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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

Nota de aplicação 2018-12-01

Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer - Application Note
This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

Nota de aplicação 2018-05-25

PDF PDF 2.07 MB
Compatibility of USB Power Sensors with Keysight Instruments – Application Note
Application note on "Compatibility of USB Power Sensors with Keysight Instruments".

Nota de aplicação 2018-05-18

Overcoming mmWave Challenges with Calibration
See the unique challenges of calibration at millimeter wave frequencies of 30-300 GHz.

Nota de aplicação 2018-05-17

PDF PDF 111 KB
4 Hints for Better Millimeter-wave Signal Analysis - White Paper
Just a decade ago it might have been hard to believe, but millimeter-frequency applications above 50 GHz are going mainstream. Wireless HD, 802.11ad wireless networking, 5G cellular, and automotive radar are high-profile examples of an important trend, supported by remarkable advances in semiconductor technology.

Nota de aplicação 2018-05-16

PDF PDF 5.27 MB
Integrate Collaborative Robot (Cobot) with i3070 ICT Test Platform - Application Note
Improve quality and efficiency of daily works on production line and reduce dependency on human operators by integrating Cobot (collaborative robot) with i3070 ICT test platform.

Nota de aplicação 2018-05-15

PDF PDF 3.18 MB
How Can Distributed Architecture Help mmWave Network Analysis? - White Paper
Learn ways to increase the frequency range of VNAs to test mmWave frequencies.

Nota de aplicação 2018-05-11

PDF PDF 3.23 MB
Key Technologies Needed to Advance Mission-Critical IoT - White Paper
Enabling the future of the mission-critical IoT requires more than just the right design, it requires the right tools to build a strong foundation

Nota de aplicação 2018-05-07

PDF PDF 3.34 MB
Accelerate Innovation by Improving Product Development Processes
Getting from concept to shipment as fast as possible is the goal of virtually every product development team. Business imperatives constantly pressure development teams to improve their simulation tools, cut design cycle times, and reduce test time to bring products to market faster. This white paper explores techniques and methodologies for improving product development processes in order to accelerate innovation.

Nota de aplicação 2018-05-03

PDF PDF 3.82 MB
5 New Features and Test Challenges for 802.11ax - White Paper
This white paper introduces the new 802.11ax standard which provides better spectral efficiency, capacity, and coverage in dense deployment scenarios as well as outdoor environments.

Nota de aplicação 2018-05-03

PDF PDF 4.31 MB
Ready to Test 5G Data Throughput - Article Reprint
This article, published in Microwave Journal, provides information on test methods and platforms for successful 5G development.

Nota de aplicação 2018-04-20

PDF PDF 3.27 MB
NB-IoT Success Hinges on Overcoming 3 Challenges - White Paper
Ensuring NB-IoT devices and systems are fully optimized for use in the industrial IoT requires critical attention to battery life, network coverage and cost

Nota de aplicação 2018-04-18

PDF PDF 2.30 MB
Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

Nota de aplicação 2018-04-12

PDF PDF 781 KB
Characterizing the Power in Complex Wireless Signals - Application Brief
Today’s digitally modulated signals contain multiple carriers, making power measurements very complex, technology-dependent, and time-consuming. See how to simplify your power measurements.

Nota de aplicação 2018-04-10

PDF PDF 1.76 MB
Making Fast and Accurate Power Measurements with Absolute Confidence - Application Brief
Learn how to quickly and accurately measure the power of digitally modulated signals so you can maximize the capacity of your system and improve the quality of communication.

Nota de aplicação 2018-04-10

PDF PDF 3.03 MB
Accelerate the development of Next Generation Non-Volatile Memory - Application Brief
You can accelerate the development of next generation non voltile memory; CX3300 series for visualizing the fast switching characteristics, B1500A for basic IV,CV,pulsed IV and reliability testing.

Nota de aplicação 2018-04-09

PDF PDF 774 KB
A Flexible Test Solution for 2.4 GHz ZigBee Transmitter and Receivers - Application Note
This application note explains a low cost measurement solution for 2.4 GHz ZigBee O-QPSK signal generation for receiver test and signal analysis for transmitter test

Nota de aplicação 2018-04-03

Making Fast Pass/Fail Testing with Keysight N9320B Spectrum Analyzer - Application Note
This application note describes the advanced window limit feature in the N9320B spectrum analyzer and demonstrates how to use it to easily make the Pass/Fail determination on measurement results.

Nota de aplicação 2018-04-03

Accelerate Debug and Evaluation of IoT Devices by Current Profile Analysis
Solve the IoT device development challenges and dramatically improve the development efficiency and quality with current profile measurement with a Device Current Waveform Analyzer.

Nota de aplicação 2018-03-26

PDF PDF
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Nota de aplicação 2018-03-20

Power Consumption Solutions for Battery-Operated Medical Devices - Application Brief
This application brief is to describe different type of Keysight's solutions in measuring power consumption for battery operated medical devices.

Nota de aplicação 2018-03-20

Network analyzer evaluation of RF amplifier using 2961A/62A - Application Brief
This 2-page introduces the Keysight B2961A/62A Power Source and how to perform MMIC RF amplifier S-parameter measurements using it as the DC bias source.

Nota de aplicação 2018-03-15

PDF PDF 1.19 MB
Measuring Insulating Material Resistivity Using the B2985A/87A - Application Note
This application note explains how easy it is to make an resistivity measurement using the B2980A Series.

Nota de aplicação 2018-03-15

Low-Cost Power Sources Meet Advanced ADC and VCO Characterization Requirements – Application Note
This application note shows how the low-cost Keysight B2961A/B2962A 6.5 digit power sources can characterize 14-bit ADC circuits and VCOs requiring a 10 microvolt RMS noise floor.

Nota de aplicação 2018-03-15

PDF PDF 3.08 MB
Making Low Resistance Measurements Using the B2961A and 34420A - Application Brief
This Application Brief introduces the B2961A/ B2962A Power Source combined with the 34420A which satisfies the requirement on the precise low resistance measurements.

Nota de aplicação 2018-03-15

PDF PDF 960 KB

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