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1-25 of 129

EMI Troubleshooting: The Need for Close Field Probes - Application Note
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2018-08-07

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2018-07-25

Probing a Midpoint of a Transmission Line that is Not Load Terminated - White Paper
With the advent of variable on die termination (i.e. ODT) many systems like low power double data rate memory (LPDDR) have the ability to either terminate a line in its characteristic impedance for high speed operation or terminate it with an open for lower speed operation. Many times there is a desire to probe the transmission line to monitor the signals on the line. When the transmission line is terminated in close to its characteristic impedance, the signals can be readily observed. However, if the line is terminated in an impedance that is not close to the characteristic impedance then it may not be possible to accurately measure the signals.

Application Note 2018-07-03

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2018-06-29

Bandwidth Boosting Techniques for the Infiniimax Probe Amp and Probe Head - Application Note
Keysight InfiniiMax differential probes are DSP corrected to have a flat magnitude and phase response to provide the highest possible accuracy. The bandwidth chosen to correct to is typically around 3dB non-corrected bandwidth. Usually, extending the bandwidth much beyond that point will increase the noise floor, and if pushed even further, can cause unrealistic noise artifacts. However, the N5381A/B solder-in probe head in combination with the InfiniiMax 1169A/B probe amp is an excellent candidate for extending the bandwidth beyond the 3dB point because the N5381A/B is peaked past the normal 12 GHz bandwidth, and the peaking of the probe head can help compensate for the roll-off of the probe amp bandwidth.

Application Note 2018-06-21

Optimizing Dynamic Range for Distortion Measurements - Application Note
This application note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2018-03-12

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2018-02-22

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2017-12-14

Practical Temperature Measurements (AN-290)
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2017-12-13

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-12-13

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2017-12-05

The Application of Handheld Spectrum Analyzers in Interface Testing - Application Note

Application Note 2017-12-05

Choosing the Best Passive and Active Oscilloscope Probes for Your Tasks - Application note
Selecting the right probe for your application is the first step toward making reliable oscilloscope measurements, and each probe has an application for which it performs best.

Application Note 2017-12-02

Demystifying RCRC and RC probes - Application Note
An ideal probe would provide an exact replica of a signal being probed. However, the probe becomes a part of the circuit under test, because the probe introduces probe loading to the circuit.

Application Note 2017-12-01

Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode

Application Note 2017-12-01

InfiniiMax Probes Impact on Lead-Free (ROHS) Compliance - Application Note
Some Keysight InfiniiMax oscilloscope probe heads are intended for soldering to the device under test.

Application Note 2017-12-01

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2017-12-01

8 Hints for Better Scope Probings - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2017-11-23

How to Select the Right Current Probe - Application Note
Oscilloscope current probes enable oscilloscopes to measure current, extending their use beyond just measuring voltage. Basically, current probes sense the current flowing through a conductor and convert it to a voltage that can be viewed and measured on an oscilloscope. There are many different types of current probes you can choose from and each probe has an area where it performs best. This application note will introduce you to the common types of current probe solutions, the fundamental principles, the advantages and limitations between each current probe type, and the practical consideration for using current probes for oscilloscope applications to make the most out of them.

Application Note 2017-11-09

Oscilloscope in Medical Imaging Applications - Measuring Power Integrity and Current Measurement
This application brief explores how Keysight oscilloscopes help designers validate the medical instrument’s IO interface for data processing in image reconstruction.

Application Note 2017-11-06

How to Test USB Power Delivery (PD) Over Type-C - Application Note
USB Type-C power delivery creates possibilities for USB connected devices with higher, bi-directional power and power for non-USB devices with ALT mode. Learn more about verification/compliance.

Application Note 2017-11-01

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2017-07-05

Optical Signal Measurements Using A Real-Time Oscilloscope - Application Note
If your application includes a repetitive waveform that requires lower noise, jitter and a higher dynamic range, a sampling oscilloscope is a good choice.

Application Note 2017-06-27

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

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