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Overcome Critical Power Consumption Testing Challenges Webcast
Original broadcast December 13, 2017

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DesignCon 2018 Demo Details
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展覽會

DesignCon 2018 - Keysight Education Forum
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展覽會

DesignCon 2018 Show Details
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展覽會

Join Keysight Technologies at DesignCon 2018
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展覽會

RF Design and Test Webcast Series
Master the basics and understand future trends with these live and on-demand webcasts

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Solving Design and Test Challenges for Medical Devices
Webcast series

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Six Reasons Your New Medical IoT Device Will Fail
Original broadcast October 23, 2017

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10607 - 10612 台灣是德科技教育訓練中心課程表
上課時間: 09:00 ~ 17:00 上課地點: 台灣是德科技教育訓練中心 (桃園縣平鎮市高雙路20號) 教育訓練中心網址: http://www.keysight.com.tw

教室教育訓練

How will you Handle the Interference of Things Caused by Medical/IoT Devices?
Original broadcast June 20, 2017

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Medical Wireless Technology Applications Offer Opportunities and Challenges
Original broadcast July 18, 2017

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Smart Testing to Limit Your Risk Exposure in Wireless Medical Devices
Original broadcast August 23, 2017

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使用多點觸控 UI 簡化信號分析儀量測網路直播影片
原始直播時間 2016 年 3 月 10 日。

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International Microwave Symposium (IMS) 2017
June 4 - 9, 2017; Honolulu, Hawaii

展覽會

Troubleshooting Coherent Optical Communication Systems Webcast
Original broadcast April 22, 2015

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Verifying RF Short Range Communication in IoT Webcast
Original broadcast June 27, 2017

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Understanding Phase Noise and Why it Matters Webcast
Live broadcast July 12, 2017; 10am PT / 1pm ET

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Test at Breakneck Speeds with System Power Supplies Webcast
Original broadcast March 30, 2017

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Millimeter-wave Challenges Webcast
Original broadcast February 23, 2017

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Fundamentals of IV Measurements Webcast
Original broadcast February 8, 2017

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Making Sense of Wireless Sensor Power Consumption Webcast
Original broadcast January 31, 2017

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High Sensitivity Current Measurements and Probing Solutions
Original broadcast January 11, 2017

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Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

研討會講義 2016-12-21

PDF PDF 2.35 MB
Using a Multi-Touch UI to Streamline Signal Analyzer Measurements Webcast
Original broadcast March 10, 2016

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MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow
Original broadcast October 21, 2014

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