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Keysight Technologies Accelerates Design Workflows with New PathWave Design 2020 Software Suite
Keysight announces PathWave Design 2020, which includes the latest releases of Keysight's electronic design automation software to accelerate design workflows for radio frequency (RF) and microwave, 5G, and automotive design engineers.

Materiais para imprensa 2019-06-03

Improved Data Sharing Across Product Development Workflow Would Improve Time to Market
Keysight Survey Reveals Improved Data Sharing Across the Entire Product Development Workflow Would Improve Time to Market for Electronic Devices.

Materiais para imprensa 2019-04-08

Keysight Collaborates with Leading Research Centers to Reach Milestone in Low-Freq. Noise Measurment
Keysight announces it has reached a new milestone in low-frequency noise measurements through its work with leading research centers in Europe, Middle East, Africa and India (EMEAI). Using the new Advanced Low-Frequency Noise Analyzer (A-LFNA) and WaferPro Express software, designers can now measure noise more accurately in an even broader range of electronic devices.

Materiais para imprensa 2018-02-05

Equipping for employment with Keysight Technologies
Cardiff University’s School of Engineering to collaborate with Keysight Technologies to increase the range of hardware utilized by students and prepare them for a career in industry. US-based Keysight will provide students full access to industry-leading software tools such as Advanced Design System (ADS), SystemVue, EMPro, Genesys, IC-CAP, and GoldenGate.

Materiais para imprensa 2016-08-30

Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

Materiais para imprensa 2016-08-04

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

Materiais para imprensa 2016-07-19

Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

Materiais para imprensa 2016-04-22

Keysight Unveils Latest Release of its Device Modeling and Characterization Software Tool Suite
Keysight announces the newest release of its industry-leading device modeling and characterization software suite: IC-CAP 2016, MBP 2016, and MQA 2016.

Materiais para imprensa 2016-02-22

Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

Materiais para imprensa 2016-01-25

Leti to collaborate with Keysight Technologies to enable expansion of FD-SOI technology
CEA-Leti announces it has signed an agreement with Keysight Technologies, a device-modeling software supplier, to adapt Leti’s UTSOI extraction flow methodology within Keysight’s device modeling solutions for high-volume SPICE model generation.

Materiais para imprensa 2015-12-08

Keysight Selects Fraunhofer EMFT as its First Low-Frequency Noise Reference Center for EMEAI
Keysight announces that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).

Materiais para imprensa 2015-11-04

Keysight Technologies to Demonstrate Latest Simulation Software Solutions at CSICS
Keysight announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and electro-thermal simulation software solutions at the Compound Semiconductor IC Symposium (CSICS 2015), Sheraton New Orleans, Booth 601, New Orleans, Oct. 11-14.

Materiais para imprensa 2015-10-08

Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

Materiais para imprensa 2015-08-20

Keysight Technologies to Demonstrate Latest EDA Software Solutions at 52nd Annual DAC
Keysight announces it will demonstrate its latest electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications at the Design Automation Conference (DAC) 2015, Booth 2020, San Francisco, June 8-10.

Materiais para imprensa 2015-06-08

Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

Materiais para imprensa 2015-05-11

Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

Materiais para imprensa 2015-04-28

Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

Materiais para imprensa 2015-04-16

Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Materiais para imprensa 2014-06-18

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Materiais para imprensa 2014-06-03

Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Materiais para imprensa 2014-03-13

Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

Materiais para imprensa 2014-02-11

MBP and MQA Adopted by Microchip Technology for PDK Creation, Modification, Validation
Agilent Technologies announces that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA's Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design kits, modify external foundry libraries, and validate supported devices from internal and external sources.

Materiais para imprensa 2013-12-09

Agilent Technologies Announces RF and Microwave Industry-Ready Student Certification Program
Agilent announces the RF and Microwave Industry-Ready Student Certification program, developed in conjunction with the University of South Florida, a founding partner.

Materiais para imprensa 2013-10-28

Agilent's MBP and MQA Software Adopted by Shanghai Consortia for Advanced Device Modeling
Agilent announces that the Shanghai Integrated Circuit Research and Development Center, a nonprofit research consortia dedicated to advancing the microelectronics industry in China, is using Agilent's Model Builder Program and Model Quality Assurance software for model extraction and verification at 45-nm process nodes.

Materiais para imprensa 2013-07-09

Agilent Technologies Introduces Industry’s First Solution for Modeling Power Devices
Agilent announces that IC-CAP has been enhanced to provide full support for the B1505A Power Device Analyzer/Curve Tracer, including the instrument’s new high-power, high-current source monitor unit modules.

Materiais para imprensa 2013-06-24

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