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Get It Right Every Time with Pre-Compliance Testing - White Paper
Understand how pre-compliance can help you pass final compliance testing and get your product to market on time in a low-cost, low-risk manner.

Nota de aplicação 2018-10-31

PDF PDF 1.43 MB
Comparisons: DAQ970A to 34970A and 34972A Data Acquisition System - White Paper
This paper provides a comparison of the next generation DAQ970A and, the 34970A/34972A Data Acquisition Systems.

Nota de aplicação 2018-10-30

Making Noise in RF Receivers - White Paper
In this white paper, you will learn what the AWGN and phase noise are and how to correctly and accurately apply the noise to your desired signal for receiver performance test.

Nota de aplicação 2018-10-30

Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

Nota de aplicação 2018-10-30

Laser Diode Characterization and Its Challenges
This white paper discusses the laser diode characterization and the challenges the test engineer faces.

Nota de aplicação 2018-10-29

Why Autonomous Driving Systems Will Require Automotive Ethernet - White Paper
Automotive Ethernet provides the new backbone for faster automotive networks to serve autonomous vehicles and advanced driver assistance systems (ADAS) which need higher bandwidth and lower latency.

Nota de aplicação 2018-10-25

IEEE 1687 – Silicon Test to Board Test - Application Note
This application note is to provide an overview to the audience on the use case of IEEE 1687 in their test environment and how it benefits their testing.

Nota de aplicação 2018-10-24

PDF PDF 968 KB
Digital Multimeter Safety Tips - White Paper
Learn how to safely use digital multimeters. Consider the advice from this article before you start making measurements with a DMM.

Nota de aplicação 2018-10-23

Understanding and Testing Multi-Channel RF Systems with Signal Generators Part 1
Generating and analyzing multiple synchronized RF signals are potentially challenging. This white paper discusses test signal requirements for the evaluation of multi-channel RF systems and how to configure instruments for these test requirements.

Nota de aplicação 2018-10-22

Understanding and Testing Multi-Channel RF Systems with Signal Generators Part 2
Generating and analyzing multiple synchronized RF signals are potentially challenging. This white paper discusses test signal requirements for the evaluation of multi-channel RF systems and how to configure instruments for these test requirements.

Nota de aplicação 2018-10-22

9 Best Practices for Optimizing Your Signal Generator – Part 2 - Application Note
Knowing the capabilities and performance of your signal generators is the first step to make accurate and consistent measurements. In this two-part Application Note, we discuss the best practices to optimize your signal generator.

Nota de aplicação 2018-10-19

9 Best Practices for Optimizing Your Signal Generator – Part 1 - Application Note
Knowing the capabilities and performance of your signal generators is the first step to make accurate and consistent measurements. In this two-part Application Note, we discuss the best practices to optimize your signal generator.

Nota de aplicação 2018-10-18

Gain Compression Measurement with Lightwave Component Analyzer
This application note is intended to assist Gain Compression Measurement using the N437xD/E Lightwave Component Analyzer.

Nota de aplicação 2018-10-17

PDF PDF 2.38 MB
Characterize, Validate, and Debug Advanced Devices with Precision Dynamic Current Measurements
This application note describes the measurement challenges in the precision dynamic current measurement in the various conditions, and Keysight’s new solution for them.

Nota de aplicação 2018-10-11

PDF PDF 1.76 MB
Avoid Power Related Damage Using Overcurrent Protection with a Multiple Output Power Supply
When multiple voltages power a device, it is often desirable to turn off all the power supply outputs when a fault occurs. If using more than one power supply, daisy chain the digital IO ports such that all outputs, even across mainframes, will be shut down on an overcurrent event. Provide additional protection for a device by using these three functions together - OCP, fault-out and the inhibit function - to shut down all the outputs.

Nota de aplicação 2018-10-10

PDF PDF 1.65 MB
Calibrating Optical Paths in Spectral Test Station Using N7700A IL/PDL SW Engine - Application Note
Optical IL and PDL of a device relate the signal output from the device with the input signal, previously recorded or calibrated as reference measurement. For best results, the reference is repeated periodically and made with the same settings to be used on the device. By using IL de-embedding, the reference data can be applied to multiple optical paths without repeating at each port.

Nota de aplicação 2018-10-10

PDF PDF 213 KB
Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Nota de aplicação 2018-10-10

Probe soldering guidelines for Keysight InfiniiMax probes - Application Note
There are various ways to connect test instrumentation probes to devices under test(DUTs). One such method is soldering, which provides a reliable connection and minimizes parasitic probing effects by keeping wire lengths and connections as short as possible. Many of Keysight's high performance oscilloscopes probes utilize soldered connections.

Nota de aplicação 2018-10-07

PDF PDF 7.73 MB
Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Nota de aplicação 2018-10-05

Tactics for Improving Distortion Measurements - White Paper
Learn about the different types of distortion and why they matter to your RF measurements.

Nota de aplicação 2018-10-05

Digital Multimeter Damage Prevention - White Paper
Learn 4 tips to avoid damaging your digital multimeter.

Nota de aplicação 2018-09-27

Fast Thermal Characterization and Testing Your Electronic Devices - White Paper
Fast thermal characterization and testing gives you the advantage of quick and qualitative insight into your products’ characteristics, the ability to troubleshoot and fine-tune the performance, and the capability to perform additional iterative testing. Learn how to predict and preview operating temperature performance of your product. Learn how to use a DAQ data acquisition system as a data logger to make temperature measurements on your product.

Nota de aplicação 2018-09-21

Achieving Fast and Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range for Wireless
This application note explains how to obtain a wide power measurement range on the lower power level. This is important for chipsets designed to handle a wider power range to support higher data throughput and wider coverage area

Nota de aplicação 2018-09-20

Making Your Factories Smarter By Harnessing Industry 4.0
he Internet of Things (IoT) is changing the way industries handle procurement, processing, distribution of materials, and their final products. The introduction of intelligent sensors, mission-critical communications, and automation into the manufacturing environment ushers in a fourth industrial revolution: Industry 4.0. This white paper details the drivers of Industry 4.0, how data analytics make smart factories smart, how big data gives rich insights, and the impact of big data analytics on smart factories.

Nota de aplicação 2018-09-19

How Have Function Generators Evolved? – White Paper
Function generators have come a long way since eight decades ago. Learn how the function generators evolved into versatile tools you use every day to provide reliable stimulus to test and characterize your devices.

Nota de aplicação 2018-09-18

PDF PDF 1.15 MB

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