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AFM-Based Characterization of Electric Properties of Soft Materials - Application Note
Local electric and dielectric properties of materials in a broad frequency range (up to several GHz) and effects of vapor condensation have been studied with environmental AFM in this note.

어플리케이션 노트 2018-03-09

PDF PDF 3.12 MB
Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

어플리케이션 노트 2018-03-09

GPIO-BNC Trigger Adapter Simplifies Triggering Connections - Application Brief
This 2-pager introduces the GPIO-BNC Trigger Adapter which makes it easy to send and receive trigger signals between Keysight B2900A Series products and other instruments with BNC triggering connection.

어플리케이션 노트 2018-03-09

PDF PDF 1.68 MB
Reliable High-Resistance Measurements Using the B2985A/87A - Application Note
This application note explains how easy it is to make an accurate high resistance measurement using the B2985A/87A.

어플리케이션 노트 2018-03-09

Precise VCO Characterization using the B2962A Low Noise Power Source - Application Brief
This 1-pager introduces the Keysight B2962A Power Source which satisfies the phase noise requirements for testing most VCOs.

어플리케이션 노트 2018-03-09

PDF PDF 1.04 MB
Low Current Semiconductor Measurements Using the B2980A Series Ammeter - Application Note
This application note highlights the B2980A Series ammeter current measurement performance using a diode measurement example.

어플리케이션 노트 2018-03-09

Diode Production Test Using the B2900A Series of SMUs - Application Note
This application note shows how to use the Keysight B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test.

어플리케이션 노트 2018-03-08

M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability
Learn how to use the M9703A AXIe high-speed digitizer with real time digital down conversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

어플리케이션 노트 2018-03-08

PDF PDF
Creating and Optimizing 802.11ac Signals with the M8190A AWG - Application Note
Designs for 802.11ac WLAN devices require test equipment that can provide the best reference test signals and measurements. N7617B enables this type of signals to be generated with the M8190A AWG.

어플리케이션 노트 2018-03-08

PDF PDF 3.62 MB
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

어플리케이션 노트 2018-03-08

PDF PDF 4.75 MB
GaAs MMIC TWA Users Guide - Application Note
GaAs MMIC TWA Users Guide. This application note gives a technical overview of the TC700, TC702 and TC900 GaAs MMIC Traveling Wave Amplifiers (TWA).

어플리케이션 노트 2018-03-08

PDF PDF 1.60 MB
FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

어플리케이션 노트 2018-03-08

PDF PDF 519 KB
Device Evaluation using the B2961/B2962A Ultra Low Noise DC Source - Application Brief
This short document summarizes the B2961A/B2962A power sources which allows ultra-clean voltage sourcing required for the development of noise sensitive devices such as VCO, ADC, etc.

어플리케이션 노트 2018-03-08

Integrating x1149 Boundary Scan Analyzer and Mini In-Circuit Test System for Better Test Coverage
Improve test coverage with the integration of the x1149 and Mini ICT into a single test station and extend the usage and flexibility of both platforms.

어플리케이션 노트 2018-03-07

PDF PDF 1.64 MB
Performing Impedance Analysis with the E5061B ENA Vector Network Analyzer
This application note describes five common impedance analysis approaches used with impedance analyzers and network analyzers. It also describes how and when to use the E5061B for impedance analysis.

어플리케이션 노트 2018-03-02

PDF PDF
Performing Impedance Analysis with the E5061B ENA Vector Network Analyzer - Application Note
This application note describes five common impedance analysis approaches used with impedance analyzers and network analyzers. It also describes how and when to use the E5061B for impedance analysis.

어플리케이션 노트 2018-03-02

PDF PDF 2.10 MB
Using PrecisionProbe Software on the Infiniium 9000 Series Oscilloscopes
This application note introduces an easier and quicker solution for addressing the loss due to the probing system and its impact on oscilloscope measurements.

어플리케이션 노트 2018-03-01

PDF PDF 4.28 MB
Using the U8030 Series Power Supply Output Sequencing Feature - Application Note
This document presents three test applications that demonstrate the output sequencing capability of the U8030 Series power supply.

어플리케이션 노트 2018-03-01

PDF PDF 1.13 MB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

어플리케이션 노트 2018-03-01

PDF PDF 3.42 MB
Applying Error Correction To Vector Network Analyzer Measurements - Application Note
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.

어플리케이션 노트 2018-02-28

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

어플리케이션 노트 2018-02-22

1mW 50 MHz Power Reference Measurement with the N432A Thermistor Power Meter - Application Note
Explains the application procedure on how to use the N432A with the thermistor mount to measure the power reference of power meters.

어플리케이션 노트 2018-02-22

PDF PDF 1.66 MB
Optimizing VNA Settings for Testing of LTE-A Wireless Components
Optimizing VNA Settings for Testing of LTE-A Wireless Components.

어플리케이션 노트 2018-02-21

PDF PDF
Cross-Sectional DMA Testing On Automotive Tires Using Flat-Punch Indentation - Application Note
Cross sections of a tire were tested using oscillatory indention by flat-punch CSM. The local storage and loss modulus of different locations on the tire were measured.

어플리케이션 노트 2018-02-20

PDF PDF 2.50 MB
BER and Subjective Evaluation for DVB-T/H Receiver Test - Application Note
This AN tells how use N7623B Signal Studio for digital video with signal generators for standard-compliant digital video receiver and component test. Test cases are given for DVB-T/H receivers.

어플리케이션 노트 2018-02-16

PDF PDF 6.25 MB

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