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殘餘誤碼率(BER)
殘餘 BER 預算是維持您的發射及接收系統效率的關鍵要素。預測殘餘 BER 的最大作用在於顯示 BER 效能與相關重要類比指標之間的關聯性。這些指標可用於指定數位誤碼的元件,進而用於系統評估。如此一來,即可弭平網路服務指標與射頻工程師的類比元件指標之間的落差。

應用手冊 2019-05-29

PAM4 信號誤差分析 - 應用說明
即時資料存取的需求與日俱增,驅動乙太網路、64G 光纖通道、CEI-56G 和其他下一代資料中心網路鏈路技術發展。

應用手冊 2019-05-27

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

應用手冊 2019-04-25

Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

應用手冊 2019-04-03

TDECQ Part II, Manufacturing Test Recommendations - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

應用手冊 2019-03-29

PDF PDF 4.21 MB
TDECQ Testing or PAM4 Optical Transceivers - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

應用手冊 2019-03-26

PDF PDF 2.70 MB
Everything You Need to Know About Coherent Optical Modulation - Application Compendium
This is an introduction to the fundamentals of coherent optical modulation techniques.

應用手冊 2019-03-25

PDF PDF 12.70 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

應用手冊 2019-01-29

正向誤差修正解決方案
若資料速率偏高、信號較小且通道壓縮,則會因為通訊通道可靠度不足或雜訊太多而產生編碼錯誤。例如,每隔幾天就會隨機遺失資料的硬碟,或是只能在天空晴朗時連線的手機,都毫無用處。此外,當衛星繞著行星運轉並將資訊傳回地球時,它產生的解碼錯誤多到必須重傳,並且造成長達 5 個小時的延遲。編碼理論就是為了解決這些錯誤而發明的,前向誤差修正(FEC)或通道編碼技術可顯著減少這些資料傳輸錯誤。

應用手冊 2019-01-22

Gain Compression Measurement with Lightwave Component Analyzer
This application note is intended to assist Gain Compression Measurement using the N437xD/E Lightwave Component Analyzer.

應用手冊 2018-10-17

PDF PDF 2.38 MB
Calibrating Optical Paths in Spectral Test Station Using N7700A IL/PDL SW Engine - Application Note
Optical IL and PDL of a device relate the signal output from the device with the input signal, previously recorded or calibrated as reference measurement. For best results, the reference is repeated periodically and made with the same settings to be used on the device. By using IL de-embedding, the reference data can be applied to multiple optical paths without repeating at each port.

應用手冊 2018-10-10

PDF PDF 213 KB
Pulse, Pattern, Function, and Arbitrary Waveform Generators - Application Note
This Keysight family of pulse, pattern, function and arbitrary waveform generators can help you verify and characterize digital or analog systems, products, and components.

應用手冊 2018-09-17

PDF PDF 2.06 MB
使用由 M8070A 控制的即時示波器進行 BER 量測 - 應用說明
本應用說明旨在介紹,在 BER(誤碼率)測試解決方案 M8070A 系統軟體控制下,使用 M8045A 碼型產生器和 DSAZ634A Infiniium Z 系列示波器執行之 BER 量測程序。

應用手冊 2018-09-04

Wafer and Chip-Level Optical Test Solving Polarization Alignment with the IL/PDL Test System
Optical testing of wafer and chips for photonic integrated circuits requires attention to the polarization of the input light. This is supported by the N7700A application software.

應用手冊 2018-08-16

PDF PDF 798 KB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

應用手冊 2018-07-25

Wavelength and Polarization Dependence of 100G-LR4 Components - Application Note
This application note describes our solution based on the new 81606A or 81608A tunable lasers, for measuring the wavelength and polarization dependence of components for 100G optical links that multiplex multiple wavelengths. Both passive fiber optic components and receiver optical subassemblies are addressed.

應用手冊 2018-07-13

On-Wafer Testing of Opto-Electronic Components Using the Lightwave Component Analyzers - Rev.2
This document describes the principles of on-wafer measurements of opto-electronic components using a Lightwave Component Analyzer and provides step-by-step instructions needed to set up a calibration kit prior to the on-wafer calibration, to perform the electronic calibration and to deembed the wafer probes.

應用手冊 2018-07-03

PDF PDF 6.91 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

應用手冊 2018-06-12

同調光通信測試挑戰 - 應用說明
本應用說明著重於介紹下一代光通信系統的測試和除錯需求,以因應海量資料時代的來臨。

應用手冊 2018-05-18

高精準度時域反射(TDR)- 應用說明
時域反射計(TDR)是一項成熟技術,可用於驗證元件、互連和傳輸線路中,信號路徑的阻抗和品質。

應用手冊 2018-05-18

8 大秘訣幫助您精準執行示波器探測 - 應用說明
本應用說明介紹 8 個重要秘訣,協助您為自己的應用選擇適合的探棒,進而提高示波器探測能力。

應用手冊 2018-04-16

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

應用手冊 2017-12-05

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

應用手冊 2017-12-01

PDF PDF 2.26 MB
Measuring Polarization Dependent Loss of Passive Optical Components - Application Note
A new document on the methods of characterizing passive optical components.

應用手冊 2017-12-01

PDF PDF 3.36 MB
Understanding the Right Metrics to use when Evaluating Oscilloscope Quality - Application Note
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

應用手冊 2017-12-01

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