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Measuring Radar Signals with Vector Signal Analyzers and Wideband Instruments - Application Note
This application note provides insights into measuring radar signals with vector signal analyzers and wideband instruments and is part 4 in a series of radar application notes.

アプリケーション・ノート 2019-01-17

PDF PDF 3.53 MB
Transitioning to a PXI Test System - Application note
This application note reviews potential hardware and software issues to consider when transitioning from a benchtop to a PXI test system.

アプリケーション・ノート 2019-01-17

AVI AVI 1.57 MB
The Journey of a Signal - Optimize your Signal Analysis Measurements - White Paper
This paper explains the high-level design of a signal analyzer and how to use that knowledge to avoid mistakes and make optimum measurements.

アプリケーション・ノート 2019-01-15

PDF PDF 1.40 MB
Enabling Breakthroughs in Terabit Research - Application Note
This application note explores new measurement capabilities that enable breakthroughs in terabit research. It outlines four groundbreaking applications: coherent optical, 802.11ay WLAN, high-speed digital buses, and 5G MIMO.

アプリケーション・ノート 2019-01-14

PDF PDF 3.12 MB
Analysis of Test Time in Electronics Development Workflows - White Paper
In this paper, we explore three tasks that distract test engineers from their primary job function and discuss how to handle them more quickly and efficiently.

アプリケーション・ノート 2019-01-07

PDF PDF 2.46 MB
Test Orientation of Polarized Capacitor in i3070 ICT Test Platform - Application Note
Reversing the voltage on the polarized capacitor could be hazardous, resulting in explosion or fire. It is crucial to detect wrongly oriented polarized capacitor and get it fixed as early as possible.

アプリケーション・ノート 2019-01-03

PDF PDF 310 KB
Metrology Grade Measurement Challenges
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

アプリケーション・ノート 2018-12-20

PDF PDF
Metrology-Grade Measurement Challenges - Application Note
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

アプリケーション・ノート 2018-12-20

PDF PDF 819 KB
Connector Pin Recession and its Effect on Network Analyzer Accuracy
This article outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.

アプリケーション・ノート 2018-12-19

PDF PDF
Calculating Real Time S-Parameter and Power Uncertainty - Application Note
This application note shows how to use Keysight’s innovative real time uncertainty VNA software option (S93015B) to determine the uncertainty of your S-parameter and power measurements.

アプリケーション・ノート 2018-12-19

PDF PDF 1.39 MB
Understanding Measurement Risk
This paper explains probability density functions, drawing on Monte Carlo simulation to demonstrate the relationship between a device’s true value and the corresponding measured value.

アプリケーション・ノート 2018-12-04

PDF PDF
信号発生における位相雑音のニーズと選択肢について
本書では、まず位相雑音の基本について説明してから、アーキテクチャーの選択とさまざまな機能の代替案の効果について詳しく見ていきます。次に、キーサイトの信号発生器の概要、および位相雑音性能を向上または選択的に低下させるために装備されている内蔵機能について説明します。

アプリケーション・ノート 2018-12-03

Precision Validation, Maintenance and Repair of Satellite Earth Stations
This application note describes breakthrough technologies that have transformed the way systems can be tested in the field while providing higher performance, improved accuracy, capability and frequency coverage to 50 GHz

アプリケーション・ノート 2018-12-01

PDF PDF
Testing is Critical for Adoption of Autonomous Vehicles - White Paper
The autonomous vehicle combines various connected car technologies such as sensors, computers, and software which need rigorous testing to ensure conformance to safety and performance standards.

アプリケーション・ノート 2018-11-28

PDF PDF 5.47 MB
DDR5 - Full Speed Ahead to 400GE - White Paper
As data center operators migrate their networks to 400GE, they also need to plan for the next generation of high-speed computing interfaces. Peripheral Component Interconnect Express (PCI Express® or PCIe®) expansion bus will move from PCIe 4.0 to PCIe 5.0, and double date rate (DDR) memory will move from DDR4 to DDR5.

アプリケーション・ノート 2018-11-28

PDF PDF 1.44 MB
Got Python? Unlock the Future of Test Automation Quickly- White Paper
Test engineers can accelerate their workflow by automating their test plans. Python, integrated with other programming languages, helps test engineers began to automate their tests more quickly.

アプリケーション・ノート 2018-11-27

PDF PDF 4.34 MB
When Homegrown Test Software Slows Product - White Paper
Homegrown test software can no longer keep pace with rapid product development cycles. This paper discusses the ways homegrown software slows down hardware testing, and how modern test software environments can help.

アプリケーション・ノート 2018-11-27

PDF PDF 4.74 MB
Bit Error Rate or Bit Error Ratio? - White Paper
The bit error ratio is the number of bit errors divided by the total number of bits transferred during a specific time interval. Bit error rate is the number of bit errors per unit time. The bit error rate gives you an indication of your system’s performance relative to bits transferred vs bits received.

アプリケーション・ノート 2018-11-26

PDF PDF 926 KB
High Attenuation Measurement of Step Attenuators
This paper introduces a solution for high attenuation measurement of step attenuators, based on the cascaded 2-port network and S-parameter theory.

アプリケーション・ノート 2018-11-26

PDF PDF
Evolution of High-Speed Computing Interfaces - White Paper
As data center operators begin begin to migrate from 100GE to 400GE, they need a migration plan that will take them to the next-generation of high-speed computing interfaces (e.g., PCIe or DDR).

アプリケーション・ノート 2018-11-06

Improve Voltage Regulation Using Remote Sense - White Paper
Learn how to use remote sense to improve load regulation. Most measurements assume steady load regulation.

アプリケーション・ノート 2018-11-02

PDF PDF 1.01 MB
Improving Amplitude Accuracy with Next-Generation Signal Generators - White Paper
This whitepaper will help you improve the amplitude accuracy of your measurements that involve signal generators.

アプリケーション・ノート 2018-11-02

PDF PDF 2.44 MB
Field Testing in 5G NR - White Paper

アプリケーション・ノート 2018-11-01

PDF PDF 2.63 MB
Get It Right Every Time with Pre-Compliance Testing - White Paper
Understand how pre-compliance can help you pass final compliance testing and get your product to market on time in a low-cost, low-risk manner.

アプリケーション・ノート 2018-10-31

PDF PDF 1.43 MB
Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

アプリケーション・ノート 2018-10-30

PDF PDF 1.88 MB

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