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RF GaN Device Models and Extraction Techniques
This presentation was recorded at IMS 2019. The Workshop covers the market trends, technology and challenges in using Gallium Nitride (GaN) devices.

Demo 2019-08-30

IIT Kanpur Develops ASM-HEMT Model for GaN Transistors Using Parametric and Device Characterization
The India Institute of Technology Kanpur creates an accurate and simple compact SPICE model and introduces an industry-grade model for power electronics and RF applications.

Case Study 2019-07-10

PDF PDF 1.90 MB
PathWave Design Software
Accelerate your design cycle with integrated design and simulation software. Know your performance under simulated real-world conditions before you build.

Brochure 2019-07-01

PDF PDF 13.23 MB
Transforming Engineering Education with Cutting-Edge Keysight Labs
Keysight is committed to continue with innovation that will enable researchers, educators, and students.

Case Study 2019-06-25

PDF PDF 2.03 MB
Keysight Technologies Accelerates Design Workflows with New PathWave Design 2020 Software Suite
Keysight announces PathWave Design 2020, which includes the latest releases of Keysight's electronic design automation software to accelerate design workflows for radio frequency (RF) and microwave, 5G, and automotive design engineers.

Press Materials 2019-06-03

You Dream. We Test. Corporate Brochure
Get to know Keysight Technologies: who we are, what we do and how we accelerate innovation to connect and secure the world.

Brochure 2019-04-09

PDF PDF 27 MB
Improved Data Sharing Across Product Development Workflow Would Improve Time to Market
Keysight Survey Reveals Improved Data Sharing Across the Entire Product Development Workflow Would Improve Time to Market for Electronic Devices.

Press Materials 2019-04-08

The Future of Design and Simulation Workflows
While design engineers are facing many challenges, the most pressing are in the areas of data sharing and analysis. This report underscores the need for a new way to connect design and test data across the workflow.

Application Note 2019-02-22

Tips for Preventing Damage to Communication Test Sets - Technical Overview
Tips for Preventing Damage to Communication Test Sets

Application Note 2019-02-21

Simplifying the Economics of Test and Repair in Both the Factory and Depot - White Paper
This paper explores how to calculate the cost-of-test.

Application Note 2019-02-21

PDF PDF 1.97 MB
5G NR Device Manufacturer Doubles Test Capacity
A leading 5G new radio device manufacturer doubles text capacity with zero additional CapEx through Keysight Financial Services.

Case Study 2019-02-19

PDF PDF 3.46 MB
Keysight Infoline Support Portal - Brochure
Keysight Infoline Support Portal − free. A customer's personalized and secure window into Keysight calibration and repair services.

Brochure 2018-05-24

PDF PDF 3.07 MB
Keysight Infoline Support Portal - Flyer
2-page flyer that explains Keysight Infoline Asset Management

Brochure 2018-05-23

PDF PDF 1.35 MB
Introduction to Wafer-level Measurement Solutions (WMS) – WMS Series Part 1 of 6
In this video we present an overview of the hardware and software used for making wafer level measurements up to 110 GHz.This is part of a 6 part video series on wafer level measurements.

Demo 2018-05-09

Set up a measurement project with WaferPro Express – WMS Series Part 6 of 6
In this video, we will set up a new project in WaferPro Express, defining our measurements on our desired devices.

Demo 2018-05-09

Configure WaferPro Express for measurements and probing – WMS Series Part 3 of 6
In this video, we will show you how to connect WaferPro Express to the instruments and then to the Velox prober control software.

Demo 2018-05-09

Perform on-wafer RF calibration – WMS Series Part 5 of 6
In this video, we demonstrate an on wafer network analyzer calibration to 50 GHz.

Demo 2018-05-09

Automated on-wafer millimeter wave measurements demo – WMS Series Part 2 of 6
In this demo, we measure S-parameters on a GaAs MESFET and capacitor structure in an automated fashion across the wafer. This leverages a lot of pieces together that will be explained in later videos: • configuring the WaferPro Express software to drive other instruments and wafer prober software • wafer alignment • RF S-parameter calibration • WaferPro Express project set up

Demo 2018-05-09

Align wafer probes and create a wafer map – WMS Series Part 4 of 6
In this video, we demonstrate how to align a wafer to the reference plane of our probing system using the auto align feature in Velox. We will then generate a wafer map.

Demo 2018-05-09

Vector Network Analyzer (VNA) Product Training eLearning Program - Course Overview
Course Overview that provides an overview for the vector network analyzer product training eLearning program. Provides a brief outline of content for each eLearning module.

Brochure 2018-04-20

PDF PDF 1.43 MB
Power Electronics Device Modeling
Power Electronics Model Generator (PEMG) software provides a comprehensive modeling solution for discrete power electronics devices, with an intuitive UI and the latest, most powerful models.

Technical Overview 2018-03-23

Infoline Instrument Management Security, Reliability and Privacy - Product Fact Sheet
Trust in the security, reliability and privacy of Keysight Infoline Instrument Management application.

Brochure 2018-03-19

PDF PDF 171 KB
Test Automation Platform (TAP) User eLearning Program - Course Overview
Course Overview that provides an overview for the test automation platform (TAP) user eLearning program. Provides a brief outline of content for each eLearning module.

Brochure 2018-02-26

PDF PDF 418 KB
Test Asset Optimization Services - Utilization and Health Services - Brochure
Let our professional services team and PathWave Asset Advisor - Utilization and Health application drive down your cost of test.

Brochure 2018-02-06

PDF PDF 502 KB
Test Asset Optimization Services - Loan Pool Services - Brochure
Let our professional services team and PathWave Asset Advisor - Loan Pool application manage your asset pool to reduce capital expenses and drive utilization improvements.

Brochure 2018-02-06

PDF PDF 279 KB

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