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Next Generation of Test Automation and Systems
Application note covering test automation using PathWave Test Automation Software

Notes d’application 2019-09-23

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Benefits of Complex Modulation - Application Note
In part one of an eight-part series, learn the benefits of complex modulation schemes, such as differential quadrature phase shift keying (DQPSK), to provide a faster and more efficient way for high-speed transmission.

Notes d’application 2019-09-22

PDF PDF 2.65 MB
Benefits of Complex Modulation
In part one of an eight-part series, learn the benefits of complex modulation schemes, such as DQPSK, to provide a faster and more efficient way for high-speed transmission.

Notes d’application 2019-09-22

PDF PDF
Benefits of Complex Modulation
In part one of an eight-part series, learn the benefits of complex modulation schemes, such as differential quadrature phase shift keying (DQPSK), to provide a faster and more efficient way for high-speed transmission.

Notes d’application 2019-09-22

PDF PDF
3 Steps to Characterize RF Devices with Stimulus-Response Measurements - White Paper
Perform stimulus-response tests, such as CCDF, harmonics, TOI, ACP, and EVM to understand the performance of the DUT under different conditions to determine the best trade-offs in your design.

Notes d’application 2019-09-20

S-parameter Requirements for Oscilloscope De-Embedding Applications
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters

Notes d’application 2019-09-20

PDF PDF
P-Series Measurement Uncertainty Calculator
Measurement Uncertainty Calculator for the N1911A and N1912A Power Meters and the N1921A and N1922A Power Sensors.

Notes d’application 2019-09-20

XLS XLS 102 KB
Integrated Photonics - Application Briefs
Integrated Photonics, often called Silicon Photonics, promises additional benefits for industrial segments such as Intra Data Center communication and Data Center Interconnects (DCI), Telecom, 5G and Automotive connectivity, High Performance Computing, LIDAR, Sensing and Medical

Notes d’application 2019-09-19

PDF PDF 13.70 MB
Design Tutorial E5061B ENA
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

Notes d’application 2019-09-19

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E4982A LCR Meter 1 MHz to 3 GHz Migration Guide from 4287A
This migration guide describes the difference between the Agilent E4982A LCR Meter and 4287A RF LCR Meter.

Notes d’application 2019-09-19

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E4982A LCR Meter 1 MHz to 3 GHz Migration Guide from 4287A - Application Note
This migration guide describes the difference between the Keysight E4982A LCR Meter and 4287A RF LCR Meter.

Notes d’application 2019-09-19

PDF PDF 1.64 MB
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.

Notes d’application 2019-09-19

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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design, and Test
This application note discusses Keysight's complete end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design, and test.

Notes d’application 2019-09-18

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Evaluating Oscilloscopes to Debug Mixed-Signal Designs
Learn about what a mixed signal oscilloscope is, the necessary requirements, and how it can help in your testing.

Notes d’application 2019-09-17

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Evaluating Oscilloscopes to Debug Mixed-Signal Designs - Application Note
Discusses the number of channels, bandwidth, sample rates and triggering required to effectively monitor various analog and digital I/O signals in typical MCU/DSP-based embedded designs.

Notes d’application 2019-09-17

Quantum Instrument Port Configuration
Modular AWGs and DIGs provide the flexibility that quantum scientists need to set up their experiments and as a pre-step for scaling to large number of Qubits.

Notes d’application 2019-09-11

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Flexible Digital Modulation Solution
This application note introduces how to generate a GFSK signal with the Keysight 33522B dual-channel waveform generator and N9310A RF signal generator.

Notes d’application 2019-09-10

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Solutions for Exploring Phase Noise Measurement Methods and Techniques
This note provides a heuristic overview of phase noise fundamentals before describing the three most common measurement techniques and where they apply.

Notes d’application 2019-09-06

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Testing Dual-band GPS Receiver with Signal Studio
This application note describes testing dual-band GPS receiver with Signal Studio.

Notes d’application 2019-09-05

PDF PDF 2.33 MB
Measuring the Burst Time-Gated Power Signal of Wireless Technologies Using Keysight Power Sensors
Measuring pulse, burst, or modulated signals for wireless technologies such as TDMA, GSM, WLAN, WiMAX, and LTE is very important because it is part of functionality testing and power amplifier module verification during the manufacturing process. High-performance, and average and peak power meters and power sensors are required for measuring the average power and crest factor (peak-to-average ratio) of modulated signals throughout various research and development stages and the manufacturing verification process. To measure the average power of a time-gated pulse or burst signal in a specific timeframe, a lower cost solution is sufficient.

Notes d’application 2019-09-05

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Testing Dual-band GPS Receiver with Signal Studio
This application note describes testing a dual-band GPS receiver with Signal Studio.

Notes d’application 2019-09-05

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Testing dual-band GPS receiver with Signal Studio N7609C -
This is the application note for Testing dual-band GPS receiver with Signal Studio N7609C

Notes d’application 2019-09-05

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Solutions for LTE-Advanced Manufacturing Test
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Notes d’application 2019-09-04

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Characterizing High-Speed Coherent Optical Transmission Systems
Generate clean signals at the input of your Device Under Test with Keysight’s M8195A using in-situ calibration and de-embedding of signal path distortions.

Notes d’application 2019-08-30

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EMC Compliance Testing: Improve Throughput with Time Domain Scanning
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Notes d’application 2019-08-29

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