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IEEE 802.11ax PHY 概述
该视频概括介绍 IEEE 802.11ax WLAN 标准,重点介绍与传统 WLAN 标准不同的主要物理层技术以及特性。

研讨会 2017-11-08

YOUTUBE YOUTUBE
Next Generation Test Strategies Overcoming Wideband Test Challenges

网上直播 2017-10-25

OTHER OTHER
Automotive Solution Center Seminar Schedule FY18 - H1
View the .pdf

研讨会演示 2017-10-25

PDF PDF 997 KB
《数字设计和测试》网上直播系列
现场直播和点播研讨会将为您传授新的测量技术,帮助您将产品更快推向市场

网上直播

Designing with 4G Modulated Signals for Optimized Multi-standard Transceiver ICs Webcast
Original broadcast October 3, 2013

网上直播 -- 已存档的

Stop Wasting Time and Money by Struggling with Data Analytics While Designing T&M Experiments!
Stop Wasting Time and Money by Struggling with Data Analytics While Designing T&M Experiments!

培训资料 2017-09-24

The 4 Keys to Understanding TLS 1.3 and Active SSL
Encryption is a double-edged sword—the same SSL that can protect your network can also be used by malware and other threats to hide from security and monitoring tools. Learn what encryptions are and how to manage them.

网上直播 2017-09-21

是德认证培训课程
是德测试与测量技术认证培训及考试时间表

课堂培训

Chronicles of a High-Speed PCB including PCB Thermal Effects
This presentation takes you on a journey through a high speed PC board including PCB Thermal Effects. Presented in Canada.

研讨会演示 2017-09-15

PDF PDF 6.80 MB
Ixia – “5G for Dummies”
Ixia – “5G for Dummies”

研讨会演示 2017-08-30

PDF PDF 4.31 MB
ECOC 2017 是德科技期待您莅临指导
ECOC 2017 是德科技期待您莅临指导

研讨会

半导体参数测试:返回到基础知识
“返回到基础知识”研讨会讲述了进行快速脉冲 IV 测量的实用技巧和技术,以及实际电容测量的注意事项。

网上直播 -- 已存档的

射频与微波测量基础
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.

课堂培训

国际微波研讨会 (2017)
June 4 - 9, 2017; Honolulu, Hawaii

展览会

医疗无线技术应用提供的机会和挑战
Original broadcast July 18, 2017

网上直播

您如何处理医疗/物联网设备引起的事件干扰?
Original broadcast June 20, 2017

网上直播 -- 已存档的

ActualTech + Ixia: Comparing 9 Different Approaches to Cloud in One Place Back-to-Back
Learn about cloud innovations for your enterprise andhow they might be implemented.

网上直播 2017-08-18

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

研讨会演示 2017-08-14

Static Random Access Memory (SRAM) Cell Modeling in MBP 2017
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

研讨会演示 2017-08-10

PDF PDF 1.44 MB
What's New in Keysight Technologies' Device Modeling Portfolio 2017
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

研讨会演示 2017-08-10

PDF PDF 3.19 MB
How to Extract BSIM4 DC Model
Model Builder Program(MBP) 2017 improves the model extraction process through the use of special utilities and scripting. This new, improved modeling process will be demonstrated on a BSIM4 transistor.

研讨会演示 2017-08-10

PDF PDF 955 KB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

研讨会演示 2017-08-10

PDF PDF 2.41 MB
The New Re-centering Solution in MBP 2017 Update 1
A preview of the up-coming new re-centering function for re-centering an existing model to a new specification, with fully customizable device targets definition and scaling graph visualization.

研讨会演示 2017-08-10

PDF PDF 1.39 MB
Python-driven Table Generation in Automated Device Model Validation
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

研讨会演示 2017-08-10

PDF PDF 2.41 MB
是德科技 EEsof EDA 客户培训和服务
是德科技 EDA 客户培训和服务简介。

培训资料 2017-08-08

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