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Impedance Analyzers [Discontinued]

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Reliable Electronic Component Evaluation and Circuit Design with the 4294A(PN4294-1)

Application Note 2001-08-31

Combining Network and Spectrum Analyses and IBASIC (AN 1288-1)
Active components (and now even some passive components like crystal filters require analysis to characterize linear parameters (gain/loss, phase and group delay or S-parameters) as well as non-linear performance. Non-linear analysis is typically related to measuring signal distortion generated...

Application Note 2001-08-30

Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.

Application Note 2001-07-31

Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Application Note 2001-05-24

Cable Impedance and Structural Return Loss Measurement Methodologies
introduces exact definitions for cable impedance and structural return loss along with several measurement methodologies.

Application Note 2001-03-23

Swtching Power Supply Evaluation with Keysight 4395A (PN 4395-2)
This Product Note describes how designers evaluate the switching power supply for various reasons, such as performance evaluation, regulation evaluation and component selection. Evaluation parameters are loop gain, output impedance, ripple and switching noise, EMC evaluation and component...

Application Note 2000-11-01

PDF PDF 332 KB
Electronic Characterization of Impedance Analyzer (AN 1300-5)
This application note describes in broad terms how to use the 4291B RF Impedance/Material Analyzer in determining the impedance characteristics of IC packages up to 1.8 GHz. This information is useful for high speed digital designers, component...

Application Note 2000-11-01

PDF PDF 512 KB
How to Measure Noise Accurately Using the Keysight Combination Analyzers (PN 4395/96-1)
Product note comparing Keysight combination analyzers (4395A, 4396B) and conventional Keysight spectrum analyzers (4195A, 3588A, 3585A/B). Keysight no longers sells these products.

Application Note 2000-11-01

Evaluating Temperature Characteristics using a Temperature Chamber and the Keysight 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.

Application Note 2000-11-01

Impedance Measurements Using the Keysight 4291B and the Cascade Microtech Prober (PN 4291-3)
There is an increasing demand and a need to make impedancemeasurements using a prober. In this product note, a newsolution of measurement is described in which the 4291B RF impedance/material analyzer and the Cascade Microtech prober are used.

Application Note 2000-11-01

New Technologies for Wide Impedance Range Measurements to 1.8 GHz (PN 4291-1)
This product note describes the technologies and features in the 4291B RF Impedance/Material Analyzer to extend accurate impedance measurements to 1.8 GHz. Advantage of the new V-I impedance technique for direct impedance measurement, cable...

Application Note 2000-11-01

Impedance Characterization of Magneto-Resistive Disk Heads (AN 1300-6)
This application note is intended for engineers involved in research, development and production technology management and shows you how to efficiently evaluate LCR (inductance,capacitance, resistance) characteristics of MR heads using the 4291B.

Application Note 2000-10-01

Dielectric and Magnetic Material Characterization with the Novocontrol Concept 60 System (AN 1300-8)
This application note describes the material evaluation system using 4921B from Europeam System Integrator, Novoco control GmbH.

Application Note 2000-10-01

PDF PDF 730 KB
Keysight-IB Promgramming Hints for the Keysight 4194A (AN 339-12)
This Application Note 339-12 introduces programming techniques for building the 4194A IB system controlled by an external computer and also archieving high speed component testing and data transfer.

Application Note 2000-09-01

PDF PDF 270 KB
8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction
This application note describes how to make an accurate impedance measurement by using OPEN/SHORT/LOAD correction.

Application Note 1998-06-01

PDF PDF 302 KB
On-Chip Semiconductor Device Impedance Measurements Using the 4291B (AN 1300-7)
This application note demonstrates how the 4291B can be used for direct on-chip impedance measurements. In particular, the issue of how to connect the sample to the analyzer is addressed.

Application Note 1998-01-01

PDF PDF 245 KB
Permittivity Measurements of PC Board and Substrate Materials using the 4291B and 16453A (AN 1300-3)

Application Note 1997-12-01

PDF PDF 210 KB
Parametric Analysis for Electronic Components and Evaluation (AN 339)
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1993-06-01

PDF PDF 9.80 MB
Characterizing IC Package with Impedance Measurements and the UTP3000 (AN 1210-1)
This Application Note 1210-1 describes increasing speeds in digital systems that have created a need to characterize the high frequency analog performance of IC packages. Using an impedance meter to make L, C and Z measurements on a digital package can reveal useful data about a package's...

Application Note 1991-06-01

PDF PDF 305 KB
Static Head Testing for Disk Drives (AN 339-6)
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1990-01-01

PDF PDF 249 KB
Testing Switching Power Supplies (AN 339-14)
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1988-12-01

PDF PDF 212 KB
Advanced Filter Evaluation and Limit Testing (AN 357-3)
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1988-04-01

PDF PDF 541 KB
Complete S-Parameter and Distortion Measurement for Wide Band Video Amplifier (AN 357-2)
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1988-02-01

PDF PDF 367 KB

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