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Application Note: Tips & Tricks for Using USB, GPIB, & LAN (AN 1465-20)
Application Note: Tips & Tricks for Connectivity

Application Note 2009-01-22

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

Comprehensive Multiport Solution for the ENA Network Analyzer
This application note discusses the benefits of using a comprehensive multiport solution such as the E5071C ENA network analyzer with the E5092A configurable multiport test set.

Application Note 2008-10-29

Measurement of Return Loss and Transmission Loss or Gain Using the Keysight N9340B

Application Note 2008-10-24

IFT Battery Current Drain Solution - Application Note
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

Application Note 2008-09-30

Measurement Wizard Assistant software for ENA
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

Application Note 2008-09-30

Oscilloscope probing for high-speed signals
The probe is the dominant factor in determining the noise floor and response of your measurement system. Probe loading effects on the circuit under test are also a critical consideration.

Application Note 2008-09-03

Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

Using USB and LAN I/O Converters - Application Note
Compare 3 instrument connectivity products to determine which interconnect device is best for your application needs.

Application Note 2008-07-09

Restoring Confidence in Your High-Bandwidth Probe Measurements (AN 1419-01)
Understanding and verifying performance trade-offs/issues in high-bandwidth probe measurements using simple probe configuration methods.

Application Note 2008-06-20

The Truth About The Fidelity of High Bandwidth Voltage Probes, AN 1404
An analysis of high-bandwidth voltage probes that reveals a fundamental tradeoff between fidelity and ease of use that exists with all high-bandwidth probes.

Application Note 2008-06-20

Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443)
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.

Application Note 2008-05-22

Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.

Application Note 2008-03-10

Using the N9310A/N9320A as Basic RF Education Tools
Meet educational needs and remain within your budget by using a set of basic RF instruments like the low cost N9310A signal generator and the N9320A spectrum analyzer.

Application Note 2008-03-01

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)

Application Note 2007-11-28

Automating Keysight 14565B Software Battery Drain Measurements with LabVIEW
This document describes the process of making battery drain measurements with the Keysight 14565B and National Instruments Labview

Application Note 2007-10-11

Accelerate Wireless Mobile Device Design Validation with Automated Test Solution
This document describes how to accelerate wireless mobile device design validation using Keysight automated test solutions.

Application Note 2007-10-11

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

Solving Jitter Problems through Jitter Spectrum and Phase Noise Analysis
Product Note

Application Note 2007-05-09

How Operating Life and Repeatability of Keysight’s EM Switches Minimize System Uncertainty
This application note discusses the effects of operating life and repeatability on coaxial electromechanical switches.

Application Note 2007-04-09

Precision Jitter Analysis Using the Keysight 86100C DCA-J - Application Note
This product note provides a guide to making jitter measurements with the Keysight 86100C DCA-J.

Application Note 2007-03-07

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

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