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Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2016-06-12

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

MEMS/NEMS Device Measurement Solution
Keysight helps you characterize MEMS/NEMS device.

Application Note 2010-09-19

Temperature Characteristic Evaluations of RF Components and Materials (AN 1464)
This application note introduces an efficient and highly reliable measurement system for evaluating temperature characteristics of components and materials using a combination of the E4991A-007.

Application Note 2004-10-14

How To Accurately Evaluate Low ESR/High Q RF Chip Devices (AN 1369-6)
This application note discusses the requirements for proper measurement techniques, the right test instrument, and fixtures that can accommodate the minute size of todays RF chip devices.

Application Note 2004-01-24

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Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.

Application Note 2001-07-31

Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Application Note 2001-05-24

8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01