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Multi-antenna Array Measurements Using Digitizers Webcast
Original broadcast May 29, 2013

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

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Accelerating USB 3.0 Product Development
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

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Think Outside the Box: PC-based Oscilloscope Analysis Software
Ever wish you could do additional signal viewing, analysis and documentation tasks away from your scope and target system? With Keysight’s InfiniiView oscilloscope analysis software, now you can.

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Nonlinear characterisation and modeling through pulsed IV/S-parameters
This web seminar will put examples and discuss the design flow from Pulsed IV and Pulsed S-Parameters to Compact Transistor Models.

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Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

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Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope
This webinar will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

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Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

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Analyze, Validate and Debug High Speed Memory
This Webcast will demonstrate techniques and solutions for performing turn-on, interoperability, validation and compliance testing of high data rate DDR3 memory based products.

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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

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Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope (Italiano)
We will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

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802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA
This web seminar shows you how the Agilent 8990B peak power analyzer can be used for 802.11ac testing WLAN transmitter testing.

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Eliminate the need for cumbersome multi-instruments setups for stress testing devices
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

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Debug Digital Designs Faster with Advanced Parametric Triggering
Advanced parametric triggering can help synchronize oscilloscope acquisitions and display complex signal activity. Find signal parametric violation conditions such as setup & hold, edge speed, pulse amplitude (runts), pulse width violations, etc.

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New High Speed DDR Probing and Analysis Tool
EMEA session - New High Speed DDR Probing and Analysis Tool

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What’s happening with IEEE std. 1149.1 Boundary Scan?
The IEEE is revamping it, in a big way. What does that mean to test engineers?

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Power measurements & analysis using Agilent InfiniiVision 3000 X-Series oscilloscopes (Italiano)
The webcast will discuss in detail some power supply measurements that are commonly used and how Keysight’s InfiniiVision 3000 X-Series oscilloscope can help characterise switching power supplies automatically, consistently, and fast.

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IEEE 802.11ad PHY Layer Testing
This web seminar will start with a brief tutorial introduction to the IEEE 802.11ad PHY layer. We will then review a variety of modulation analysis measurements and consider what can each of them tell us about the device under test.

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Increase spectral efficiency in coherent optical communication
With Social Networks and Visual Online Contents the data trafic is forecasted to reach 6.3 Exabytes per month by 2015. To handle this, Provider need to adapt their networks. The upcoming webinar proposes how to face this challenge.

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Introduction to 802.11ac WLAN Technology and Testing
This web seminar provides an introduction to the new IEEE 802.11ac standard that is under development to address the need for “very high throughput.”

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Characterizing MIL-STD 1553 and ARINC 429 Serial Bus Networks
This webinar will discuss how modern Oscilloscopes are able to trigger and automatically decode MIL-STD 1553 and ARINC429 serial buses. In addition we will analyse physical layer characteristics and perform a pass/fail test using an eye-diagram.

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Digitizer fundamentals: Design considerations to achieve superior measurements
More than just understanding banner specs such as bandwidth and sampling rate, this webinar will arm you with knowledge of digitizer technology and underlying specifications to ensure you make accurate measurements that meet your application needs.

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Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast
Original broadcast April 24, 2013

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