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SI/PI PCB Design Considerations for Thermal Webcast
Original broadcast January 25, 2018

Webcast - recorded

Unlocking 6 Key Measurement Challenges for 5G Radio Validation Webcast Slides
Slides from the January 24, 2018 webcast

Seminar Materials 2018-01-24

PDF PDF 3.86 MB
Unlocking 6 Key Measurement Challenges for 5G Radio Validation Webcast
Original broadcast January 24, 2018

Webcast - recorded

embedded world 2018
Biggest trade show on embedded application solutions

Tradeshow

DesignCon 2018 Keysight Education Forum (KEF)
Download papers and view videos

Seminar Materials 2018-01-23

What’s New In ADS 2017
Original broadcast January 11, 2018

Webcast - recorded

What’s New In ADS 2017
Slides from the January 11, 2018 webcast

Seminar Materials 2018-01-11

PDF PDF 2.39 MB
Network Analysis
This paper covers transmission line theory, S-parameters, the Smith Chart and impedance measurements/matching. Transmit/receive and directivity paths are described along with how dynamic range and accuracy can be optimized. Calibration and error correction is also covered.

Seminar Materials 2018-01-05

PDF PDF 5.53 MB
Malaysia / Singapore Customer Education Schedule 2018
Malaysia / Singapore Customer Education Schedule 2018

Training Materials 2018-01-05

PDF PDF 259 KB
Mastering Signal Integrity & Power Integrity Design Seminar
Mastering Signal Integrity & Power Integrity Design Seminar

Seminar Materials 2018-01-03

Understanding the 5G NR Physical Layer - Seminar Materials
Understanding the 5G NR Physical Layer . mp4 video from Webcast

Seminar Materials 2017-11-28

MP4 MP4 162.21 MB
Spectrum Analysis Fundamentals Webcast
Original broadcast November 15, 2017

Webcast - recorded

IEEE 802.11ax PHY Overview
This video provides an overview of the IEEE 802.11ax WLAN standard highlighting the major physical layer technologies and features that are different from legacy WLAN standards.

Seminar 2017-11-08

YOUTUBE YOUTUBE
Automotive Solution Center Seminar Schedule FY18 - H1
View the .pdf

Seminar Materials 2017-10-25

PDF PDF 997 KB
Next Generation Test Strategies: Overcoming Wideband Test Challenges
This webcast will describe challenges with higher frequency, wider bandwidth measurements needed for 5G and how to think differently about your nextgen test to ensure accurate, repeatable, and cost appropriate solutions.

Webcast 2017-10-25

OTHER OTHER
Designing with 4G Modulated Signals for Optimized Multi-standard Transceiver ICs Webcast
Original broadcast October 3, 2013

Webcast - recorded

Stop Wasting Time and Money by Struggling with Data Analytics While Designing T&M Experiments!
Stop Wasting Time and Money by Struggling with Data Analytics While Designing T&M Experiments!

Training Materials 2017-09-24

Join Keysight at ECOC 2017
Join Keysight at ECOC 2017

Seminar

The 4 Keys to Understanding TLS 1.3 and Active SSL
Encryption is a double-edged sword—the same SSL that can protect your network can also be used by malware and other threats to hide from security and monitoring tools. Learn what encryptions are and how to manage them.

Webcast 2017-09-21

Chronicles of a High-Speed PCB including PCB Thermal Effects
This presentation takes you on a journey through a high speed PC board including PCB Thermal Effects. Presented in Canada.

Seminar Materials 2017-09-15

PDF PDF 6.80 MB
Ixia – “5G for Dummies”
Ixia – “5G for Dummies”

Seminar Materials 2017-08-30

PDF PDF 4.31 MB
ActualTech + Ixia: Comparing 9 Different Approaches to Cloud in One Place Back-to-Back
Learn about cloud innovations for your enterprise andhow they might be implemented.

Webcast 2017-08-18

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
What's New in Keysight Technologies' Device Modeling Portfolio 2017
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

Seminar Materials 2017-08-10

PDF PDF 3.19 MB

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