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是德科技表征 28 Gb/s 收发信机的技巧和先进技术
是德科技表征 28 Gb/s 收发信机的技巧和先进技术

文章 2017-11-29

PDF PDF 3.27 MB
是德科技简化军用变频器表征的新技术
是德科技简化军用变频器表征的新技术

文章 2017-11-28

PDF PDF 1.27 MB
是德科技 边界扫描测试的缺陷范围: 通过边界扫描测试意味着什么 ?
是德科技 边界扫描测试的缺陷范围: 通过边界扫描测试意味着什么 ?

文章 2017-11-27

PDF PDF 1.16 MB
是德科技 测试范围: 通过电路板测试时意味着什么?
是德科技 测试范围: 通过电路板测试时意味着什么?

文章 2017-11-27

PDF PDF 866 KB
是德科技通过战略资产管理降低测试成本
是德科技通过战略资产管理降低测试成本

文章 2017-11-25

PDF PDF 1006 KB
是德科技相位噪声、幅度和 TOI 测量误差 再版文章
是德科技相位噪声、幅度和 TOI 测量误差 再版文章

文章 2017-11-24

PDF PDF 890 KB
是德科技借助校准优化关键测量性能
是德科技借助校准优化关键测量性能

文章 2017-11-24

PDF PDF 2.25 MB
是德科技一个灵活的 5G 波形及超宽带信号生成和分析测试系统
是德科技一个灵活的 5G 波形及超宽带信号生成和分析测试系统

文章 2017-11-23

PDF PDF 4.83 MB
The Difference Between Digitizers and Oscilloscopes for Wideband Measurements

文章 2017-09-20

Full Function Oscilloscopes for ATE Systems

文章 2017-09-20

5G: How Do You Test for a Standard that Doesn’t Even Exist?
5G NR is ascending rapidly as the 5G technology of choice, but it turns out lots can be done to get ready as it goes through the formal 3GPP channels.

文章 2017-09-19

‘The Push and Pull of Technology Solutions for 5G’ Highlights WAMICON 2017
The WAMICON 2017 Panel Session on 5G.

文章 2017-09-18

Make accurate and fast design decisions with data analytics
Make accurate and fast design decisions with data analytics

文章 2017-08-25

Environment Aware Virtual Vehicle-To-Vehicle System Design
ECN article by Wilfredo Rivas-Torres, PhD, Sr. EDA Application Engineer and Wenyan Ding, Sr. EDA EM Application Engineer at Keysight Technologies.

文章 2017-08-08

Customizing Tables Just Got Easier with a New Python Module for MQA Software
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

文章 2017-07-12

Applying a Very Wide-Bandwidth Millimeter-Wave Testbed to Power Amplifier DPD
5G designs that use wide-bandwidth digital modulation require new test technologies. Our latest 5G whitepaper presents a testbed for generating and analyzing millimeter-wave signals with 8 GHz bandwidth.

文章 2017-06-06

Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

文章 2017-05-31

S-parameters: Signal Integrity Analysis in the Blink of an Eye
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

文章 2017-05-30

The Melting Trace Paradox
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

文章 2017-05-24

Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

文章 2017-05-08

PDF PDF 624 KB
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

文章 2017-05-04

Villanova Professor and Students “Bang Heads” for Nanotechnology Research
Dr. Gang Feng, Associate Professor in the Department of Mechanical Engineering at Villanova University, is using advanced materials measurement technology to understand concussions, energy storage, and more.

文章 2017-04-21

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

文章 2017-04-01

PDF PDF 860 KB
Ensuring High Signal Quality in PCIe Gen3 Channels
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

文章 2017-03-14

Internet of Things (IoT) Teaching Solution – IoT Systems Design

文章 2017-03-14

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