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Practical Temperature Measurements - Application Note
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2019-11-14

PDF PDF 6.20 MB
Effective Monitoring and Streamline Testing Using a DAQ - White Paper
Learn how to choose the DAQ system that will work best for your project or environment, whether it is a centralized or distributed DAQ configuration setup. Use the DAQ switching control system to streamline your test process.

Application Note 2019-10-19

PDF PDF 3.11 MB
34980A Measurements Made Easy
This document includes examples with the few steps needed to make measurements using the 34980A's 1) front panel, 2) built-in web interface, and 3) Command Expert software.

Application Note 2019-10-04

PDF PDF 5.32 MB
Recognizing and Reducing Data Acquisition Switching Transients - White Paper
Low impedance sources can produce large and fast current transients when switching; creating problems with adjacent channels, transients in the ground circuit that upset digital logic connected to the DUT, or causing the switch unit to reset or hang. This application note describes several techniques to reduce these switching transients.

Application Note 2019-09-27

PDF PDF 3.12 MB
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Application Note 2018-03-20

Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2017-12-05

Temperature Measurement Solution for Solar Cell and Module Testing - Application Note
This application note highlights key products that can be used to help you effectively and efficiently test solar cells and solar modules, and ensure that they are able to perform optimally.

Application Note 2017-10-25

Optimize Burn-in Test with the 34980A Multifunction Switch/Measure Unit - Application Note
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

Application Note 2014-08-03

PDF PDF 378 KB
Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

Comparing the Keysight 34980A and PXI for Switch Measurement Applications
This application note provides a comparison between PXI cardcage solutions and a combined system, the Keysight 34980A switch/measure unit, so you can determine which platform best meets your needs for electronic functional test and data acquisition.

Application Note 2012-04-27

Making Good Thermocouple Measurements
This application note provides tips for optimizing thermocouple measurements in a noisy environment.

Application Note 2012-01-26

PDF PDF 552 KB
Selecting the Correct Temperature Sensor for Your Application
This application note provides tips for selecting the correct temperature sensor.

Application Note 2012-01-25

PDF PDF 543 KB
Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

PDF PDF 486 KB
Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

PDF PDF 77 KB
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

High-Speed Scanning with the Keysight 34980A Multifunction Switch/Measure Mainframe and Modules
This application note explores components that affect the speed in a system. It also gives a breakdown of each component with SCPI language examples of how to set up the instrument for fast measurements that best fit your specific application.

Application Note 2008-11-26

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

PDF PDF 456 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

How to Verify the Functionality of Your 34980A Switch Modules
This application note outlines the benefits of the Y1131A and demonstrates its effectiveness using a 34980A multifunction switch/measurement unit.

Application Note 2006-11-06

PDF PDF 220 KB
Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Application Note 2006-03-23

Optimizing Test System Throughput, Cost and Integration Time Using LAN-Based Instruments
This application note explains how to minimize latency when using LAN to control your instrumentation and explains why LAN is an excellent choice for cost savings and ease of integration.

Application Note 2006-01-09

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Application Note 2005-06-29

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