Technical Support
Electronic Measurement
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Generators, Sources, Power Products
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Source Measure Units
- B1500A Semiconductor Device Parameter Analyzer and Measurement Modules (5)
- B2900A Series Precision Source/Measure Units (SMU) (4)
- Modular SMU Series (E5270B, E5260A, E5262A and E5263A) (2)
- N6785A Source/Measure Unit for Battery Drain Analysis, Multiple Ranges, 80 W, Double-wide (1)
- N6786A Source/Measure Unit for Functional Test, Multiple Ranges, 80 W, Double-wide (1)
- N6781A 2-Quadrant Source/Measure Unit for Battery Drain Analysis, 20 V, ±1 A or 6 V, ±3 A, 20 W (2)
- N6782A 2-Quadrant Source/Measure Unit for Functional Test, 20 V, ±1 A or 6 V, ±3 A, 20 W (1)
- N6784A 4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A or ±6 V, ±3 A, 20 W (1)
- N6705C DC Power Analyzer, Modular, 600 W, 4 Slots (4)
- B1505A Power Device Analyzer / Curve Tracer (2)
- E5260A IV Analyzer / 8 Slot Precision Measurement Mainframe (2)
- E5262A 2 Channel IV Analyzer / Source Monitor Unit (Two Medium Power SMUs) (1)
- E5270B Precision IV Analyzer / 8 Slot Precision Measurement Mainframe (2)
- E5263A 2 Channel IV Analyzer / Source Monitor Unit (High Power SMU and Medium Power SMU) (1)
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Source Measure Units
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Generators, Sources, Power Products
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Solving IoT Device Test Challenges Webinar Series
Webcast series
Webcast |
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Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.
Seminar Materials 2016-12-21 |
PDF
2.35 MB
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DC Power supply fundamentals to get the most out of your applications
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.
Webcast - recorded |
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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012
Webcast - recorded |
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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011
Webcast - recorded |
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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.
Webcast - recorded |
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Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.
Webcast - recorded |
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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.
Webcast - recorded |
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Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.
Webcast - recorded |
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