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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

アプリケーション・ノート 2019-04-25

Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

アプリケーション・ノート 2019-04-03

TDECQ Part II, Manufacturing Test Recommendations - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

アプリケーション・ノート 2019-03-29

PDF PDF 4.21 MB
TDECQ Testing or PAM4 Optical Transceivers - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

アプリケーション・ノート 2019-03-26

PDF PDF 2.70 MB
Everything You Need to Know About Coherent Optical Modulation - Application Compendium
This is an introduction to the fundamentals of coherent optical modulation techniques.

アプリケーション・ノート 2019-03-25

PDF PDF 12.70 MB
Residual BER - White Paper
Residual BER budgets are essential for maintaining the efficiency of your transmit and receive systems. The most important contribution of residual BER pre¬diction is that it demonstrates mathematical relationships between BER performance and relates key analog metrics. These metrics are used to specify components to digital bit errors, which are used to evaluate systems. This bridges the gap between the network’s service metric and radio engineers’ analog component metrics.

アプリケーション・ノート 2019-02-20

Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

アプリケーション・ノート 2018-10-30

Gain Compression Measurement with Lightwave Component Analyzer
This application note is intended to assist Gain Compression Measurement using the N437xD/E Lightwave Component Analyzer.

アプリケーション・ノート 2018-10-17

PDF PDF 2.38 MB
Calibrating Optical Paths in Spectral Test Station Using N7700A IL/PDL SW Engine - Application Note
Optical IL and PDL of a device relate the signal output from the device with the input signal, previously recorded or calibrated as reference measurement. For best results, the reference is repeated periodically and made with the same settings to be used on the device. By using IL de-embedding, the reference data can be applied to multiple optical paths without repeating at each port.

アプリケーション・ノート 2018-10-10

PDF PDF 213 KB
Pulse, Pattern, Function, and Arbitrary Waveform Generators - Application Note
This Keysight family of pulse, pattern, function and arbitrary waveform generators can help you verify and characterize digital or analog systems, products, and components.

アプリケーション・ノート 2018-09-17

PDF PDF 2.06 MB
Error Analysis of PAM4 Signals - Application Brief
Increasing demands for a connected world with instant data access continues to drive Ethernet, 64G fiber channel, CEI-56G and other next generation data center networking links.

アプリケーション・ノート 2018-08-17

Wafer and Chip-Level Optical Test Solving Polarization Alignment with the IL/PDL Test System
Optical testing of wafer and chips for photonic integrated circuits requires attention to the polarization of the input light. This is supported by the N7700A application software.

アプリケーション・ノート 2018-08-16

PDF PDF 798 KB
On-Wafer Testing of Opto-Electronic Components Using the Lightwave Component Analyzers - Rev.2
This document describes the principles of on-wafer measurements of opto-electronic components using a Lightwave Component Analyzer and provides step-by-step instructions needed to set up a calibration kit prior to the on-wafer calibration, to perform the electronic calibration and to deembed the wafer probes.

アプリケーション・ノート 2018-07-03

PDF PDF 6.91 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

アプリケーション・ノート 2018-06-12

キーサイト 光基本測定器群 ラインナップ
キーサイトの光基本測定器(光源、パワーセンサ、アッテネータ、スイッチなど)の代表性能を一覧にしたものです。

アプリケーション・ノート 2018-04-01

M8195A, M8196A AWG リモート制御入門ガイド
M8195A/M8196Aシリーズ任意波形発生器(AWG)のリモート制御入門ガイドです。

アプリケーション・ノート 2018-03-12

BER Measurement Using Real-Time Oscilloscope Controlled from M8070A - Application Note
The scope of this application note is to explain the BER measurement procedure using the M8045A pattern generator and DSAZ634A oscilloscope when controlled from M8070A system software.

アプリケーション・ノート 2017-12-13

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

アプリケーション・ノート 2017-12-05

Measuring Polarization Dependent Loss of Passive Optical Components - Application Note
A new document on the methods of characterizing passive optical components.

アプリケーション・ノート 2017-12-01

PDF PDF 3.36 MB
Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

アプリケーション・ノート 2017-12-01

PDF PDF 2.26 MB
Coherent Optical Communications Test Challenges - Application Note
This Application Note focuses on the test and troubleshooting of next-generation fiber-based communication systems tasked with supporting 100 Gb/s, 400 Gb/s data rates and higher.

アプリケーション・ノート 2017-08-31

N778xBシリーズ リモート制御入門ガイド
偏波アナライザ・コントローラ製品群(N778xB)を外部PC よりリモートで制御するための手順を紹介します。

アプリケーション・ノート 2017-07-03

光パワーセンサーモジュール アナログ出力参考特性
Keysight光パワーセンサモジュールのアナログ電圧出力端子の参考特性です。

アプリケーション・ノート 2017-05-22

マルチ・ウェーブレングス・メータ(光波長計) セレクション・ガイド
マルチ・ウェーブレングス・メータ(光波長計) セレクション・ガイド

アプリケーション・ノート 2017-05-11

N437x Lightwave Component Analyzer Automation – Getting Started with SCPI - Application Note
The Keysight N437x Series Lightwave Component Analyzer (LCA) measures the transfer function of electrical to electrical, electrical to optical, optical to electrical, and optical to optical components

アプリケーション・ノート 2017-02-23

PDF PDF 1.81 MB

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