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SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

Villanova Professor and Students “Bang Heads” for Nanotechnology Research
Dr. Gang Feng, Associate Professor in the Department of Mechanical Engineering at Villanova University, is using advanced materials measurement technology to understand concussions, energy storage, and more.

Article 2017-04-21

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

Case Study 2017-03-17

PDF PDF 509 KB
Python Programming integration with IC-CAP
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

Ensuring High Signal Quality in PCIe Gen3 Channels
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Article 2017-03-04

Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

IEEE 802.11™: Wireless LANs
Through the IEEE-SA, industry, and government support, select IEEE standards are available for download at no charge.

Case Study 2017-02-01

Addressing The Challenges Facing IoT Adoption - Article Reprint
Addressing The Challenges Facing IoT Adoption - Article Reprint

Article 2017-01-23

PDF PDF 2.25 MB
Transconductance Modeling for Low-Power Design
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Article 2017-01-18

Device Modeling 101 - What are Ft and Fmax?
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Article 2016-12-18

Keysight One-Stop Calibration Capabilities – Americas
View our capabilities for dimensional / optical; electrical – DC, low frequency; electrical – optical; electrical – RF, microwave, millimeter wave; physical / mechanical

Article 2016-12-15

HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

Article 2016-12-05

Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

Article 2016-11-29

PDF PDF 3.90 MB
Direct-Synthesis Software Approach Facilitates Filter Design
This Microwaves & RF article discusses how Genesys software can be used to design filters with the direct-synthesis technique. A lowpass filter example is presented to illustrate the software’s capabilities.

Article 2016-11-28

Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

Article 2016-11-17

Rehosting service included as part of Agilent support agreement
Rehosting service is delivered at no additional cost, as part of the support agreement for your hardware.

Newsletter 2016-11-10

PDF PDF 187 KB
Rehost Service for Keysight ICT, AXI and AOI systems
Rehost service is included as part of Keysight support agreement for hardware support or software subscription service.

Feature Story 2016-11-10

Integrating Multiple Technology Devices onto Laminate-Based MCMs Using an Integrated Design Flow
An overview of a fully-integrated design flow is used to demonstrate a viable solution for the assembly and design optimization of multiple RF MCM products.

Feature Story 2016-10-24

8 Steps to a Successful DDR4 Design
Learn how Keysight's design flow example for DDR4 can help you achive confidence in your design and help you ensure success.

Article 2016-10-20

Using DSP and RF circuit co-design to reduce risk and cost
For modern design organizations, it’s now more imperative than ever that they simulate both Digital Signal Processor (DSP) and RF circuits together at the system level using mixed signals.

Article 2016-10-11

Software plus signal generators and analyzers support IEEE 802.11p design and test
Jungik Suh, marketing program manager, Automotive & Energy Solutions, Keysight Technologies, provides input on several Keysight solutions for the connected-car arena for Evaluation Engineering's October print special report on automotive test.

Article 2016-10-05

A Quick Fix for Poor Capacitor, Inductor and DC/DC Impedance Measurements
Modern Test & Measure article by Steve Sandler (Picotest) explains why you need an extended range, partial S2p measurement and how to make this improved measurement.

Article 2016-10-03

Best Practices for Connector Models
Eric Bogatin, Signal Integrity Journal Editor, discusses best practices for connector modeling and measuring with Heidi Barnes, Keysight ADS application engineering specialist, and Jim Nadolny, Principle SI Engineer for Samtec.

Article 2016-09-30

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