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International Microwave Symposium (IMS) 2017
June 4 - 9, 2017; Honolulu, Hawaii

トレードショー

Automating Everyday Test and Measurement Tasks in Minutes
Live broadcast July 19, 2017; 10am PT / 1pm ET

ウェブセミナ

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

セミナのプレゼンテーション 2017-08-14

Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

セミナのプレゼンテーション 2017-08-10

PDF PDF 2.41 MB
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

セミナのプレゼンテーション 2017-08-10

PDF PDF 1.44 MB
The New Re-centering Solution in MBP 2017 Update 1
A preview of the up-coming new re-centering function for re-centering an existing model to a new specification, with fully customizable device targets definition and scaling graph visualization.

セミナのプレゼンテーション 2017-08-10

PDF PDF 1.39 MB
How to Extract BSIM4 DC Model
Model Builder Program(MBP) 2017 improves the model extraction process through the use of special utilities and scripting. This new, improved modeling process will be demonstrated on a BSIM4 transistor.

セミナのプレゼンテーション 2017-08-10

PDF PDF 955 KB
Python-driven Table Generation in Automated Device Model Validation
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

セミナのプレゼンテーション 2017-08-10

PDF PDF 2.41 MB
What's New in Keysight Technologies' Device Modeling Portfolio 2017
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

セミナのプレゼンテーション 2017-08-10

PDF PDF 3.19 MB
Keysight EEsof EDAのカスタマー教育/サービス
Keysight EDAのカスタマー教育/サービスの概要。

トレーニング資料 2017-08-08

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

トレーニング資料 2017-08-08

Design and Simulation of 5G 28-GHz Phased Array Transceiver Webcast
August 3, 2017

ウェブセミナ(録画)

Design and Simulation of 5G 28-GHz Phased Array Transceiver Slides
Slides from the August 3, 2017 webcast

セミナのプレゼンテーション 2017-08-03

PDF PDF 8.17 MB
Einblicke in Leistungsumwandler-Messungen
Leis­tungselek­tro­nik-Messungen

セミナー

Mesures électroniques appliquées à la conversion de puissance
Mesures électroniques appliquées à la conversion de puissance

セミナー

Misure Elettroniche nella Conversione di Potenza
Conoscenza delle Misure Elettroniche di Potenza

セミナー

Troubleshooting Coherent Optical Communication Systems Webcast
Original broadcast April 22, 2015

ウェブセミナ(録画)

Video: 10-Tip Series to help you get more out of the 34980A Switch/Measure unit
View video clips to improve your productivity and get to results quickly with a switch/measure unit.

トレーニング資料 2017-07-30

Power Conversion Measurement Insights
Keysight HOTSPOTS facilitates this learning process by offering the in-depth and up-to-date information relevant to your industry, your current job role and to the role you aspire to.

セミナー

航空宇宙・防衛 Keysight World Online
Keysight World Onlineでは最新市場動向と新たな課題を解決するための技術情報をお届けします。

ウェブセミナ

Test with Data Analytics to Enable Faster Time to Market Webcast
Original broadcast March 8, 2017

ウェブセミナ(録画)

DSEI 2017
DSEI 2017

トレードショー

Thermal Effects, Power Integrity, and Your PCB
Original broadcast July 27, 2017

ウェブセミナ(録画)

Addressing Crosstalk Challenges from Simulation to Board Debug Webcast
Original broadcast June 28, 2017

ウェブセミナ(録画)

Verifying RF Short Range Communication in IoT Webcast
Original broadcast June 27, 2017

ウェブセミナ(録画)

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