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임피던스 측정 핸드북

어플리케이션 노트 2012-07-06

Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

어플리케이션 노트 2011-02-08

PDF PDF 1.61 MB
Low Current Measurement Technologies in Keysight 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

어플리케이션 노트 2011-02-08

PDF PDF 1.47 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Keysight 4080 series parametric test systems to make these measurements.

어플리케이션 노트 2011-02-08

PDF PDF 3.57 MB
High Speed Parametric Test using Keysight 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Keysight 4080 series parametric test systems.

어플리케이션 노트 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

어플리케이션 노트 2011-02-06

PDF PDF 331 KB
AN B1500A-2 Migrating from the Keysight 4155C and 4156C to the Keysight B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

어플리케이션 노트 2010-04-02

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

어플리케이션 노트 2008-12-10

Adapting Keysight 4070 series to open/short Measurement of YIELD TEST CHIP. AN4070-5
This application note describes the techniques required for adapting the Keysight 4070 series to quick yield ramp-up using Yield Test Chip testing.

어플리케이션 노트 2003-09-05

High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Keysight E5270A and ENA series RF Network Analyzer.

어플리케이션 노트 2003-08-10

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

어플리케이션 노트 2003-06-26

Tips for Reusing Existing 4142B Program for Keysight E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

어플리케이션 노트 2003-05-10

PDF PDF 310 KB
4073A and Ultra Low Current Measurement Technologies (Product Note)
Ultra Low Current Measurement Technologies Employed in the 4073A Ultra Advanced Parametric Test System

어플리케이션 노트 2000-12-01

PDF PDF 175 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator. AN4070-3
Keysight 4070 Series Semiconductor Parametric Tester

어플리케이션 노트 2000-11-05

Ultra Advanced Parametric Test Solution Accelerates Ramp and Improves Process Yield
Keysight 4073A and 4073B Ultra Advanced Parametric Tester accelerate the rampup of new processes and improve the yield on existing processes.

어플리케이션 노트 2000-08-01

PDF PDF 74 KB
DC Characterization of Semiconductor Power Devices
Shows practical measurement examples of how to characterize semiconductor power devices. [Product Note 4142B-1]

어플리케이션 노트 1991-09-01

PDF PDF 1.33 MB