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Aerospace & Defense Challenges Demand Novel Test & Measurement Approaches
Discover how new architectures and capabilities are solving characterization challenges in radar, EW, SIGINT, terrestrial military communications, and satellite technology.

Webcast 2019-12-03

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3057845&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3057845&CC=US&LC=ENG
Minimize Measurement Uncertainty in RF Vector Signal
Attend this webinar to learn how to minimize measurement uncertainty attributed to test stimuli in a test system. Discover how to achieve the best signal quality for vector modulated signals using RF vector signal generators.

Webcast 2019-11-12

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013074&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013074&CC=US&LC=ENG
Linking Circuit and System Design: Accurate Behavioral Modeling for 5G
This webinar will focus on advanced behavioral modeling techniques needed to accurately represent RF circuits at 5G mmWave frequencies for system designers.

Webcast 2019-11-07

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013083&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013083&CC=US&LC=ENG
Eliminate FEC Frame Loss in 400G Optical Links and Components
In this webinar you will learn how to design and validate FEC-aware 400G systems and components, optical transceivers, and copper cables. We will discuss how to measure and debug FEC errors and unacceptable BER and FLR limits.

Webcast 2019-11-06

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
MIPI C-PHY: What It Is and How to Design It
This webinar will discuss the basics of MIPI C-PHY and solving C-PHY design challenges, including transmitter/receiver equalizations and jitter characterization.

Webcast 2019-11-06

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Wafer-Level Opto-Electrical Measurements for Integrated & Silicon Photonics
This webinar explains the setup and measurement methods for on-wafer parametric optical and high-frequency characterization of integrated photonics devices.

Webcast 2019-11-06

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013087&CC=US&LC=ENG
Network Analysis
This paper covers transmission line theory, S-parameters, the Smith Chart and impedance measurements/matching. Transmit/receive and directivity paths are described along with how dynamic range and accuracy can be optimized. Calibration and error correction is also covered.

Seminar Materials 2019-11-01

PDF PDF 5.53 MB
Accuracy Matters
What do you do with the result after you take a measurement? Often, people compare the result to a specification and make a “Pass” or “Fail” decision to ship or reject the item under test. They don’t teach you in school how accuracy affects the risk of incorrect Pass/Fail decisions. We will.

Seminar Materials 2019-11-01

PDF PDF 1.53 MB
Take Control of the Last Mile - Optimizing Your Service Level Management
Discover how you can hasten troubleshooting, monitor performance, and ensure service level agreements (SLAs) across all branch locations — regardless of who is supplying last mile connectivity.

Webcast 2019-10-16

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013069&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013069&CC=US&LC=ENG
RF and Microwave Measurement Insights
Hotspots RF and Microwave Measurement Insights - English

Seminar

HF/Mikro­wellen­-Messungen
Hotspots HF/Mikro­wellen­-Messungen - Deutsch

Seminar

Keysight EEsof EDA Training Course Calendar (Europe)
Scheduled Keysight EEsof Courses for EMEAI

Classroom Training

Les mesures de matériaux et de composants
Hotspots Les mesures de matériaux et de composants - Français

Seminar

High Speed Digital Measurement Insights
Event ID: 2955243 (French Main Event Page)

Seminar

Materials and Devices Measurement Insights
Hotspots Materials and Devices Measurement Insights - English

Seminar

High Speed Digital Measurement Insights
Event ID: 2955231

Seminar

Material- und Bauteilcharakterisierungen von DC bis THz
Hotspots Material- und Bauteilcharakterisierungen von DC bis THz - Deutsch

Seminar

High Speed Digital Measurement Insights
Event ID: 2955251 (Italian Main Event Page)

Seminar

High Speed Digital Measurement Insights
Event ID: 2955215 (English Main Event Page)

Seminar

Fondamenti di Misure su Materiali & Dispositivi
Hotspots Fondamenti di Misure su Materiali & Dispositivi - Italiano

Seminar

Sensor Measurement Techniques with your DMM
Test & measurement bench essentials webinar series

Training Materials 2019-10-07

Power Integrity Boot Camp for Designers Seminar
Power Integrity hands-on simulation and measurement demonstrations. Keysight and Picotest experts bring to life the popular How to Design for Power Integrity 5-part YouTube series with Steve Sandler.

Seminar Materials 2019-10-04

EMPro Evaluation Resources
For users that want to evaluate EMPro, here are some resources to help you quickly learn how to use the product.

Training Materials 2019-09-28

Addressing FEC challenges on your 400G device Webinar
Addressing FEC challenges on your 400G device Webinar

Seminar Materials 2019-09-19

ECOC 2019 - The European Conference on Optical Communications
ECOC 2019 - The European Conference on Optical Communications

Seminar Materials 2019-09-19

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