Here’s the page we think you wanted. See search results instead:


Contact an Expert

Technical Support

Electronic Measurement

Support by Product Model Number:

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

By Product Category

151-175 of 889

Integrated, Turnkey Modeling and Measurement Systems - Article Reprint
This article first appeared in the March 2016 edition of Microwave Journal.

Article 2016-07-12

Adding Scale and Security Testing to VMware Environments
Test your next generation of applications within your existing virtual environment at a lower cost and without major networking constraints.

Case Study 2016-07-01

Service Provider Automates Virtual Testing for Faster vIMS Migration
Discover how a US telecom company achieved up to 5x cost savings and sped up time to revenue with test automation that spanned network performance, cloud test, application virtualization.

Case Study 2016-06-22

Telecom Virtualizes Faster with Confidence

Case Study 2016-06-22

Broadband Service Provider Migrates to Cloud
Automated testing, network monitoring, and network security and video testing reduced deployment time significantly and streamlined operations.

Case Study 2016-06-21

What is jitter?
Understand jitter basics and how to measure and then eliminate jitter from your designs.

Article 2016-06-19

Jitter Glossary
Key terms that will help you understand and tackle jitter in your designs.

Article 2016-06-15

Solving Mobile Radar Measurement Challenges
This Microwave Journal article examines an alternative simulation method that allows for better cross-domain modeling in a single framework, to capture the complete effects of modern radar system performance.

Article 2016-06-13

Phased array beamforming software design, test, and measurement kit introduced by Keysight
Military & Aerospace Electronics article introduces the W1720EP phased array radar beamforming kit add-on software simulation personality for the SystemVue 2016.08 design and test and measurement environment.

Article 2016-06-13

MWJ Article: Eye on 802.11ax: What It Is and How to Overcome the Design & Test Challenges It Creates
Wireless access to data has become an everyday necessity for both consumers and enterprises. In the last 30 years alone, unfettered access to information has transformed entire industries, fueling growth, productivity and profits.

Article 2016-05-20

University of Notre Dame Strikes a Balance Between Research and Teaching

Article 2016-05-15

Paving The Way For 5G Realization and mmWave Communication Systems – Article Reprint
This article Paving The Way For 5G Realization and mmWave Communication Systems first appeared in the April 2016 edition of Microwave Journal. Reprinted with kind permission from Microwave Journal.

Article 2016-05-03

Simulating a DDoS Attack in Your Own Lab
Constructing a simple DDoS simulation in your own lab will give you the immediate benefit of experiencing a “real” DDoS attack to test your people and processes.

Case Study 2016-05-01

Manufacturer Works with Ixia to Validate Switch Functionality

Case Study 2016-04-15

French ISP Relies on Ixia Network Testing and Monitoring Solutions
Network testing and network monitoring solutions helped improve visibility and quality of experience for users.

Case Study 2016-04-01

Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

Article 2016-03-31

The PDN Bandini Mountain and Other Things I Didn’t Know I Didn’t Know
"In engineering, it's what you don't know you don't know that can ruin your day and keep you awake at nights." From Bert Simonovich's practical design notes.

Journal 2016-03-30

Solving Electronics Design Challenges of an Aerospace System with EDA Tools
Microwave Product Digest featured article on solving electronics design challenges of an aerospace system using EDA tools.

Article 2016-03-22

Practical, Efficient and Safe Power Device Thermal Characterization with B1506A - Article Reprint
The B1506A has standard solution for power device thermal test and offers fast and safe solution to customers. This white paper reports the actual implementation of thermal test with B1506A.

Article 2016-03-18

Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

Article 2016-03-03

Stay ALERT – Don’t Get Hurt

Article 2016-03-03

Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests

Case Study 2016-02-22

Phase Locked Loop Noise Transfer Functions - By Peter Delos
High Frequency Electronics article that describes the derivation of noise transfer functions and some key points for phase locked loop noise analysis is provided along with a simulation and measured example.

Article 2016-02-18

Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

Article 2016-02-17

The Boundary Scan Toolbox - Article Reprint
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

Article 2016-02-16


Previous 1 2 3 4 5 6 7 8 9 10 ... Next