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CAN FD Eye-Diagram Mask Testing - Application Note
Eye-diagram mask testing is used in a broad range of today’s serial bus applications. Learn more about eye-diagram testing for higher speed buses such as the new CAN FD serial bus.

Application Note 2017-12-01

Measuring Intermodulation Distortion and RF Interference - App Brief
Learn about the essential steps for measuring intermodulation distortion and RF interference to ensure you meet spectrum emission standards

Application Note 2017-12-01

Exploring 5G Coexistence Scenarios Using a Flexible Hardware/Software Testbed - White Paper
This WP presents three sets of case studies and describes a flexible testbed which focus on the coexistence of 5G with legacy wireless signals, 5G with satellite signals and LTE with radar signals.

Application Note 2017-12-01

Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-12-01

Five Hints for Successful Measurements in Noise - Application Brief
This note discusses the top hints to improve measurement sensitivity and accuracy for small signals, especially those near the noise.

Application Note 2017-12-01

Three Hints for Better Noise Figure Measurements - Application Brief
This brief provides 3 hints that will help you improve measurement uncertainty, increase yield, and lower your costs when measuring noise figure performance on your device.

Application Note 2017-12-01

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-12-01

A Framework for Understanding: Deriving the Radar Range Equation - Application Note
Radar scans three-dimensional space to gather information about detected objects such as location, shape and speed. This entire process is described in this app note by the radar range equation.

Application Note 2017-12-01

Noise and Noise Figure: Improving and Simplifying Measurements - Application Brief
Noise is present in every electronic circuit. Noise disturbances can limit the overall performance of a wireless system, making noise measurements fundamental for all transmitter/receiver components.

Application Note 2017-12-01

PDF PDF 986 KB
Choosing the Best Passive and Active Oscilloscope Probes for Your Tasks - Application note
Selecting the right probe for your application is the first step toward making reliable oscilloscope measurements, and each probe has an application for which it performs best.

Application Note 2017-12-01

Understanding the Programming Interfaces of PXI Instruments - Application Note
This application note explains the differences between benchtop and PXI system architectures and programming interfaces to help you understand how to integrate PXI into benchtop systems.

Application Note 2017-12-01

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2017-12-01

New Pulse Analysis Techniques for Radar and EW - Application Note
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2017-12-01

Power Sources for Energy-Efficient High Input Voltage Telecommunications Equipment Development
Telecommunications equipment developers face several challenges when selecting power sources for test systems for developing new telecommunications equipment for network installations employing high voltage power distribution.

Application Note 2017-11-30

How to Easily Create an Arbitrary Waveform Without Programming - Application Note
Creating arbitrary waveforms on a modern function generator or arbitrary waveform generator (AWG) is not as difficult as you might think. Many engineers try to avoid creating arbitrary waveforms (arbs) at all costs. When they hear the word “arb“, they picture the tedious process of learning how to use some type of waveform software or, worse yet, having to write a program to generate a waveform and then remotely connecting to your AWG to upload the arb. With modern AWGs, creating an arbitrary waveform no longer has to be looked upon with doom and gloom.

Application Note 2017-11-27

PDF PDF 1.08 MB
8 Hints for Better Scope Probings - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2017-11-23

FFT and Pulsed RF Measurements with 3000T X-Series Oscilloscopes - Application Note
Explore how FFT math functions and spectral views on a 3000T X-Series oscilloscope help to bring digital and RF designs to market.

Application Note 2017-11-23

Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

Application Note 2017-11-21

PDF PDF 2.10 MB
Data Logging and Digitizing with a Digital Multimeter (DMM)—It’s about time! - Application Note
Now -- data logging and digitizing optimized in a DMM for optimized front panel operation rathern than remote programming and data transfer.

Application Note 2017-11-16

PDF PDF 349 KB
OTA Test for Millimeter-Wave 5G NR Devices and Systems - White Paper
This document discusses the challenges of over-the-air (OTA) testing and the associated test methods of millimeter-wave devices, including phased array technology, millimeter wave beamforming and beamsteering.

Application Note 2017-11-15

PDF PDF 1000 KB
OTA Test for Millimeter-Wave 5G NR Devices and Systems - White Paper
This document discusses the challenges of over-the-air (OTA) testing and the associated test methods of millimeter-wave devices, including phased array technology, millimeter wave beamforming and beamsteering.

Application Note 2017-11-15

PDF PDF 2.27 MB
Six Reasons Your New IoT Device Will Fail - Application Note
You’ve carefully tested your new IoT wireless device. What did you forget that could cause your device to work perfectly in the lab but fail in the real world?

Application Note 2017-11-13

Preserve Measurement Integrity of Your Test Equipment
Your peace of mind with maximum return on your investment

Application Note 2017-11-13

Overcome Your Test Challenges with the 33600A Series Trueform Waveform Generators - Application Note
Compendium of six 33600A Series Trueform waveform generator test challenge application briefs.

Application Note 2017-11-11

How to Select the Right Current Probe - Application Note
Oscilloscope current probes enable oscilloscopes to measure current, extending their use beyond just measuring voltage. Basically, current probes sense the current flowing through a conductor and convert it to a voltage that can be viewed and measured on an oscilloscope. There are many different types of current probes you can choose from and each probe has an area where it performs best. This application note will introduce you to the common types of current probe solutions, the fundamental principles, the advantages and limitations between each current probe type, and the practical consideration for using current probes for oscilloscope applications to make the most out of them.

Application Note 2017-11-09

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