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Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

應用手冊 2018-12-05

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

應用手冊 2018-12-05

Eliminate Potential Measurement Errors and Achieve the Greatest Accuracy in Digital Multimeters
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors. For an overview of ac voltage measurement errors, see application note, literature number 5988-5512EN.. For a discussion of resistance, dc current, ac current and frequency and period measurement errors,see application note, literature number 5988-5513EN.

應用手冊 2018-12-05

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

應用手冊 2018-12-01

On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

應用手冊 2018-06-12

Simulation for 5G New Radio System Design and Verification
There are many challenges for design and verification engineers to develop their commercial 5G devices. Finding effective solutions is one of the greatest challenges for wireless technology experts.

應用手冊 2018-06-06

PDF PDF 5.07 MB
CX3300 Series Device Current Waveform Analyzer, 7 Hints for Precise Current Measurements
This application note explains 7 hints that can be undertaken in order to obtain more favorable current measurement with the CX3300.

應用手冊 2018-06-04

Creating Multi-Emitter Scenarios for Radar and Electronic Warfare (EW) Testing - Application Note
Part 8 of the Radar App Note series focuses on multi-emitter testing of radar and electronic warfare (EW) systems. Realistic testing of these systems depends on the generation of signals that accurately simulate multi-emitter environments consisting of thousands of emitters and millions of pulses per second, all arriving from multiple directions. New technology built into commercial, off-the-shelf signal generators enables developers to generate increasingly complex simulations that get closer to reality and provide deeper confidence in EW system performance.

應用手冊 2018-05-31

PDF PDF 1.92 MB
Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer - Application Note
This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

應用手冊 2018-05-25

PDF PDF 2.07 MB
First Steps in 5G: Overcoming New Radio Device Design Challenges Series - Part 2 - White Paper
Explore the challenges of testing the millimeter wave spectrum.

應用手冊 2018-05-24

PDF PDF 5.10 MB
Energy Ecosystem – Technologies driving the future of e-Mobility - White Paper
One of the hottest markets fueling e-mobile applications is the electric car market which is seeing expotential growth worldwide. Keysight is confident of providing both the depth and breadth of test

應用手冊 2018-05-23

PDF PDF 8.43 MB
Don’t Sacrifice the Benefits of Millimeter-Wave Equipment by Missing the Basics - eBook
Learn how to select and use proper signal analysis equipment for testing at millimeter wave frequencies.

應用手冊 2018-05-23

PDF PDF 7.72 MB
Compatibility of USB Power Sensors with Keysight Instruments – Application Note
Application note on "Compatibility of USB Power Sensors with Keysight Instruments".

應用手冊 2018-05-18

Overcoming mmWave Challenges with Calibration
See the unique challenges of calibration at millimeter wave frequencies of 30-300 GHz.

應用手冊 2018-05-17

4 Hints for Better Millimeter-wave Signal Analysis - White Paper
Just a decade ago it might have been hard to believe, but millimeter-frequency applications above 50 GHz are going mainstream. Wireless HD, 802.11ad wireless networking, 5G cellular, and automotive radar are high-profile examples of an important trend, supported by remarkable advances in semiconductor technology.

應用手冊 2018-05-16

PDF PDF 5.27 MB
Integrate Collaborative Robot (Cobot) with i3070 ICT Test Platform - Application Note
Improve quality and efficiency of daily works on production line and reduce dependency on human operators by integrating Cobot (collaborative robot) with i3070 ICT test platform.

應用手冊 2018-05-15

PDF PDF 3.18 MB
How Can Distributed Architecture Help mmWave Network Analysis? - White Paper
Learn ways to increase the frequency range of VNAs to test mmWave frequencies.

應用手冊 2018-05-11

Key Technologies Needed to Advance Mission-Critical IoT - White Paper
Enabling the future of the mission-critical IoT requires more than just the right design, it requires the right tools to build a strong foundation

應用手冊 2018-05-07

PDF PDF 3.34 MB
Accelerate Innovation by Improving Product Development Processes
Getting from concept to shipment as fast as possible is the goal of virtually every product development team. Business imperatives constantly pressure development teams to improve their simulation tools, cut design cycle times, and reduce test time to bring products to market faster. This white paper explores techniques and methodologies for improving product development processes in order to accelerate innovation.

應用手冊 2018-05-03

PDF PDF 3.82 MB
5 New Features and Test Challenges for 802.11ax - White Paper
This white paper introduces the new 802.11ax standard which provides better spectral efficiency, capacity, and coverage in dense deployment scenarios as well as outdoor environments.

應用手冊 2018-05-03

PDF PDF 4.31 MB
Ready to Test 5G Data Throughput - Article Reprint
This article, published in Microwave Journal, provides information on test methods and platforms for successful 5G development.

應用手冊 2018-04-20

PDF PDF 3.27 MB
NB-IoT Success Hinges on Overcoming 3 Challenges - White Paper
Ensuring NB-IoT devices and systems are fully optimized for use in the industrial IoT requires critical attention to battery life, network coverage and cost

應用手冊 2018-04-18

PDF PDF 2.30 MB
如何使用示波器進行 FFT 和脈衝射頻量測 - 應用說明
本文將探索其中某些範例,並討論使用示波器執行 FFT 量測和脈衝射頻量測的實際考量。

應用手冊 2018-04-16

雙埠量測與 S 參數 - 應用說明
網路分析儀是對用於射頻和微波系統之裝置設備和元件進行特性分析的基本工具。本文將於稍後的元件量測進行更詳細的介紹。

應用手冊 2018-04-16

8 大秘訣幫助您精準執行示波器探測 - 應用說明
本應用說明介紹 8 個重要秘訣,協助您為自己的應用選擇適合的探棒,進而提高示波器探測能力。

應用手冊 2018-04-16

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