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Analysis of Test Time in Electronics Development Workflows - White Paper
In this paper, we explore three tasks that distract test engineers from their primary job function and discuss how to handle them more quickly and efficiently.

Nota de aplicação 2019-01-07

PDF PDF 2.46 MB
Test Orientation of Polarized Capacitor in i3070 ICT Test Platform - Application Note
Reversing the voltage on the polarized capacitor could be hazardous, resulting in explosion or fire. It is crucial to detect wrongly oriented polarized capacitor and get it fixed as early as possible.

Nota de aplicação 2019-01-03

PDF PDF 310 KB
Metrology Grade Measurement Challenges
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

Nota de aplicação 2018-12-20

PDF PDF
Metrology-Grade Measurement Challenges - Application Note
This application note analyzes the sources that contribute to measurement uncertainties and summarizes how to achieve the most accurate measurement results with the Keysight N5531X.

Nota de aplicação 2018-12-20

PDF PDF 819 KB
Calculating Real Time S-Parameter and Power Uncertainty - Application Note
This application note shows how to use Keysight’s innovative real time uncertainty VNA software option (S93015B) to determine the uncertainty of your S-parameter and power measurements.

Nota de aplicação 2018-12-19

PDF PDF 1.39 MB
Understanding Measurement Risk
This paper explains probability density functions, drawing on Monte Carlo simulation to demonstrate the relationship between a device’s true value and the corresponding measured value.

Nota de aplicação 2018-12-04

PDF PDF
Precision Validation, Maintenance and Repair of Satellite Earth Stations
This application note describes breakthrough technologies that have transformed the way systems can be tested in the field while providing higher performance, improved accuracy, capability and frequency coverage to 50 GHz

Nota de aplicação 2018-12-01

PDF PDF
Testing is Critical for Adoption of Autonomous Vehicles - White Paper
The autonomous vehicle combines various connected car technologies such as sensors, computers, and software which need rigorous testing to ensure conformance to safety and performance standards.

Nota de aplicação 2018-11-28

PDF PDF 5.47 MB
DDR5 - Full Speed Ahead to 400GE - White Paper
As data center operators migrate their networks to 400GE, they also need to plan for the next generation of high-speed computing interfaces. Peripheral Component Interconnect Express (PCI Express® or PCIe®) expansion bus will move from PCIe 4.0 to PCIe 5.0, and double date rate (DDR) memory will move from DDR4 to DDR5.

Nota de aplicação 2018-11-28

PDF PDF 1.44 MB
Got Python? Unlock the Future of Test Automation Quickly- White Paper
Test engineers can accelerate their workflow by automating their test plans. Python, integrated with other programming languages, helps test engineers began to automate their tests more quickly.

Nota de aplicação 2018-11-27

PDF PDF 4.34 MB
When Homegrown Test Software Slows Product - White Paper
Homegrown test software can no longer keep pace with rapid product development cycles. This paper discusses the ways homegrown software slows down hardware testing, and how modern test software environments can help.

Nota de aplicação 2018-11-27

PDF PDF 4.74 MB
High Attenuation Measurement of Step Attenuators
This paper introduces a solution for high attenuation measurement of step attenuators, based on the cascaded 2-port network and S-parameter theory.

Nota de aplicação 2018-11-26

PDF PDF
Bit Error Rate or Bit Error Ratio? - White Paper
The bit error ratio is the number of bit errors divided by the total number of bits transferred during a specific time interval. Bit error rate is the number of bit errors per unit time. The bit error rate gives you an indication of your system’s performance relative to bits transferred vs bits received.

Nota de aplicação 2018-11-26

PDF PDF 926 KB
Accelerate debug and evaluation of IoT devices by current profile analysis - Application Note
You can solve the IoT device development challenges and dramatically improve the development efficiency and quality with current profile measurement with a Device Current Waveform Analyzer.

Nota de aplicação 2018-11-22

Evolution of High-Speed Computing Interfaces - White Paper
As data center operators begin begin to migrate from 100GE to 400GE, they need a migration plan that will take them to the next-generation of high-speed computing interfaces (e.g., PCIe or DDR).

Nota de aplicação 2018-11-06

PDF PDF 3.47 MB
Improving Amplitude Accuracy with Next-Generation Signal Generators - White Paper
This whitepaper will help you improve the amplitude accuracy of your measurements that involve signal generators.

Nota de aplicação 2018-11-02

PDF PDF 2.44 MB
Improve Voltage Regulation Using Remote Sense - White Paper
Learn how to use remote sense to improve load regulation. Most measurements assume steady load regulation.

Nota de aplicação 2018-11-02

PDF PDF 1.01 MB
Field Testing in 5G NR - White Paper

Nota de aplicação 2018-11-01

PDF PDF 2.63 MB
Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Nota de aplicação 2018-10-31

Get It Right Every Time with Pre-Compliance Testing - White Paper
Understand how pre-compliance can help you pass final compliance testing and get your product to market on time in a low-cost, low-risk manner.

Nota de aplicação 2018-10-31

PDF PDF 1.43 MB
Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

Nota de aplicação 2018-10-30

PDF PDF 1.88 MB
Making Noise in RF Receivers - White Paper
In this white paper, you will learn what the AWGN and phase noise are and how to correctly and accurately apply the noise to your desired signal for receiver performance test.

Nota de aplicação 2018-10-30

PDF PDF 2.14 MB
Comparisons: DAQ970A to 34970A and 34972A Data Acquisition System - White Paper
This paper provides a comparison of the next generation DAQ970A and, the 34970A/34972A Data Acquisition Systems.

Nota de aplicação 2018-10-30

Laser Diode Characterization and Its Challenges
This white paper discusses the laser diode characterization and the challenges the test engineer faces.

Nota de aplicação 2018-10-29

Why Autonomous Driving Systems Will Require Automotive Ethernet - White Paper
Automotive Ethernet provides the new backbone for faster automotive networks to serve autonomous vehicles and advanced driver assistance systems (ADAS) which need higher bandwidth and lower latency.

Nota de aplicação 2018-10-25

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