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Evaluating Oscilloscope Signal Integrity
Signal Integrity impacts all oscilloscope measurements. It is the primary measure of signal quality. Does your oscilloscope provide the signal quality you need to measure with confidence? Learn about the various important considerations that determine an oscilloscopes overall measurement quality.

어플리케이션 노트 2019-07-10

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Additional Pad Features for Modelithics CLR Library™ Models–PCB Layers and Pad Connection Options
Additional Pad Features for Modelithics CLR Library™ Models–PCB Layers and Pad Connection Options in Keysight ADS

어플리케이션 노트 2019-07-10

PDF PDF 739 KB
Migrating to the Latest Keysight Software for Power Meters and Power Sensors
Provides power meter/power sensor software comparison and migration information.

어플리케이션 노트 2019-07-09

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Solutions for Minimizing Measurement Uncertainty and Quick and Easy Estimation of Uncertainty Due to Mismatch
This application note presents a number of techniques that can be used to minimize mismatch uncertainty.

어플리케이션 노트 2019-07-08

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TestJet/VTEP Hardware Description and Verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

어플리케이션 노트 2019-07-03

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Solutions for Using a Frequency Counter to Measure Phase Noise Close to a Carrier Signal
A local oscillator (LO) is the heart of any modern radar, electronic warfare or communication system. See how you can use this to your advantage.

어플리케이션 노트 2019-07-03

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Power Sensor Overpower Failure Verification Guideline - Application Note
Describes the TDR method to verify failure due to overpower

어플리케이션 노트 2019-07-02

PDF PDF 810 KB
Connecting Data Acquisition Systems to a Wireless Network
Learn how you can use Wi-Fi in conjunction with a 34972A DAQ system, and how to configure your router to be used with an LXI instrument.

어플리케이션 노트 2019-07-01

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Overcoming LoRa Device RF Measurement Challenges
This Application Note offers an introduction to some key LoRa device RF measurement challenges and offers guidance to how users can overcome these using Keysight’s test solutions.

어플리케이션 노트 2019-07-01

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Connecting Data Acquisition Systems to a Wireless Network
Learn how you can configure and take advantage of the latest router technology with either the 34972A DAQ system or any LXI instrument.

어플리케이션 노트 2019-07-01

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Efficient Impedance Measurement of a Large Amount of Components by Using a Scanning Stytem
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system. In addition, this note covers actual scanning system examples such as the temperature characteristic evaluation and the insulation resistance measurement for electronic components.

어플리케이션 노트 2019-07-01

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The Essential Signal Generator Guide – Building a Solid Foundation in RF – Part 1 - White Paper
In this first part of our two-part white paper series on signal generators, we help you gain a sound understanding regarding the fundamental specifications of signal generators.

어플리케이션 노트 2019-06-28

Measuring Insulating Material Resistivity Using the B2985A/87A
This application note explains how easy it is to make an resistivity measurement using the B2980A Series.

어플리케이션 노트 2019-06-27

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Techniques and Trends in Signal Monitoring, Frequency Management and Geolocation of Wireless Emitters
This application note reviews various issues, techniques and associated equipment required for signal monitoring and frequency management of RF spectrum in the VHF/UHF frequency range. The goals and automation requirements for various monitoring applications will be discussed and the concepts of implementing a distributed sensor network for determining the geolocation of a wireless “emitter” will be introduced.

어플리케이션 노트 2019-06-27

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Measuring Insulating Material Resistivity Using the B2985A/87A - Application Note
This application note explains how easy it is to make an resistivity measurement using the B2980A Series.

어플리케이션 노트 2019-06-27

Measuring Power MOSFET Electrical Characteristics using the B1505A
This application note explains how to use the B1505A to measure the typical DC and capacitance parameters of power MOSFET devices.

어플리케이션 노트 2019-06-27

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Streaming, Analysis and Playback of RF Interference Signals in Aerospace and Defense Applications
This application focuses on intentional interference and the ultimate goal of countering undesired signals using four steps.

어플리케이션 노트 2019-06-27

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Calculating Real Time S-Parameter and Power Uncertainty - Application Note
This application note shows how to use Keysight’s innovative real time uncertainty VNA software option (S93015B) to determine the uncertainty of your S-parameter and power measurements.

어플리케이션 노트 2019-06-26

PDF PDF 987 KB
Calculating Real Time S-Parameter and Power Uncertainty
This application note shows how to use Keysight’s innovative real time uncertainty VNA software option (S93015B) to determine the uncertainty of your S-parameter and power measurements.

어플리케이션 노트 2019-06-26

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High Power Amplifier Measurements Using Nonlinear Vector Network Analyzer
This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer (NVNA).

어플리케이션 노트 2019-06-26

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Compatibility and Differences: 34461A and 34401A Digital Multimeters
This app note discusses the compatibility and differences between the 34461A and 34401A Digital Multimeters.

어플리케이션 노트 2019-06-26

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Faster Data Analysis with Digital Multimeter Measurements
Learn how the Truevolt Series DMMs can help you more quickly analyze your data.

어플리케이션 노트 2019-06-20

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Faster Data Analysis with Digital Multimeter Measurements
Learn how to perform data analysis faster, gain insights into measurement data without having to transfer that data to a PC. Modern DMMs feature a large graphical display and built-in math functions that show measurement trends, statistics, and histograms in a single, compact unit.

어플리케이션 노트 2019-06-20

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Reducing Tester Downtime Remotely
Improve Expert Consultant on-site response time to resolve problems on manufacturer's production test equipment.

어플리케이션 노트 2019-06-18

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Reducing Tester Downtime Remotely - Application Note
Improve Expert Consultant on-site response time to resolve problems on manufacturer's production test equipment.

어플리케이션 노트 2019-06-18

PDF PDF 555 KB

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