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Network Analysis
This paper covers transmission line theory, S-parameters, the Smith Chart and impedance measurements/matching. Transmit/receive and directivity paths are described along with how dynamic range and accuracy can be optimized. Calibration and error correction is also covered.

研讨会演示 2019-11-01

PDF PDF 5.53 MB
Accuracy Matters
What do you do with the result after you take a measurement? Often, people compare the result to a specification and make a “Pass” or “Fail” decision to ship or reject the item under test. They don’t teach you in school how accuracy affects the risk of incorrect Pass/Fail decisions. We will.

研讨会演示 2019-11-01

PDF PDF 1.53 MB
Keysight EEsof EDA Training Course Calendar (Europe)
Scheduled Keysight EEsof Courses for EMEAI

课堂培训

Materials and Devices Measurement Insights
Hotspots Materials and Devices Measurement Insights - English

研讨会

High Speed Digital Measurement Insights
Event ID: 2955251 (Italian Main Event Page)

研讨会

High Speed Digital Measurement Insights
Event ID: 2955243 (French Main Event Page)

研讨会

Les mesures de matériaux et de composants
Hotspots Les mesures de matériaux et de composants - Français

研讨会

Material- und Bauteilcharakterisierungen von DC bis THz
Hotspots Material- und Bauteilcharakterisierungen von DC bis THz - Deutsch

研讨会

High Speed Digital Measurement Insights
Event ID: 2955231

研讨会

High Speed Digital Measurement Insights
Event ID: 2955215 (English Main Event Page)

研讨会

Fondamenti di Misure su Materiali & Dispositivi
Hotspots Fondamenti di Misure su Materiali & Dispositivi - Italiano

研讨会

Sensor Measurement Techniques with your DMM
Test & measurement bench essentials webinar series

培训资料 2019-10-07

Power Integrity Boot Camp for Designers Seminar
Power Integrity hands-on simulation and measurement demonstrations. Keysight and Picotest experts bring to life the popular How to Design for Power Integrity 5-part YouTube series with Steve Sandler.

研讨会演示 2019-10-04

EMPro Evaluation Resources
For users that want to evaluate EMPro, here are some resources to help you quickly learn how to use the product.

培训资料 2019-09-28

Fulfilling the Final Mile: How to Optimize Your Service Level Management
Discover how IxProbe helps hasten troubleshooting, monitor performance, and ensure service level agreements (SLAs) across all branch locations - regardless of who is fulfilling the final mile.

网上直播 2019-09-25

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013069&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013069&CC=US&LC=ENG
ECOC 2019 - The European Conference on Optical Communications
ECOC 2019 - The European Conference on Optical Communications

研讨会演示 2019-09-19

Addressing FEC challenges on your 400G device Webinar
Addressing FEC challenges on your 400G device Webinar

研讨会演示 2019-09-19

SPECS User Training
Learn to quickly develop and run SPECS test plans to obtain semiconductor parametric information.

课堂培训

Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

网上直播

Selecting and Modeling the Voltage Regulator Module (VRM)
Section 3: This seminar includes Power Integrity hands-on simulation and measurement demonstrations.

研讨会演示 2019-09-17

PDF PDF 3.63 MB
Boundary Scan Webcast Series
Live and on-demand webcasts 2014

网上直播

Can You Hear Me Now Tips for Dealing with the Interference of Things
Learn the process of coexistence test to help make your wireless products more robust. This webinar looks at the current state of the RF spectrum with examples of current spectrum crowding.

网上直播 2019-09-09

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013079&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013079&CC=US&LC=ENG
RF and Microwave Measurement Insights
Hotspots RF and Microwave Measurement Insights - English

研讨会

Accelerate Current and Voltage Waveform Characterization on IoT Power Rails
Accelerate your time to market with Keysight’s CX3300 Device Current Waveform Analyzer to characterize, validate, and debug the PDN in your IoT devices.

网上直播 2019-09-06

JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013079&CC=US&LC=ENG JSPX?ACTION=REF&CNAME=EDITORIAL&CKEY=3013079&CC=US&LC=ENG
HF/Mikro­wellen­-Messungen
Hotspots HF/Mikro­wellen­-Messungen - Deutsch

研讨会

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