 MB
Bit Error Rate or Bit Error Ratio? - White Paper
The bit error ratio is the number of bit errors divided by the total number of bits transferred during a specific time interval. Bit error rate is the number of bit errors per unit time. The bit error rate gives you an indication of your system’s performance relative to bits transferred vs bits received.

Application Note 2018-11-26

PDF PDF 926 KB
High Attenuation Measurement of Step Attenuators
This paper introduces a solution for high attenuation measurement of step attenuators, based on the cascaded 2-port network and S-parameter theory.

Application Note 2018-11-26

PDF PDF
Accelerate debug and evaluation of IoT devices by current profile analysis - Application Note
You can solve the IoT device development challenges and dramatically improve the development efficiency and quality with current profile measurement with a Device Current Waveform Analyzer.

Application Note 2018-11-22

Evolution of High-Speed Computing Interfaces - White Paper
As data center operators begin begin to migrate from 100GE to 400GE, they need a migration plan that will take them to the next-generation of high-speed computing interfaces (e.g., PCIe or DDR).

Application Note 2018-11-06

Improve Voltage Regulation Using Remote Sense - White Paper
Learn how to use remote sense to improve load regulation. Most measurements assume steady load regulation.

Application Note 2018-11-02

PDF PDF 1.01 MB
Improving Amplitude Accuracy with Next-Generation Signal Generators - White Paper
This whitepaper will help you improve the amplitude accuracy of your measurements that involve signal generators.

Application Note 2018-11-02

PDF PDF 2.44 MB

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